Method for testing semiconductor integrated circuit device, voltage drop power supply circuit suitable for the method, and semiconductor integrated circuit device having the voltage drop circuit

Claim 3

The method as claimed in claim 1, wherein a ratio of the internal power supply voltage to the external power supply voltage defined by the first characteristic line is equal to a ratio of the burn-in voltage to the external power supply voltage defined by the second characteristic line.

Claim 4

The method as claimed in claim 1, wherein the second characteristic line includes a part of a first straight line obtained by shifting, in parallel, a second straight line connecting an origin at which the internal and external power supply lines are zero to the lower limit voltage of the first characteristic line.

Claim 5

The method as claimed in claim 1, wherein the ratio of the burn-in voltage to the external power supply voltage defined by the second characteristic line is constant.

Claim 6

A voltage drop power supply circuit for a semiconductor integrated circuit device, comprising: first means for generating a constant internal power supply voltage from an external power supply voltage in accordance with a first characteristic line defining a relationship between the external power supply voltage and the internal power supply voltage and for applying the constant internal power supply voltage to internal circuits of the semiconductor integrated circuit device; and second means for generating a burn-in voltage from the external power supply voltage having a level higher than that used in the normal operation in accordance with a second characteristic line defining a relationship between the external power supply voltage and the internal power supply line and for applying the burn-in voltage to the internal circuits when a burn-in test is carried out for the semiconductor integrated circuit device, the second characteristic line crossing the first characteristic line at an intermediate point between lower and upper limit voltages defined by the first characteristic line, the burn-in voltage being greater than the internal power supply voltage used in the normal operation.

Claim 7

A voltage drop power supply circuit for a semiconductor integrated circuit device, comprising: first means for generating a constant internal power supply voltage from an external power supply voltage in accordance with a first characteristic line defining a relationship between the external power supply voltage and the internal power supply voltage and for applying the constant internal power supply voltage to internal circuits of the semiconductor integrated circuit device; and second means for generating a burn-in voltage from the external power supply voltage having a level higher than that used in the normal operation in accordance with a second characteristic line defining a relationship between the external power supply voltage and the internal power supply line and for applying the burn-in voltage to the internal circuits when a burn-in test is carried out for the semiconductor integrated circuit device, the second characteristic line crossing the first characteristic line at an intermediate point between lower and upper limit voltages defined by the first characteristic line, the burn-in voltage being greater than the internal power supply voltage used in the normal operation.

Claim 8

The voltage drop power supply circuit as claimed in claim 5, further comprising third means for activating said second means when the external power supply voltage reaches the upper limit voltage of the first characteristic line.

Claim 9

The voltage drop power supply circuit as claimed in claim 5, wherein said first means comprises means for generating the internal power supply voltage proportional to the external power supply voltage when the semiconductor integrated circuit device performs the normal operation.

Claim 10

The voltage drop power supply circuit as claimed in claim 5, wherein said second means comprises: third means for dividing the external power supply voltage and for generating a divided voltage; fourth means, coupled to the third means, for generating the burn-in voltage based on the divided voltage; and fifth means, coupled to the fourth means, for applying the burn-in voltage to the internal circuits only when the burn-in test is carried out for the semiconductor integrated circuit device.

Claim 11

The voltage drop power supply circuit as claimed in claim 8, wherein said third means comprises a plurality of resistors connected in series between a first power supply system set at the external power supply voltage and a second power supply system set at a reference potential.

Claim 12

The voltage drop power supply circuit as claimed in claim 8, wherein: said third means comprises a level shift element and a resistor connected in series between a first power supply system set at the external power supply voltage and a second power supply system set at a reference potential; and said divided voltage is output via a connection node at which the level shift element and the resistor are connected in series.

Claim 13

The voltage drop power supply circuit as claimed in claim 8, further comprising sixth means, coupled to said fifth means, for generating a control signal to said fifth means when the external power supply voltage reaches the upper limit voltage of the first characteristic line, said control signal activating said fifth means so that the burn-in voltage is applied to the internal circuits.

Claim 14

The voltage drop power supply circuit as claimed in claim 11, wherein said fifth means comprises a transistor having first and second terminals and a control terminal, the first terminal receiving the burn-in voltage, the second terminal being connected to the internal circuits of the semiconductor integrated circuit device, and the control terminal receiving said control signal.

Claim 15

The voltage drop power supply circuit as claimed in claim 8, further comprising sixth means, coupled to said fourth means, for activating said fourth means only when the burn-in test is carried out for the semiconductor integrated circuit device.

Claim 16

A semiconductor integrated circuit device comprising: first internal circuits operating with an external power supply voltage; second internal circuits operating with a constant internal power supply voltage obtained by dropping the external power supply voltage; first means for generating the constant internal power supply voltage from the external power supply voltage in accordance with a first characteristic line defining a relationship between the external power supply voltage and the internal power supply voltage and for applying the constant internal power supply voltage to the second internal circuits of the semiconductor integrated circuit device; and second means for generating a burn-in voltage from the external power supply voltage having a level higher than that used in the normal operation in accordance with a second characteristic line defining a relationship between the external power supply voltage and the internal power supply line and for applying the burn-in voltage to the second internal circuits when a burn-in test is carried out for the semiconductor integrated circuit device, the second characteristic line crossing the first characteristic line at an intermediate point between lower and upper limit voltages defined by the first characteristic line, the burn-in voltage being greater than the internal power supply voltage used in the normal operation.

Claim 17

A semiconductor integrated circuit device comprising: first internal circuits operating with an external power supply voltage; second internal circuits operating with a constant internal power supply voltage obtained by dropping the external power supply voltage; first means for generating the constant internal power supply voltage from the external power supply voltage in accordance with a first characteristic line defining a relationship between the external power supply voltage and the internal power supply voltage and for applying the constant internal power supply voltage to the second internal circuits of the semiconductor integrated circuit device; and second means for generating a burn-in voltage from the external power supply voltage having a level higher than that used in the normal operation in accordance with a second characteristic line defining a relationship between the external power supply voltage and the internal power supply line and for applying the burn-in voltage to the second internal circuits when a burn-in test is carried out for the semiconductor integrated circuit device, the second characteristic line crossing the first characteristic line at an intermediate point between lower and upper limit voltages defined by the first characteristic line, the burn-in voltage being greater than the internal power supply voltage used in the normal operation.

Claim 18

The voltage drop power supply circuit as claimed in claim 14, further comprising third means for activating said second means when the external power supply voltage reaches the upper limit voltage of the first characteristic line.

Claim 19

The voltage drop power supply circuit as claimed in claim 14, wherein said first means comprises means for generating the internal power supply voltage proportional to the external power supply voltage when the semiconductor integrated circuit device performs the normal operation.

Claim 20

The voltage drop power supply circuit as claimed in claim 14, wherein said second means comprises: third means for dividing the external power supply voltage and for generating a divided voltage; fourth means, coupled to the third means, for generating the burn-in voltage based on the divided voltage; and fifth means, coupled to the fourth means, for applying the burn-in voltage to the second internal circuits only when the burn-in test is carried out for the semiconductor integrated circuit device.