US5260234A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for bonding a lead to a die pad using an electroless plating solution
Assignee: Philips Semiconductors Inc
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Filing: 1991-10-09
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Granted: 1993-11-09
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Expires: 2011-10-09
Abstract
Abstract An interconnect structure comprising an interconnection formed between a bond pad and the end of a lead. The layer includes nickel, copper, cobalt, palladium, platinum, silver or gold and is electrically conductive. Also, an apparatus for forming an interconnection by a metal plating process and a device having a lead, a substrate, and a bath containing an aqueous metal plating solution which permits formation of the interconnect structure. A method of forming an interconnect structure including the step of placing a lead adjacent to a bond pad and placing the two in an electroless plating solution so that the interconnect structure may be formed.
Inventors
- 👤 Jon M. Long
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 20:57
CPC Classifications
H; H10; H10W; H10W70/00; H10W70/40; H10W70/456; H10W70/457; H10W70/01; H10W70/04; H10W70/041; H10W70/453; H10W72/00; H10W72/50; H10W72/541; H10W72/5449; H10W72/90; H10W72/931; H10W72/932
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
167 words
A method of forming an interconnect structure between a semiconductor wafer having at least one bond pad composed of aluminum and the end of at least one lead composed of copper, said method comprising the steps of: securing the relative positions of said end of said lead and said at least one bond pad by a securing means so that the end and the pad are adjacent to each other; providing an aqueous metal plating solution; surrounding said at least one lead and said at least one bond pad by said plating solution to permit formation of an interconnect structure between said lead and said bond pad; leaving said bond pad and said lead in said plating solution for a predetermined time period until an interconnect structure having a desired thickness is formed; and removing said bond pad and said lead from said aqueous metal plating solution when an interconnect structure between said end of said lead and said bond pad having a desired thickness is formed.
Claim 2
Independent Claim
167 words
A method of forming an interconnect structure between a semiconductor wafer having at least one bond pad composed of aluminum and the end of at least one lead composed of copper, said method comprising the steps of: securing the relative positions of said end of said lead and said at least one bond pad by a securing means so that the end and the pad are adjacent to each other; providing an aqueous metal plating solution; surrounding said at least one lead and said at least one bond pad by said plating solution to permit formation of an interconnect structure between said lead and said bond pad; leaving said bond pad and said lead in said plating solution for a predetermined time period until an interconnect structure having a desired thickness is formed; and removing said bond pad and said lead from said aqueous metal plating solution when an interconnect structure between said end of said lead and said bond pad having a desired thickness is formed.
Claim 3
Dependent Claim
39 words
The method as defined in claim 1 wherein the step of surrounding said bond pad and said lead by said plating solution comprises the step of submerging said semiconductor wafer and said lead into an electroless aqueous nickel solution.
Claim 4
Dependent Claim
36 words
The method as defined in claim 1 wherein the step of leaving said bond pad and said lead in said plating solution includes the step of leaving them in said plating solution for approximately fifteen minutes.
Claim 5
Dependent Claim
23 words
The method as defined in claim 1 wherein the step of providing an aqueous metal plating solution is performed at substantially room temperature.
Claim 6
Dependent Claim
46 words
The method as defined in claim 1 and further including the following step to be performed prior to said securing step: coating the surface of said lead with a protective layer except at said end of said lead where the interconnect structure is to be formed.
Claim 7
Dependent Claim
47 words
The method as defined in claim 5 and further including the following step to be performed after the step of removing said bond pad and said lead from said aqueous metal plating solution: removing said protective layer from the surface of said lead and said bond pad.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1996-11-08 | 1997-05-10 | 1997-11-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-11-08 | 2001-05-10 | 2001-11-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-11-08 | 2005-05-10 | 2005-11-09 | $7700.00 | Window Closed / Lapsed |