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US5293075A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor device with PZT/PLZT film and lead-containing electrode

Assignee: Sharp Corp
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Filing: 1992-05-29
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Granted: 1994-03-08
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Expires: 2012-05-29
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Abstract

Abstract A semiconductor device comprising an oxide film, an electrode and a PZT or PLZT film formed in this order on a substrate, the electrode being a deposit of platinum containing lead.

Inventors

  • 👤 Shigeo Onishi
  • 👤 Kazuya Ishihara
  • 👤 Keizo Sakiyama

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 05:36
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/60; H10D1/68; H10D1/682; H10D1/692

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 50 words
A semiconductor device comprising: a substrate; an oxide film formed on the substrate; an electrode formed on the oxide film; and a PZT or PLZT film formed on the electrode; the electrode being a deposit of platinum containing lead, wherein said deposit contains 5 to 20 wt. % of lead.
Claim 2
Dependent Claim 50 words
A semiconductor device comprising: a substrate; an oxide film formed on the substrate; an electrode formed on the oxide film; and a PZT or PLZT film formed on the electrode; the electrode being a deposit of platinum containing lead, wherein said deposit contains 5 to 20 wt. % of lead.
Claim 3
Dependent Claim 23 words
A semiconductor device as set forth in claim 1, wherein the electrode is formed by sputtering using platinum containing lead as a target.
Claim 4
Dependent Claim 60 words
A semiconductor device comprising: a substrate; an oxide film formed on the substrate; an electrode formed on the oxide film; and a PZT or PLZT film formed on the electrode; the electrode being a deposit which contains platinum and lead prior to formation of the PZT or PLZT film, wherein said deposit contains 5 to 20 wt. % of lead.
Claim 5
Dependent Claim 60 words
A semiconductor device comprising: a substrate; an oxide film formed on the substrate; an electrode formed on the oxide film; and a PZT or PLZT film formed on the electrode; the electrode being a deposit which contains platinum and lead prior to formation of the PZT or PLZT film, wherein said deposit contains 5 to 20 wt. % of lead.

References Cited (Backward Citations)

US5046043A Cited
US5099305A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-03-07 1997-09-06 1998-03-08 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-03-07 2001-09-06 2002-03-08 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-03-07 2005-09-06 2006-03-08 $7700.00 Window Closed / Lapsed

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