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US5386189A
Expired / Lapsed
US
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IC measuring method
Assignee: Mitsubishi Electric Corp
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Filing: 1992-07-22
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Granted: 1995-01-31
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Expires: 2012-07-22
Abstract
Abstract An IC measuring method including positioning a plurality of ICS, each having a plurality of circuit blocks performing different functions, selecting different circuit blocks in each of the plurality of ICs, measuring the test results from each of the selected circuit blocks, and selecting a different circuit block in each of the plurality of ICs for the next measurement. The circuit block selection is controlled by a matrix circuit or by physically shifting the positions of the ICs.
Inventors
- 👤 Kazuhiro Nishimura
- 👤 Kiyotoshi Ueda
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-07 20:04
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/319; G01R31/31917; G01R31/31926
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
152 words
An IC measuring method comprising the steps of: (a) positioning a plurality of ICs, each including a plurality of circuit blocks each circuit block having a distinct function; (b) selecting one of the plurality of circuit blocks from each of the plurality of ICs, each of the selected circuit blocks having a different function; (c) testing the selected circuit blocks simultaneously; (d) measuring test results for each of the selected first circuit blocks; (e) selecting one of the plurality of circuit blocks from each of the plurality of ICs such that the circuit block selected from a first one of the plurality of ICs in step.(b) has a different function than the circuit block selected from the first one of the plurality of ICs in step (e); (f) testing the circuit blocks selected in step (e) simultaneously; and (g) measuring test results for each of the circuit blocks tested in step (f).
Claim 2
Dependent Claim
152 words
An IC measuring method comprising the steps of: (a) positioning a plurality of ICs, each including a plurality of circuit blocks each circuit block having a distinct function; (b) selecting one of the plurality of circuit blocks from each of the plurality of ICs, each of the selected circuit blocks having a different function; (c) testing the selected circuit blocks simultaneously; (d) measuring test results for each of the selected first circuit blocks; (e) selecting one of the plurality of circuit blocks from each of the plurality of ICs such that the circuit block selected from a first one of the plurality of ICs in step.(b) has a different function than the circuit block selected from the first one of the plurality of ICs in step (e); (f) testing the circuit blocks selected in step (e) simultaneously; and (g) measuring test results for each of the circuit blocks tested in step (f).
Claim 3
Dependent Claim
47 words
An IC measuring method according to claim 1 wherein the selection of the circuit blocks in step (b) is determined by the respective positions of the plurality of ICs, the circuit blocks selected in step (e) being selected by shifting the positions of the plurality of ICs.
Claim 4
Dependent Claim
35 words
An IC measuring method according to claim 1 including selecting circuit blocks in each of the ICs with a matrix circuit provided in a measuring apparatus without shifting the positions of the plurality of ICs.
Claim 5
Dependent Claim
130 words
An IC testing method comprising the steps of: selecting a plurality of ICs, each IC including a plurality of circuit blocks; positioning the plurality of ICs according to a predetermined pattern; selecting a circuit block from each of the plurality of ICs to form a first circuit block group; testing the circuit blocks of the first circuit block group simultaneously by applying signals to the circuit blocks of the first circuit block group; measuring the level of signals output from the ICs responsive to the signals applied to the first circuit block group; selecting a circuit block from each of the plurality of ICs to form a second circuit block group; and repeating said testing and measuring steps on each of the circuit blocks of the second circuit block group;
Claim 6
Dependent Claim
130 words
An IC testing method comprising the steps of: selecting a plurality of ICs, each IC including a plurality of circuit blocks; positioning the plurality of ICs according to a predetermined pattern; selecting a circuit block from each of the plurality of ICs to form a first circuit block group; testing the circuit blocks of the first circuit block group simultaneously by applying signals to the circuit blocks of the first circuit block group; measuring the level of signals output from the ICs responsive to the signals applied to the first circuit block group; selecting a circuit block from each of the plurality of ICs to form a second circuit block group; and repeating said testing and measuring steps on each of the circuit blocks of the second circuit block group;
Claim 7
Dependent Claim
50 words
An IC measuring method according to claim 4 wherein the selection of the circuit blocks comprising the first circuit block group is determined by the respective positions of the ICs, the circuit blocks of the second circuit block group being selected by shifting the positions of the plurality of ICs;
Claim 8
Dependent Claim
42 words
An IC measuring method according to claim 4 including the step of selecting circuit blocks in each of the ICs with a matrix circuit to form the first and second circuit block groups without shifting the positions of the plurality of ICs.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-01-30 | 1998-08-01 | 1999-01-31 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-01-30 | 2002-08-01 | 2003-01-31 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-01-30 | 2006-08-01 | 2007-01-31 | $7700.00 | Window Closed / Lapsed |