Semi-internally manifolded interconnect

Claim 2

A semi-internally manifolded interconnect having opposite first and second facial surfaces and structured for placement between successive electrolyte elements in a stack of electrolyte elements comprising: a smooth, level margin extending substantially around the perimeter of said first facial surface, said margin comprising a containment seal area for forming a gas-tight seal between the edge of said interconnect and the edge of a first electrolyte element; a first manifold channel disposed in said first facial surface inwardly from said margin, said first manifold channel extending from a first end abutting said margin to a second end extending to the edge of said interconnect through a first breach in said margin; a second manifold channel disposed in said first facial surface inwardly from said margin and substantially parallel with said first manifold channel, said second manifold channel extending from a first end abutting said margin to a second end extending to the edge of said interconnect through a second breach in said margin; and a plurality of gas-flow channels disposed in a central area of said first facial surface, said gas-flow channels in fluid communication with and extending between said first and second manifold channels.

Claim 3

The semi-internally manifolded interconnect of claim 1 wherein said first and second manifold channels are disposed proximal opposite edges of said first surface.

Claim 4

The semi-internally manifolded interconnect of claim 1 wherein said first breach and said second breach are disposed proximal diagonal edges of said first facial surface.

Claim 5

The semi-internally manifolded interconnect of claim 1 wherein said second facial surface is substantially identical in structure to said first facial surface.

Claim 6

The semi-internally manifolded interconnect of claim 4 wherein said first and second manifold channels on said first surface are disposed proximal opposite edges of said first facial surface, and said first and second manifold channels on said second facial surface are disposed proximal opposite edges of said second facial surface.

Claim 7

The semi-internally manifolded interconnect of claim 4 wherein said first and second breaches on said first facial surface are disposed proximal diagonal edges of said first facial surface, and said first and second breaches on said second facial surface are disposed proximal diagonal edges of said second facial surface.

Claim 8

The semi-internally manifolded interconnect of claim 1 wherein said second facial surface is substantially similar in structure to said first facial surface but oriented 90° from the orientation of said first surface about an axis perpendicular to both said first and second facial surfaces.

Claim 9

The semi-internally manifolded interconnect of claim 7 wherein said first and second manifold channels on said first surface are disposed proximal opposite edges of said first facial surface, and said first and second manifold channels on said second facial surface are disposed proximal opposite edges of said second facial surface.

Claim 10

The semi-internally manifolded interconnect of claim 4 wherein said first and second breaches on said first facial surface are disposed proximal diagonal edges of said first facial surface, and said first and second breaches on said second facial surface are disposed proximal diagonal edges of said second facial surface.

Claim 11

The semi-internally manifolded interconnect of claim 1 wherein said first and second breaches are gas inlet and outlet channels.

Claim 12

The semi-internally manifolded interconnect of claim 10 wherein a gas-flow passageway through said interconnect comprises a passageway from said first manifold channel through said first breach, through said parallel gas-flow channels to said second manifold channel, to said second breach.

Claim 13

The semi-internally manifolded interconnect of claim 11 wherein the length of the gas-flow passageway from introduction of a gas into said manifold through said first breach, through said first manifold channel, through any of said plurality of gas-flow channels, through said second manifold channel, and discharge through said second breach is substantially equivalent to any other of said plurality of gas flow channels.

Claim 14

The semi-internally manifolded interconnect of claim 1 wherein said margin extends around approximately 85% of the perimeter of said first facial surface.

Claim 15

A semi-internally manifolded interconnect having opposite first and second facial surfaces and structured for placement between successive electrolyte elements in a stack of electrolyte elements comprising: a smooth, level margin extending substantially around the perimeter of said first facial surface, said margin comprising a containment seal area for forming a gas-tight seal between the edge of said interconnect and the edge of a first electrolyte element; a first manifold channel disposed in said first facial surface inwardly from said margin, said first manifold channel extending from a first end abutting said margin to a second end extending to the edge of said interconnect through a first breach in said margin; a second manifold channel disposed in said first facial surface inwardly from said margin and substantially parallel with said first manifold channel, said second manifold channel extending from a first end abutting said margin to a second end extending to the edge of said interconnect through a second breach in said margin; a plurality of gas-flow channels disposed in a central area of said first facial surface, said gas-flow channels in fluid communication with and extending between said first and second manifold channels; and a plurality of smooth, level ridges comprising the portion of said first surface between successive gas-flow channels, said ridges comprising an area for bonding said central area of said interconnect to an said electrolyte plate.

Claim 16

A semi-internally manifolded interconnect having opposite first and second facial surfaces and structured for placement between successive electrolyte elements in a stack of electrolyte elements comprising: a smooth, level margin extending substantially around the perimeter of said first facial surface, said margin comprising a containment seal area for forming a gas-tight seal between the edge of said interconnect and the edge of a first electrolyte element; a first manifold channel disposed in said first facial surface inwardly from said margin, said first manifold channel extending from a first end abutting said margin to a second end extending to the edge of said interconnect through a first breach in said margin; a second manifold channel disposed in said first facial surface inwardly from said margin and substantially parallel with said first manifold channel, said second manifold channel extending from a first end abutting said margin to a second end extending to the edge of said interconnect through a second breach in said margin; a plurality of gas-flow channels disposed in a central area of said first facial surface, said gas-flow channels in fluid communication with and extending between said first and second manifold channels; and a plurality of smooth, level ridges comprising the portion of said first surface between successive gas-flow channels, said ridges comprising an area for bonding said central area of said interconnect to an said electrolyte plate.

Claim 17

The semi-internally manifolded interconnect of claim 14 wherein the surface of said margin is substantially planar with the surface of said ridges.

Claim 18

The semi-internally manifolded interconnect of claim 14 wherein said interconnect is substantially square and said margin is separated into two L-shaped pieces by diagonally positioned said first and second breaches.

Claim 19

The semi-internally manifolded interconnect of claim 14 wherein said second facial surface is substantially identical in structure to said first facial surface.

Claim 20

The semi-internally manifolded interconnect of claim 17 wherein said first and second manifold channels on said first surface are disposed proximal opposite edges of said first facial surface, and said first and second manifold channels on said second facial surface are disposed proximal opposite edges of said second facial surface.

Claim 21

The semi-internally manifolded interconnect of claim 17 wherein said first and second breaches on said first facial surface are disposed proximal diagonal edges of said first facial surface, and said first and second breaches on said second facial surface are disposed proximal diagonal edges of said second facial surface.

Claim 22

The semi-internally manifolded interconnect of claim 14 wherein said second facial surface is substantially similar in structure to said first facial surface and is oriented 90° from the orientation of said first surface about an axis perpendicular to both said first and second facial surfaces.