Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
133 words
A method for fabricating an active device, comprising the steps of: injecting particles into a surface of a single crystal substrate of a semiconductor material; annealing the substrate that contains the particles to form an amorphous oxide insulator layer within the substrate, generally in correspondence to a depth of said injected particles, said step of annealing including a step of forming a single crystal semiconductor layer of a semiconductor material identical in composition and crystal orientation with the semiconductor material of the substrate, on the amorphous oxide insulator layer that is formed by the annealing; growing the oxide super conductor layer on said semiconductor layer while maintaining an epitaxial relationship with respect to the substrate; and converting the semiconductor layer to an oxide layer simultaneously to the growth of the oxide superconductor layer.
Claim 2
Independent Claim
133 words
A method for fabricating an active device, comprising the steps of: injecting particles into a surface of a single crystal substrate of a semiconductor material; annealing the substrate that contains the particles to form an amorphous oxide insulator layer within the substrate, generally in correspondence to a depth of said injected particles, said step of annealing including a step of forming a single crystal semiconductor layer of a semiconductor material identical in composition and crystal orientation with the semiconductor material of the substrate, on the amorphous oxide insulator layer that is formed by the annealing; growing the oxide super conductor layer on said semiconductor layer while maintaining an epitaxial relationship with respect to the substrate; and converting the semiconductor layer to an oxide layer simultaneously to the growth of the oxide superconductor layer.
Claim 3
Dependent Claim
18 words
A method as claimed in claim 1 in which said substrate comprises silicon and said particle comprises oxygen.
Claim 4
Dependent Claim
19 words
A method as claimed in claim 1 in which said insulator layer has a thickness of about 0.3 μm.
Claim 5
Dependent Claim
19 words
A method as claimed in claim 1 in which said semiconductor layer has a thickness of about 0.2 μm.
Claim 6
Dependent Claim
27 words
A method as claimed in claim 1 in which said steps of deposition and growth of the oxide superconductor layer are achieved in an oxygen plasma environment.
Claim 7
Dependent Claim
33 words
A method as claimed in claim 5 in which said steps of deposition and growth of the oxide superconductor layer comprise simultaneous deposition of yttrium, barium and copper in the oxygen plasma environment.
Claim 8
Dependent Claim
32 words
A method as claimed in claim 6 in which said oxide superconductor layer formed by the steps of deposition and growth has a composition of YBa 2 Cu 3 O 7-x .
Claim 9
Dependent Claim
26 words
A method as claimed in claim 1 further comprising the step of patterning the oxide superconductor layer to form an active device on the oxide layer.
Claim 10
Dependent Claim
16 words
A method as claimed in claim 8 in which said active device comprises a Josephson device.
Claim 11
Dependent Claim
18 words
A method as claimed in claim 8 in which said step of patterning comprises an ion milling process.