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US5279702A Expired / Lapsed US ⏱️ 0.0 years remaining

Anisotropic liquid phase photochemical copper etch

Assignee: Texas Instruments Inc
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Filing: 1992-09-30
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Granted: 1994-01-18
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Expires: 2012-09-30
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Abstract

Abstract A copper substrate 30 is immersed in a liquid 34 (e.g. 0.1 molar concentration hydrochloric acid) and illuminated with collimated radiation 24 (e.g. collimated visible/ultraviolet radiation) produced by a radiation source 20 (e.g. a 200 Watt mercury xenon arc lamp). A window 26 which is substantially transparent to the collimated radiation 24 allows the radiated energy to reach the copper substrate 30. An etch mask 32 may be positioned between the radiation source 20 and the substrate 30 (preferably the mask is also in the liquid). The copper substrate 30 and liquid 34 may be maintained at a nominal temperature (e.g. 25 degrees C.). Without illumination, the copper is not appreciably etched by the liquid. Upon illumination the etch rate is substantially increased. A further aspect is the addition of a passivant (e.g. iodine) to the liquid which forms a substantially insoluble passivation layer 36 on the substrate which is removed or partially removed by the radiation 24. Sidewalls 40 are protected from the etchant by vertical passivation layers 42, further increasing the difference between the illuminated and unilluminated etch rates.

Inventors

  • 👤 Monte A. Douglas

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 04:09
CPC Classifications
C; C23; C23F; C23F1/00; C23F1/02; H; H10; H10P; H10P50/00; H10P50/60; H10P50/66; H10P50/663; H10P50/667; H05; H05K; H05K3/00; H05K3/02; H05K3/06

Claims Analysis

Total Claims: 27
Claim 1
Independent Claim 54 words
A method to anisotropically etch copper, said method comprising: (a) submersing a surface of said copper in a liquid; and (b) illuminating portions of said surface with radiation to produce illuminated areas and substantially unilluminated areas of said surface, wherein said illuminated areas are etched at a substantially greater rate than said unilluminated areas.
Claim 2
Independent Claim 54 words
A method to anisotropically etch copper, said method comprising: (a) submersing a surface of said copper in a liquid; and (b) illuminating portions of said surface with radiation to produce illuminated areas and substantially unilluminated areas of said surface, wherein said illuminated areas are etched at a substantially greater rate than said unilluminated areas.
Claim 3
Dependent Claim 24 words
The method according to claim 1, wherein said illuminated areas are at a temperature substantially the same as the temperature of said unilluminated areas.
Claim 4
Dependent Claim 12 words
The method according to claim 1, wherein said liquid contains hydrochloric acid.
Claim 5
Dependent Claim 13 words
The method according to claim 1, wherein said liquid is H 2 O.
Claim 6
Dependent Claim 16 words
The method according to claim 1, wherein said radiation is produced by a mercury/xenon arc lamp.
Claim 7
Dependent Claim 18 words
The method according to claim 1, wherein said copper is on the surface of a VLSI semiconductor substrate.
Claim 8
Dependent Claim 15 words
The method according to claim 1, wherein said copper is part of in integrated circuit.
Claim 9
Dependent Claim 20 words
The method according to claim 1, wherein the direction of propagation of said radiation is substantially orthogonal to said surface.
Claim 10
Dependent Claim 11 words
The method according to claim 1, wherein said liquid is acidic.
Claim 11
Dependent Claim 13 words
The method according to claim 1, wherein said liquid is a salt solution.
Claim 12
Dependent Claim 15 words
The method according to claim 1, wherein the intensity of said radiation varies with time.
Claim 13
Dependent Claim 18 words
The method according to claim 1, wherein said liquid is made to flow with respect to said copper.
Claim 14
Dependent Claim 11 words
The method according to claim 1, wherein said radiation is monochromatic.
Claim 15
Dependent Claim 29 words
The method according to claim 1, wherein an etch mask is interposed between the source of said radiation and said surface, whereby portions of said surface are not illuminated.
Claim 16
Dependent Claim 15 words
The method according to claim 14, wherein said etch mask is comprised of silicon dioxide.
Claim 17
Dependent Claim 15 words
The method according to claim 14, wherein said etch mask is comprised of silicon nitride.
Claim 18
Dependent Claim 18 words
The method according to claim 14, wherein said etch mask is comprised of one or more noble metals.
Claim 19
Dependent Claim 12 words
The method according to claim 14, wherein said etch mask is photoresist.
Claim 20
Dependent Claim 62 words
The method according to claim 1, wherein a passivant is added to said liquid, said passivant forming a passivation layer on said surface, said passivation layer being substantially insoluble in said unilluminated areas but substantially removed from said illuminated areas by said radiation, whereby the etch rate in said illuminated areas is substantially greater than the etch rate in said unilluminated areas.
Claim 21
Dependent Claim 11 words
The method according to claim 19, wherein said passivant is iodine.
Claim 22
Dependent Claim 12 words
The method according to claim 19, wherein said liquid contains hydrochloric acid.
Claim 23
Independent Claim 25 words
A method to etch copper on a VLSI semiconductor substrate, said method comprising submersing said copper in a liquid and illuminating said copper with radiation.
Claim 24
Independent Claim 25 words
A method to etch copper on a VLSI semiconductor substrate, said method comprising submersing said copper in a liquid and illuminating said copper with radiation.
Claim 25
Independent Claim 56 words
A method to anisotropically etch copper on an integrated circuit, said method comprising: (a) submersing a surface of said copper in 0.1% molar concentration hydrochloric acid; and (b) illuminating portions of said surface with radiation, whereby said illuminated portions of said surface are etched at a substantially greater rate than the unilluminated portions of said surface.
Claim 26
Independent Claim 56 words
A method to anisotropically etch copper on an integrated circuit, said method comprising: (a) submersing a surface of said copper in 0.1% molar concentration hydrochloric acid; and (b) illuminating portions of said surface with radiation, whereby said illuminated portions of said surface are etched at a substantially greater rate than the unilluminated portions of said surface.
Claim 27
Dependent Claim 16 words
The method according to claim 23, wherein 0.019% molar concentration iodine is added to said liquid.

References Cited (Backward Citations)

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US4415414A Cited
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US5157000A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-01-17 1997-07-19 1998-01-18 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-01-17 2001-07-19 2002-01-18 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-01-17 2005-07-19 2006-01-18 $7700.00 Window Closed / Lapsed

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