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Opto-electronic integrated circuit

Assignee: Sumitomo Electric Industries Ltd
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Filing: 1990-03-19
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Granted: 1992-12-08
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Expires: 2010-03-19
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Abstract

Abstract Present invention is to provide a process for producing an opto-electronic integrated circuit comprising a field effect transistor as an electronic device and a photo-diode as an optical device both formed on an InP substrate, the field effect transistor comprising a high electron mobility transistor having: a GaInAs layer epitaxially grown in the InP substrate in a preset region thereof, a n-AlInAs layer epitaxially grown on the GaInAs layer, a gate electrode formed on the AlInAs layer, and a source electrode and a drain electrode formed on the AlInAs layer with the gate electrode therebetween, and the photo-diode comprising a PIN photo-diode having: the GaInAs layer epitaxially grown on the InP substrate near the region of the field effect transistor simultaneously with the growth of that of the field effect transistor, the n-AlInAs layer epitaxially grown on the GaInAs layer simultaneously with the growth of that of the field effect transistor, a n-InP layer epitaxially grown on the n-AlInAs layer, an undoped GaInAs layer epitaxially grown on the n-InP layer in a preset region thereof, a p-GaInAs layer epitaxially grown on the undoped GaInAs layer, an anode electrode formed on the p-GaInAs layer, and a cathode electrode formed on the n-InP layer near the undoped GaInAs layer.

Inventors

  • 👤 Goro Sasaki

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 04:49
CPC Classifications
H; H10; H10F; H10F39/00; H10F39/10; H10F39/103

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 206 words
An opto-electronic integrated circuit comprising a field effect transistor as an electronic device and a photo-diode as an optical device both formed on an InP substrate, the field effect transistor comprising a high electron mobility transistor the photo-diode comprising a PIN photo-diode, the high electron mobility transistor comprising; a GaInAs layer epitaxially grown on the InP substrate in a preset region thereof, a n-AlInAs layer epitaxially grown on the GaInAs layer, a gate electrode formed on the AlInAs layer, and a source electrode and a drain electrode formed on the AlInAs layer with the gate electrode therebetween, and the PIN photo-diode comprising; the GaInAs layer epitaxially grown on the InP substrate near the region of the field effect transistor simultaneously with the growth of that of the field effect transistor, the n-AlInAs layer epitaxially grown on the GaInAs layer simultaneously with the growth of that of the field effect transistor, a n-InP layer epitaxially grown on the n-AlInAs layer, an undoped GaInAs layer epitaxially grown on the n-InP layer in a preset region thereof, a p-GaInAs layer epitaxially grown on the undoped GaInAs layer, an anode electrode formed on the p-GaInAs layer, and a cathode electrode formed on the n-InP layer near the undoped GaInAs layer.
Claim 2
Dependent Claim 206 words
An opto-electronic integrated circuit comprising a field effect transistor as an electronic device and a photo-diode as an optical device both formed on an InP substrate, the field effect transistor comprising a high electron mobility transistor the photo-diode comprising a PIN photo-diode, the high electron mobility transistor comprising; a GaInAs layer epitaxially grown on the InP substrate in a preset region thereof, a n-AlInAs layer epitaxially grown on the GaInAs layer, a gate electrode formed on the AlInAs layer, and a source electrode and a drain electrode formed on the AlInAs layer with the gate electrode therebetween, and the PIN photo-diode comprising; the GaInAs layer epitaxially grown on the InP substrate near the region of the field effect transistor simultaneously with the growth of that of the field effect transistor, the n-AlInAs layer epitaxially grown on the GaInAs layer simultaneously with the growth of that of the field effect transistor, a n-InP layer epitaxially grown on the n-AlInAs layer, an undoped GaInAs layer epitaxially grown on the n-InP layer in a preset region thereof, a p-GaInAs layer epitaxially grown on the undoped GaInAs layer, an anode electrode formed on the p-GaInAs layer, and a cathode electrode formed on the n-InP layer near the undoped GaInAs layer.
Claim 3
Dependent Claim 21 words
An opto-electronic integrated circuit according to claim 1, wherein the photo-diode has a p-InP layer in place of the p-GaInAs layer.
Claim 4
Dependent Claim 208 words
An opto-electronic integrated circuit comprising a field effect transistor as an electronic device and a photo-diode as an optical device both formed on an inP substrate, the field effect transistor comprising a high electron mobility transistor, the photo-diode comprising a PIN photo-diode, the high electron mobility transistor comprising: a GaInAs layer epitaxially grown on an InP substrate in a preset region thereof; a n-AlInAs layer located above the GaInAs layer and epitaxially grown; a gate electrode formed on the n-AlInAs layer; an InP layer formed on the n-AlInAs layer; and a source electrode and a drain electrode formed on the InP layer with the gate electrode therebetween, and the PIN photo-diode comprising; the GaInAs layer epitaxially grown near the region of the field effect transistor simultaneously with the growth of that of the field effect transistor, the n-AlInAs layer epitaxially grown on the GaInAs layer simultaneously with the growth of that of the field effect transistor, an n-InP layer epitaxially grown on the n-AlInAs layer, an undoped GaInAs layer epitaxially grown on the n-InP layer, and a p-GaInAs layer epitaxially grown on the undoped GaInAs layer, an anode electrode formed on the p-GaInAs layer, and a cathode electrode formed on the n-InP layer under the undoped GaInAs layer.
Claim 5
Dependent Claim 208 words
An opto-electronic integrated circuit comprising a field effect transistor as an electronic device and a photo-diode as an optical device both formed on an inP substrate, the field effect transistor comprising a high electron mobility transistor, the photo-diode comprising a PIN photo-diode, the high electron mobility transistor comprising: a GaInAs layer epitaxially grown on an InP substrate in a preset region thereof; a n-AlInAs layer located above the GaInAs layer and epitaxially grown; a gate electrode formed on the n-AlInAs layer; an InP layer formed on the n-AlInAs layer; and a source electrode and a drain electrode formed on the InP layer with the gate electrode therebetween, and the PIN photo-diode comprising; the GaInAs layer epitaxially grown near the region of the field effect transistor simultaneously with the growth of that of the field effect transistor, the n-AlInAs layer epitaxially grown on the GaInAs layer simultaneously with the growth of that of the field effect transistor, an n-InP layer epitaxially grown on the n-AlInAs layer, an undoped GaInAs layer epitaxially grown on the n-InP layer, and a p-GaInAs layer epitaxially grown on the undoped GaInAs layer, an anode electrode formed on the p-GaInAs layer, and a cathode electrode formed on the n-InP layer under the undoped GaInAs layer.
Claim 6
Dependent Claim 21 words
An opto-electronic integrated circuit according to claim 3, wherein the photo-diode has a p-InP layer in place of the p-GaInAs layer.
Claim 7
Dependent Claim 27 words
An opto-electronic integrated circuit according to claim 4, wherein the photodiode and the field effect transistor have respective n-GaInAs layers in place of the respective n-InP layers.
Claim 8
Dependent Claim 27 words
An opto-electronic integrated circuit according to claim 3, wherein the photodiode and the field effect transistor have respective n-GaInAs layers in place of the respective n-InP layers.

References Cited (Backward Citations)

EP0133709A2 Cited
US4636829A Cited
GB2168528A Cited
US4745446A Cited
US4771325A Cited
EP0235029A1 Cited
US4782223A Cited
US4829346A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-12-08 1996-06-08 1996-12-08 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-12-08 2000-06-08 2000-12-08 $3760.00 Window Closed / Lapsed
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