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US5384488A Expired / Lapsed US ⏱️ 0.0 years remaining

Configuration and method for positioning semiconductor device bond pads using additional process layers

Assignee: Texas Instruments Inc
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Filing: 1993-10-03
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Granted: 1995-01-24
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Expires: 2013-10-03
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Abstract

Abstract A semiconductor chip (12) includes a plurality of bond pads (16). A plurality of bond shelves (28) are located along opposed end edges (20, 22) of the chip (12). The bond pads (16) are oriented in selected areas remote from the bond shelves (28). A via (42) is formed through an insulating layer (38) to the surface of the bond pad (18) to provide electrical connection thereto. A metallization layer (44) is formed over the an insulating layer (38), filling the via (42). The metallization layer (44) is patterned and etched to form a patten of trace lines (18) spatially separated to connect each bond pad (16) to bond shelves (28).

Inventors

  • 👤 Shahin Golshan
  • 👤 Craig A. St. Martin
  • 👤 Craig W. Rhodine

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 17:33
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W20/45; H10W20/48; H10W20/41; H10W20/425; H10W20/43; H10W20/435; H10W20/44; H10W20/4403; H10W20/4432

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 139 words
An integrated circuit device using additional process layers for positioning bond pads, comprising: a semiconductor chip having an active circuit formed in a face thereof, said chip having opposed end edges; a plurality of bond pads in electrical contact with said active circuit oriented along a center line of said chip; an insulating layer overlying said active circuit and having vias to enable electrical connection to said bond pads through said vias; a patterned conductive layer overlying said insulating layer and said vias, forming conductive vias for transferring signals from said bond pads; said patterned conductive layer also forming a plurality of conductive trace lines connecting said conductive vias to said end edges of said chip; and a plurality of wire bonds oriented along each of said end edges for being connected to terminal ends of said trace lines.
Claim 2
Dependent Claim 139 words
An integrated circuit device using additional process layers for positioning bond pads, comprising: a semiconductor chip having an active circuit formed in a face thereof, said chip having opposed end edges; a plurality of bond pads in electrical contact with said active circuit oriented along a center line of said chip; an insulating layer overlying said active circuit and having vias to enable electrical connection to said bond pads through said vias; a patterned conductive layer overlying said insulating layer and said vias, forming conductive vias for transferring signals from said bond pads; said patterned conductive layer also forming a plurality of conductive trace lines connecting said conductive vias to said end edges of said chip; and a plurality of wire bonds oriented along each of said end edges for being connected to terminal ends of said trace lines.
Claim 3
Dependent Claim 150 words
An integrated circuit device using additional process layers for positioning bond pads, comprising: a semiconductor chip having an active circuit formed in a face thereof, said chip having opposed end edges; a plurality of bond pads in electrical contact with said active circuit oriented in selected areas remote from said end edges; an insulating layer overlying said active circuit and having vias to enable electrical connection to said bond pads through said vias; a patterned conductive layer having a second conductive layer overlying a first reflective layer overlying said insulating layer and said vias, forming conductive vias for transferring signals from said bond pads, said patterned conductive layer also forming a plurality of conductive trace lines connecting said conductive vias to said end edges of said chip; and a plurality of wire bonds oriented along each of said end edges for being connected to terminal ends of said trace lines.
Claim 4
Dependent Claim 150 words
An integrated circuit device using additional process layers for positioning bond pads, comprising: a semiconductor chip having an active circuit formed in a face thereof, said chip having opposed end edges; a plurality of bond pads in electrical contact with said active circuit oriented in selected areas remote from said end edges; an insulating layer overlying said active circuit and having vias to enable electrical connection to said bond pads through said vias; a patterned conductive layer having a second conductive layer overlying a first reflective layer overlying said insulating layer and said vias, forming conductive vias for transferring signals from said bond pads, said patterned conductive layer also forming a plurality of conductive trace lines connecting said conductive vias to said end edges of said chip; and a plurality of wire bonds oriented along each of said end edges for being connected to terminal ends of said trace lines.
Claim 5
Dependent Claim 12 words
The device of claim 2, wherein said second conductive layer comprises gold.
Claim 6
Dependent Claim 12 words
The device of claim 2, wherein said second conductive layer comprises aluminum.
Claim 7
Dependent Claim 15 words
The device of claim 4, further comprising: a polyimide layer overlaying said second conductive layer.
Claim 8
Dependent Claim 23 words
The device of claim 2, wherein said first reflective layer is selected from the group consisting of titanium, tungsten or a combination thereof.
Claim 9
Dependent Claim 177 words
An integrated circuit device using additional process layers for positioning bond pads, comprising: a semiconductor chip having an active circuit formed in a face thereof, said chip having opposed end edges; a plurality of bond pads in electrical contact with said active circuit oriented in selected areas remote from said end edges; an insulating layer overlying said active circuit and having vias to enable electrical connection to said bond pads through said vias; a patterned conductive layer overlying said insulating layer and said vias forming conductive vias for transferring signals from said bond pads; said patterned conductive layer also forming a plurality of conductive trace lines connecting said conductive vias to said end edges of said chip; a plurality of wire bonds oriented along each of said end edges for being connected to terminal ends of said trace lines; and wherein said conductive trace lines extend from said wire bonds to said bond pads in four substantially identical quadrants of said chip, each quadrant of said chip having conductive trace lines formed substantially parallel to each other.
Claim 10
Dependent Claim 177 words
An integrated circuit device using additional process layers for positioning bond pads, comprising: a semiconductor chip having an active circuit formed in a face thereof, said chip having opposed end edges; a plurality of bond pads in electrical contact with said active circuit oriented in selected areas remote from said end edges; an insulating layer overlying said active circuit and having vias to enable electrical connection to said bond pads through said vias; a patterned conductive layer overlying said insulating layer and said vias forming conductive vias for transferring signals from said bond pads; said patterned conductive layer also forming a plurality of conductive trace lines connecting said conductive vias to said end edges of said chip; a plurality of wire bonds oriented along each of said end edges for being connected to terminal ends of said trace lines; and wherein said conductive trace lines extend from said wire bonds to said bond pads in four substantially identical quadrants of said chip, each quadrant of said chip having conductive trace lines formed substantially parallel to each other.
Claim 11
Dependent Claim 20 words
The device of claim 7, wherein said trace lines are formed at an angle of approximately 20 degrees or greater.
Claim 12
Dependent Claim 11 words
The device of claim 8, wherein said angle is 45 degrees.

References Cited (Backward Citations)

US4060828A Cited
US4878098A Cited
US4983250A Cited
US4914055A Cited
US5102831A Cited
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US5250840A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1998-01-23 1998-07-25 1999-01-24 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2002-01-23 2002-07-25 2003-01-24 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2006-01-23 2006-07-25 2007-01-24 $7700.00 Window Closed / Lapsed

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