MOS analog memory with injection capacitors

Claim 2

A dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; and a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure.

Claim 3

A dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing, a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure; and a source, coupled to said first terminal and said second terminal, capable of providing voltage pulses of either positive or negative polarity, said voltage pulses being of such a magnitude that when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically positive with respect to said second terminal, electrons are injected onto said floating gate structure, and when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to the electrically negative with respect to said second terminal, electrons are injected off of said floating gate structure.

Claim 4

A dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing, a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure; and a source, coupled to said first terminal and said second terminal, capable of providing voltage pulses of either positive or negative polarity, said voltage pulses being of such a magnitude that when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically positive with respect to said second terminal, electrons are injected onto said floating gate structure, and when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to the electrically negative with respect to said second terminal, electrons are injected off of said floating gate structure.

Claim 5

A dual-writing polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; and a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrodes may be injected onto said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on an insulating substrate using a silicon-on-insulator technology and said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 6

A dual-writing polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; and a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrodes may be injected onto said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on an insulating substrate using a silicon-on-insulator technology and said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 7

A dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors, coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacity means to said floating gate structure to allow a bias of said floating gate structure; a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure; and a source, coupled to said first terminal and said second terminal, capable of providing voltage pulses of either positive or negative polarity, said voltage pulses being of such a magnitude that when at least one of said voltage pulses is applied across said first and second terminals and causes said firs terminal to be electrically positive with respect to said second terminal, electrons are injected onto said floating gate structure, and when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically negative with respect to said second terminal, electrons are injected off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell is fabricated on an insulating substrate using a silicon-on-insulator technology sand said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 8

A dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors, coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacity means to said floating gate structure to allow a bias of said floating gate structure; a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure; and a source, coupled to said first terminal and said second terminal, capable of providing voltage pulses of either positive or negative polarity, said voltage pulses being of such a magnitude that when at least one of said voltage pulses is applied across said first and second terminals and causes said firs terminal to be electrically positive with respect to said second terminal, electrons are injected onto said floating gate structure, and when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically negative with respect to said second terminal, electrons are injected off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell is fabricated on an insulating substrate using a silicon-on-insulator technology sand said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 9

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated from a film of silicon on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and having one injection capacitor of said injection capacitor means having a first region and another injection capacitor of said injection capacitor means having a second region, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which his otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 10

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated from a film of silicon on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and having one injection capacitor of said injection capacitor means having a first region and another injection capacitor of said injection capacitor means having a second region, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which his otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 11

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated from a film of silicon on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitor coupled to a bias capacitor, one injection capacitor of said injection capacitor means having a first region and the other injection capacitor of said injection capacitor means having a second region, said bias capacitor being used to bias said floating gate during writing and said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 12

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated from a film of silicon on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitor coupled to a bias capacitor, one injection capacitor of said injection capacitor means having a first region and the other injection capacitor of said injection capacitor means having a second region, said bias capacitor being used to bias said floating gate during writing and said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 13

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated from a film of silicon on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; and a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 14

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated from a film of silicon on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; and a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 15

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated from a film of silicon on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitors means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure; and a source, coupled to said first terminal and said second terminal, capable of providing voltage unless of either positive or negative polarity, said voltages being of such a magnitude that when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically positive with respect to said second terminal, electrons are injected onto said floating gate structure, and when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically negative with respect to said second terminal, electrons are injected off of said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which his capacitively coupled to said floating gate structure.

Claim 16

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated from a film of silicon on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitors means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure; and a source, coupled to said first terminal and said second terminal, capable of providing voltage unless of either positive or negative polarity, said voltages being of such a magnitude that when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically positive with respect to said second terminal, electrons are injected onto said floating gate structure, and when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically negative with respect to said second terminal, electrons are injected off of said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which his capacitively coupled to said floating gate structure.

