US5324686A
Expired / Lapsed
US
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Method of manufacturing semiconductor device using hydrogen as a diffusion controlling substance
Assignee: Toshiba Corp
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Filing: 1992-10-09
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Granted: 1994-06-28
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Expires: 2012-10-09
Abstract
Abstract A method of manufacturing a semiconductor device, which comprises the steps of forming a solid phase diffusion source containing a conductive impurity on a surface of a semiconductor substrate, said impurity serving to enable said semiconductor substrate to exhibit a p-type or n-type conductivity, allowing said solid phase diffusion source to contain a diffusion control substance serving to reduce or oxidize said conductive impurity upon heating so as to change the diffusion coefficient of the conductive impurity contained in the solid phase diffusion source, and thermally diffusing the conductive impurity from the solid phase diffusion source into the semiconductor substrate.
Inventors
- 👤 Yoshitaka Tsunashima
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 18:34
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/021; H10D30/0223; H10D30/0227; H10D1/00; H10D1/01; H10D1/045; H10D1/047; H10D30/60; H10P; H10P14/00; H10P14/60; H10P14/69; H10P14/694; H10P14/6943; H10P14/69433; H10P32/00; H10P32/10; H10P32/14; H10P32/1408; H10P32/141; H10P32/17; H10P32/171; H10P32/19
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
128 words
A method of manufacturing a semiconductor device, comprising the steps of: forming, on a surface of a semiconductor substrate, a solid phase diffusion source layer including a first region containing a conductive impurity of n-type and a second region containing a conductive impurity of n-type and hydrogen as a diffusion control substance which serves to decrease the diffusion coefficient of said conductive impurity in said second region of the solid phase diffusion source layer; and thermally diffusing, in an inert atmosphere, the conductive impurity from said solid phase diffusion source layer into said semiconductor substrate, thereby forming a shallower impurity region under said second region of the solid phase diffusion source layer and a deeper impurity region under said first region of the solid phase diffusion source layer.
Claim 2
Independent Claim
128 words
A method of manufacturing a semiconductor device, comprising the steps of: forming, on a surface of a semiconductor substrate, a solid phase diffusion source layer including a first region containing a conductive impurity of n-type and a second region containing a conductive impurity of n-type and hydrogen as a diffusion control substance which serves to decrease the diffusion coefficient of said conductive impurity in said second region of the solid phase diffusion source layer; and thermally diffusing, in an inert atmosphere, the conductive impurity from said solid phase diffusion source layer into said semiconductor substrate, thereby forming a shallower impurity region under said second region of the solid phase diffusion source layer and a deeper impurity region under said first region of the solid phase diffusion source layer.
Claim 3
Dependent Claim
29 words
A method of manufacturing a semiconductor device according to claim 1, wherein said hydrogen is introduced into said solid phase diffusion source layer by means of an ion implantation.
Claim 4
Dependent Claim
17 words
A method of manufacturing a semiconductor device according to claim 1, wherein said n-type impurity is arsenic.
Claim 5
Dependent Claim
72 words
A method of manufacturing a semiconductor device according to claim 1, wherein said solid phase diffusion source layer is formed so as to also contain, in addition to said n-type impurity, a p-type impurity which is harder to be reduced with hydrogen than said n-type impurity, thereby during said diffusion step forming a double diffusion region consisting of a p-type impurity region and a n-type impurity region in said p-type impurity region.
Claim 6
Dependent Claim
23 words
A method of manufacturing a semiconductor device according to claim 4, wherein said n-type impurity is arsenic and said p-type impurity is boron.
Claim 7
Independent Claim
120 words
A method of manufacturing a semiconductor device, comprising the steps of: forming a solid phase diffusion source layer containing a conductive impurity of n-type on a surface of a semiconductor substrate; selectively forming, on the surface of said solid phase diffusion source layer, a CVD-silicon nitride layer pattern containing hydrogen as a diffusion control substance which serves to cause reduction of the conductive impurity upon heating so as to change the diffusion coefficient of said conductive impurity in the solid phase diffusion source layer; and thermally diffusing, in an inert atmosphere, the conductive impurity from said solid phase diffusion source layer into said semiconductor substrate, thereby forming a shallower impurity region and a deeper impurity region at the same time.
Claim 8
Independent Claim
120 words
A method of manufacturing a semiconductor device, comprising the steps of: forming a solid phase diffusion source layer containing a conductive impurity of n-type on a surface of a semiconductor substrate; selectively forming, on the surface of said solid phase diffusion source layer, a CVD-silicon nitride layer pattern containing hydrogen as a diffusion control substance which serves to cause reduction of the conductive impurity upon heating so as to change the diffusion coefficient of said conductive impurity in the solid phase diffusion source layer; and thermally diffusing, in an inert atmosphere, the conductive impurity from said solid phase diffusion source layer into said semiconductor substrate, thereby forming a shallower impurity region and a deeper impurity region at the same time.
Claim 9
Dependent Claim
17 words
A method of manufacturing a semiconductor device according to claim 6, wherein said n-type impurity is arsenic.
Claim 10
Dependent Claim
72 words
A method of manufacturing a semiconductor device according to claim 6, wherein said solid phase diffusion source layer is formed so as to also contain, in addition to said n-type impurity, a p-type impurity which is harder to be reduced with hydrogen than said n-type impurity, thereby during said diffusion step forming a double diffusion region consisting of a p-type impurity region and a n-type impurity region in said p-type impurity region.
Claim 11
Dependent Claim
23 words
A method of manufacturing a semiconductor device according to claim 8, wherein said n-type impurity is arsenic and said p-type impurity is boron.
Claim 12
Dependent Claim
41 words
A method of manufacturing a semiconductor device according to claim 6, wherein said CVD-silicon nitride layer pattern is removed after said step of thermally diffusing is performed, and then followed by a further step of thermally diffusing under an oxygen-containing atmosphere.
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