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US5385290A Expired / Lapsed US ⏱️ 0.0 years remaining

Soldering material and procedure

Assignee: Agere Systems LLC
•
Filing: 1993-11-24
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Granted: 1995-01-31
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Expires: 2013-11-24
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Abstract

Abstract The quality of soldering produced on devices such as printed circuit boards and multichip modules is significantly improved through use of a specific size distribution of solder particles. In particular, the solder includes a vehicle and solder particles of specific size. In general, an appropriate distribution of both large and small particles should be employed. Through this expedient short circuits and soldering defects in fine line devices are reduced.

Inventors

  • 👤 Yinon Degani

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 03:17
CPC Classifications
B; B23; B23K; B23K1/00; B23K1/0008; B23K1/0016; H; H05; H05K; H05K3/00; H05K3/30; H05K3/32; H05K3/34; H05K3/3465; H05K3/3485; B23K2101/00; B23K2101/36; B23K2101/42; H05K2201/00; H05K2201/02; H05K2201/0203; H05K2201/0263; H05K2201/0266

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 113 words
A method for soldering two bodies at at least one contact position using a volume of solder paste, V dep , at said contact position wherein said solder paste comprises solder particles and a vehicle, said particles being 35 to 65 volume % of said paste characterized in that at least 34% but less than 100% of the total volume of said particles is made up of small particles with the remainder being big particles wherein said big particles are solder particles having an effective diameter within 20% of a diameter, D big , in the range h>D big >60% h where h is the height of the deposited volume V dep .
Claim 2
Independent Claim 113 words
A method for soldering two bodies at at least one contact position using a volume of solder paste, V dep , at said contact position wherein said solder paste comprises solder particles and a vehicle, said particles being 35 to 65 volume % of said paste characterized in that at least 34% but less than 100% of the total volume of said particles is made up of small particles with the remainder being big particles wherein said big particles are solder particles having an effective diameter within 20% of a diameter, D big , in the range h>D big >60% h where h is the height of the deposited volume V dep .
Claim 3
Dependent Claim 25 words
The method of claim 1 wherein at least 50% but less than 100% of the total volume of said particles is made of small particles.
Claim 4
Dependent Claim 14 words
The method of claim 1 wherein one of said bodies comprises an integrated circuit.
Claim 5
Dependent Claim 18 words
The method of claim 1 wherein said bodies are contacted to a substrate to form a multichip module.
Claim 6
Dependent Claim 49 words
A method of claim 1 wherein D big is further the smaller of h and ##EQU3## where f paste is the volume factor of said solder particles in said paste, f big is the volume factor of said big particles of said particles and n is greater than 0.5.

References Cited (Backward Citations)

US4509994A Cited
US4531986A Cited
US4740252A Cited
US4731130A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1998-01-30 1998-08-01 1999-01-31 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2002-01-30 2002-08-01 2003-01-31 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2006-01-30 2006-08-01 2007-01-31 $7700.00 Window Closed / Lapsed

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