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US5234869A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of manufacturing silicon nitride film

Assignee: Toshiba Corp
•
Filing: 1991-06-26
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Granted: 1993-08-10
•
Expires: 2011-06-26
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Abstract

Abstract According to this invention, there is disclosed a method of manufacturing a silicon nitride film on a semiconductor substrate using a low-pressure CVD apparatus, including the steps of setting a plurality of semiconductor wafers in a boat in a reaction furnace, increasing a temperature in the reaction tube to a predetermined temperature and decreasing a pressure in the reaction tube to a predetermined pressure, and supplying Si(N(CH 3 ) 2 ) 4 gas from a first gas source to the reaction tube and supplying NH 3 gas from a second gas source to the reaction tube.

Inventors

  • 👤 Yuuichi Mikata
  • 👤 Takahiko Moriya

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 02:49
CPC Classifications
C; C23; C23C; C23C16/00; C23C16/22; C23C16/30; C23C16/34; H; H10; H10P; H10P14/00; H10P14/60; H10P14/69; H10P14/694; H10P14/6943; H10P14/69433; C23C16/345; H10P14/63; H10P14/6326; H10P14/6328; H10P14/6334; H10P14/66; H10P14/668; H10P14/6681; H10P14/6687; H10P14/6689; H10P14/6336; Y; Y10; Y10S; Y10S148/00; Y10S148/114

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 147 words
A method of manufacturing a silicon nitride film on a semiconductor substrate using a low-pressure CVD apparatus, comprising the steps of: setting a plurality of semiconductor wafers in a boat of a reaction tube; increasing a temperature in said reaction tube to a specified temperature and decreasing a pressure in said reaction tube to a specified pressure; supplying a first gas selected from the group consisting of Si(N(CH 3 ) 2 ) 4 , SiH(N(CH 3 ) 2 ) 3 , SiH 2 (N(CH 3 ) 2 ) 2 , and siH 3 (N(CH 3 ) 2 ) from a first gas source to said reaction tube and supplying a second gas selected from the group consisting of N 2 and NH 3 from a second gas source to said reaction tube; and producing a plasma from said first and second gases supplied in said reaction tube.
Claim 2
Independent Claim 147 words
A method of manufacturing a silicon nitride film on a semiconductor substrate using a low-pressure CVD apparatus, comprising the steps of: setting a plurality of semiconductor wafers in a boat of a reaction tube; increasing a temperature in said reaction tube to a specified temperature and decreasing a pressure in said reaction tube to a specified pressure; supplying a first gas selected from the group consisting of Si(N(CH 3 ) 2 ) 4 , SiH(N(CH 3 ) 2 ) 3 , SiH 2 (N(CH 3 ) 2 ) 2 , and siH 3 (N(CH 3 ) 2 ) from a first gas source to said reaction tube and supplying a second gas selected from the group consisting of N 2 and NH 3 from a second gas source to said reaction tube; and producing a plasma from said first and second gases supplied in said reaction tube.
Claim 3
Independent Claim 148 words
A method of manufacturing a silicon nitride film on a semiconductor substrate using a low-pressure CVD apparatus, comprising the steps of: setting a plurality of semiconductor wafers in a boat of a reaction tube; increasing a temperature in the reaction tube to a specified temperature and decreasing a pressure in the reaction tube to a specified pressure; supplying a first gas selected from the group consisting of si(N(CH 3 ) 2 ) 4 , SiH(N(CH 3 ) 2 ) 3 , SiH 2 (N(CH 3 ) 2 ) 2 , and SiH 3 (N(CH 3 ) 2 ) from a first gas source to the reaction tube and supplying a second gas selected from the group consisting of N 2 and NH 3 from a second gas source to the reaction tube; and radiating an ultraviolet beam on the first and second gases supplied in the reaction tube.
Claim 4
Independent Claim 148 words
A method of manufacturing a silicon nitride film on a semiconductor substrate using a low-pressure CVD apparatus, comprising the steps of: setting a plurality of semiconductor wafers in a boat of a reaction tube; increasing a temperature in the reaction tube to a specified temperature and decreasing a pressure in the reaction tube to a specified pressure; supplying a first gas selected from the group consisting of si(N(CH 3 ) 2 ) 4 , SiH(N(CH 3 ) 2 ) 3 , SiH 2 (N(CH 3 ) 2 ) 2 , and SiH 3 (N(CH 3 ) 2 ) from a first gas source to the reaction tube and supplying a second gas selected from the group consisting of N 2 and NH 3 from a second gas source to the reaction tube; and radiating an ultraviolet beam on the first and second gases supplied in the reaction tube.
Claim 5
Dependent Claim 52 words
The method according to claim 1, wherein: the specified temperature in the reaction tube is about 300° C.; the specified pressure in the reaction tube is about 0.5 Torr; the flow rate of the first gas is about 100 SCCM; and the flow rate of the second gas is about 1000 SCCM.
Claim 6
Dependent Claim 52 words
The method according to claim 2, wherein: the specified temperature in the reaction tube is about 700° C; the specified pressure in the reaction tube is about 0.5 Torr; the flow rate of the first gas is about 100 SCCM; and the flow rate of the second gas is about 1000 SCCM.
Claim 7
Dependent Claim 32 words
The method according to claim 1, wherein the step of increasing the temperature in the reaction tube to a specified temperature is carried out simultaneously with the step of producing a plasma.
Claim 8
Dependent Claim 33 words
The method according to claim 2, wherein the step of increasing the temperature in the reaction tube to a specified temperature is carried out simultaneously with the step of radiating an ultraviolet beam.

References Cited (Backward Citations)

US4158717A Cited
US4702936A Cited
US4699825A Cited
US4855258A Cited
US4877651A Cited
US4992306A Cited
US5040046A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-08-09 1997-02-08 1997-08-10 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-08-09 2001-02-08 2001-08-10 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-08-09 2005-02-08 2005-08-10 $7700.00 Window Closed / Lapsed

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