Claim 17

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated from constituent elements of polysilicon, single crystal silicon, silicon dioxide and metal portions on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and having one injection capacitor of said injection capacitor means having a first region and another injection capacitor of said injection capacitor means having a second region, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 18

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated from constituent elements of polysilicon, single crystal silicon, silicon dioxide and metal portions on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and having one injection capacitor of said injection capacitor means having a first region and another injection capacitor of said injection capacitor means having a second region, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 19

In a dual-writing-polarity non-volatile MSO analog memory cell fabricated from constituent elements of polysilicon, single crystal silicon, silicon dioxide and metal portions on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors coupled to said bias capacitor, one injection capacitor of said injection capacitor means having a first region and the other injection capacitor of said injection capacitor means having a second region, said bias capacitor being used to bias said floating gate during writing and said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure on which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 20

In a dual-writing-polarity non-volatile MSO analog memory cell fabricated from constituent elements of polysilicon, single crystal silicon, silicon dioxide and metal portions on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors coupled to said bias capacitor, one injection capacitor of said injection capacitor means having a first region and the other injection capacitor of said injection capacitor means having a second region, said bias capacitor being used to bias said floating gate during writing and said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure on which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 21

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated from constituent elements of polysilicon, single crystal silicon, silicon dioxide and metal portions on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; and a second terminal capacitively coupled by both of said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 22

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated from constituent elements of polysilicon, single crystal silicon, silicon dioxide and metal portions on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; and a second terminal capacitively coupled by both of said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure.

Claim 23

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated from constituent elements of polysilicon, single crystal silicon, silicon dioxide and metal portions on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising; injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure; and a source, coupled to said first terminal and said second terminal, capable of providing voltage pulses of either positive or negative polarity, said voltage pulses being of such a magnitude that when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically positive wit respect to said second terminal, electrons are injected onto said floating gate structure, and when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically negative with respect to said second terminal, electrons are injected off of said floating gate structure.

Claim 24

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated from constituent elements of polysilicon, single crystal silicon, silicon dioxide and metal portions on a sapphire insulating substrate having a floating gate structure, an improvement therefor is provided comprising; injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure; and a source, coupled to said first terminal and said second terminal, capable of providing voltage pulses of either positive or negative polarity, said voltage pulses being of such a magnitude that when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically positive wit respect to said second terminal, electrons are injected onto said floating gate structure, and when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically negative with respect to said second terminal, electrons are injected off of said floating gate structure.

Claim 25

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and having a pair of interconnected injection capacitors including one injection capacitor of said injection capacitor means having a first region and another injection capacitor of said injection capacitor means having a second region, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure and a depletion-mode multiplier circuit coupled to said injection capacitors so as to detect or read the charge on said floating gate structure.

Claim 26

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and having a pair of interconnected injection capacitors including one injection capacitor of said injection capacitor means having a first region and another injection capacitor of said injection capacitor means having a second region, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure and a depletion-mode multiplier circuit coupled to said injection capacitors so as to detect or read the charge on said floating gate structure.

Claim 27

In a dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, one injection capacitor of said injection capacitor means having a first region and the other injection capacitor of said injection capacitor means having a second region, said bias capacitor being used to bias said floating gate during writing and said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure and a depletion-mode multiplier circuit coupled to said injection capacitors so as to detect or read the charge on said floating gate structure.

Claim 28

In a dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, one injection capacitor of said injection capacitor means having a first region and the other injection capacitor of said injection capacitor means having a second region, said bias capacitor being used to bias said floating gate during writing and said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure and a depletion-mode multiplier circuit coupled to said injection capacitors so as to detect or read the charge on said floating gate structure.

Claim 29

In a dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected into said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure; and a depletion-mode multiplier circuit pulsed to said injection capacitors so as to detect or read the charge on said floating gate structure.

Claim 30

In a dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected into said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure; and a depletion-mode multiplier circuit pulsed to said injection capacitors so as to detect or read the charge on said floating gate structure.

Claim 31

In a dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off if said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate having a silicon-on-insulator technology and said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; a second terminal capacitively coupled by both said injection capacitors of said injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which his electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure; a source, coupled to said first terminal and said second terminal, capable of providing voltage pulses of either positive or negative polarity, said voltage pulses being of such a magnitude that when at least one of a voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically positive with respect to said second terminal, electrons are injected onto said floating gate structure, and when at lest one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically negative with respect to said second terminal, electrons are injected off of said floating gate structure; and a depletion-mode multiplier circuit coupled to said injection capacitors so as to detect or read the charge on said floating gate structure.

Claim 32

In a dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off if said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate having a silicon-on-insulator technology and said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; a second terminal capacitively coupled by both said injection capacitors of said injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which his electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure; a source, coupled to said first terminal and said second terminal, capable of providing voltage pulses of either positive or negative polarity, said voltage pulses being of such a magnitude that when at least one of a voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically positive with respect to said second terminal, electrons are injected onto said floating gate structure, and when at lest one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically negative with respect to said second terminal, electrons are injected off of said floating gate structure; and a depletion-mode multiplier circuit coupled to said injection capacitors so as to detect or read the charge on said floating gate structure.

