Claims Analysis
Total Claims: 27
Claim 1
Independent Claim
54 words
A method to anisotropically etch copper, said method comprising: (a) submersing a surface of said copper in a liquid; and (b) illuminating portions of said surface with radiation to produce illuminated areas and substantially unilluminated areas of said surface, wherein said illuminated areas are etched at a substantially greater rate than said unilluminated areas.
Claim 2
Independent Claim
54 words
A method to anisotropically etch copper, said method comprising: (a) submersing a surface of said copper in a liquid; and (b) illuminating portions of said surface with radiation to produce illuminated areas and substantially unilluminated areas of said surface, wherein said illuminated areas are etched at a substantially greater rate than said unilluminated areas.
Claim 3
Dependent Claim
24 words
The method according to claim 1, wherein said illuminated areas are at a temperature substantially the same as the temperature of said unilluminated areas.
Claim 4
Dependent Claim
12 words
The method according to claim 1, wherein said liquid contains hydrochloric acid.
Claim 5
Dependent Claim
13 words
The method according to claim 1, wherein said liquid is H 2 O.
Claim 6
Dependent Claim
16 words
The method according to claim 1, wherein said radiation is produced by a mercury/xenon arc lamp.
Claim 7
Dependent Claim
18 words
The method according to claim 1, wherein said copper is on the surface of a VLSI semiconductor substrate.
Claim 8
Dependent Claim
15 words
The method according to claim 1, wherein said copper is part of in integrated circuit.
Claim 9
Dependent Claim
20 words
The method according to claim 1, wherein the direction of propagation of said radiation is substantially orthogonal to said surface.
Claim 10
Dependent Claim
11 words
The method according to claim 1, wherein said liquid is acidic.
Claim 11
Dependent Claim
13 words
The method according to claim 1, wherein said liquid is a salt solution.
Claim 12
Dependent Claim
15 words
The method according to claim 1, wherein the intensity of said radiation varies with time.
Claim 13
Dependent Claim
18 words
The method according to claim 1, wherein said liquid is made to flow with respect to said copper.
Claim 14
Dependent Claim
11 words
The method according to claim 1, wherein said radiation is monochromatic.
Claim 15
Dependent Claim
29 words
The method according to claim 1, wherein an etch mask is interposed between the source of said radiation and said surface, whereby portions of said surface are not illuminated.
Claim 16
Dependent Claim
15 words
The method according to claim 14, wherein said etch mask is comprised of silicon dioxide.
Claim 17
Dependent Claim
15 words
The method according to claim 14, wherein said etch mask is comprised of silicon nitride.
Claim 18
Dependent Claim
18 words
The method according to claim 14, wherein said etch mask is comprised of one or more noble metals.
Claim 19
Dependent Claim
12 words
The method according to claim 14, wherein said etch mask is photoresist.
Claim 20
Dependent Claim
62 words
The method according to claim 1, wherein a passivant is added to said liquid, said passivant forming a passivation layer on said surface, said passivation layer being substantially insoluble in said unilluminated areas but substantially removed from said illuminated areas by said radiation, whereby the etch rate in said illuminated areas is substantially greater than the etch rate in said unilluminated areas.
Claim 21
Dependent Claim
11 words
The method according to claim 19, wherein said passivant is iodine.
Claim 22
Dependent Claim
12 words
The method according to claim 19, wherein said liquid contains hydrochloric acid.
Claim 23
Independent Claim
25 words
A method to etch copper on a VLSI semiconductor substrate, said method comprising submersing said copper in a liquid and illuminating said copper with radiation.
Claim 24
Independent Claim
25 words
A method to etch copper on a VLSI semiconductor substrate, said method comprising submersing said copper in a liquid and illuminating said copper with radiation.
Claim 25
Independent Claim
56 words
A method to anisotropically etch copper on an integrated circuit, said method comprising: (a) submersing a surface of said copper in 0.1% molar concentration hydrochloric acid; and (b) illuminating portions of said surface with radiation, whereby said illuminated portions of said surface are etched at a substantially greater rate than the unilluminated portions of said surface.
Claim 26
Independent Claim
56 words
A method to anisotropically etch copper on an integrated circuit, said method comprising: (a) submersing a surface of said copper in 0.1% molar concentration hydrochloric acid; and (b) illuminating portions of said surface with radiation, whereby said illuminated portions of said surface are etched at a substantially greater rate than the unilluminated portions of said surface.
Claim 27
Dependent Claim
16 words
The method according to claim 23, wherein 0.019% molar concentration iodine is added to said liquid.