Claim 33

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and having a pair of interconnected injection capacitors including one injection capacitor of said injection capacitor means having a first region and another injection capacitor of said injection capacitor means having a second region, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure, said injection capacitor means includes a bias capacitor fabricated from polysilicon PS, silicon dioxide and single crystal silicon SC to bias said floating gate structure during writing.

Claim 34

In a dual-writing-polarity non-volatile MOS analog memory cell fabricated having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and having a pair of interconnected injection capacitors including one injection capacitor of said injection capacitor means having a first region and another injection capacitor of said injection capacitor means having a second region, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure, said injection capacitor means includes a bias capacitor fabricated from polysilicon PS, silicon dioxide and single crystal silicon SC to bias said floating gate structure during writing.

Claim 35

In a dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, icnlduign as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, one injection capacitor of said injection capacitor means having a first region and the other injection capacitor means having a first region and the other injection capacitor of said injection capacitor means having a second region, said bias capacitor being used to bias said floating gate during writing sand said first region and said second region each constituents a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure, said bias capacitor being fabricated from polysilicon PS, silicon dioxide and single crystal silicon SC to bias said floating gate structure during writing.

Claim 36

In a dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, icnlduign as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, one injection capacitor of said injection capacitor means having a first region and the other injection capacitor means having a first region and the other injection capacitor of said injection capacitor means having a second region, said bias capacitor being used to bias said floating gate during writing sand said first region and said second region each constituents a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure, said bias capacitor being fabricated from polysilicon PS, silicon dioxide and single crystal silicon SC to bias said floating gate structure during writing.

Claim 37

In a dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; and a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure, said bias capacitor being fabricated from polysilicon PS, silicon dioxide and single crystal silicon SC to bias said floating gate structure during writing.

Claim 38

In a dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising: injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; and a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure, said bias capacitor being fabricated from polysilicon PS, silicon dioxide and single crystal silicon SC to bias said floating gate structure during writing.

Claim 39

In a dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising; injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure; and a source, coupled to said first terminal and said second terminal, capable of providing voltage pulses of either positive or negative polarity, said voltage pulses being of such a magnitude that when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically positive with respect to said second terminal, electrons are injected onto said floating gate structure, and when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically negative with respect to said second terminal, electrons are injected off of said floating gate structure, said bias capacitor being fabricated from polysilicon PS, silicon dioxide and single crystal silicon SC to bias said floating gate structure during writing.

Claim 40

In a dual-writing-polarity non-volatile MOS analog memory cell having a floating gate structure, an improvement therefor is provided comprising; injection capacitor means, including as part thereof said floating gate structure, for permitting the modification of analog information stored in the form of charge on said floating gate structure by the use of hot-carrier injection onto and off of said floating gate structure, said dual-writing-polarity non-volatile MOS analog memory cell being fabricated on said insulating substrate using a silicon-on-insulator technology and said injection capacitor means includes a pair of interconnected injection capacitors coupled to a bias capacitor, said bias capacitor being used to bias said floating gate during writing; a first terminal capacitively coupled by said bias capacitor of said injection capacitor means to said floating gate structure to allow a bias of said floating gate structure; a second terminal capacitively coupled by both said injection capacitors of said injection capacitor means to said floating gate structure to allow injection of charge onto and off of said floating gate structure, one of said injection capacitors of said injection capacitor means includes a first region of p-type crystalline silicon capacitively coupled to said second terminal from which first region electrons may be injected off of said floating gate structure, and the other of said injection capacitors of said injection capacitor means includes a second region of p-type crystalline silicon electrically connected to said second terminal from which second region electrons may be injected onto said floating gate structure, said first region and said second region each constitutes a p-type crystalline silicon island, one of which is electrically connected to said floating gate structure and which is otherwise electrically isolated on said insulating substrate, and the other of which is capacitively coupled to said floating gate structure; and a source, coupled to said first terminal and said second terminal, capable of providing voltage pulses of either positive or negative polarity, said voltage pulses being of such a magnitude that when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically positive with respect to said second terminal, electrons are injected onto said floating gate structure, and when at least one of said voltage pulses is applied across said first and second terminals and causes said first terminal to be electrically negative with respect to said second terminal, electrons are injected off of said floating gate structure, said bias capacitor being fabricated from polysilicon PS, silicon dioxide and single crystal silicon SC to bias said floating gate structure during writing.