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US5122481A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor element manufacturing process using sequential grinding and chemical etching steps

Assignee: Sumitomo Electric Industries Ltd
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Filing: 1991-09-04
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Granted: 1992-06-16
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Expires: 2011-09-04
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Abstract

Abstract There is disclosed a method of manufacturing a semiconductor device comprising the steps of: forming a semiconductor element on one of major surfaces of a GaAs substrate; a grinding the substrate to make the GaAs substrate to a predetermined thickness by grinding the other surface of the GaAs substrate with a grinding stone having an average grain size of 6 micro-meters or larger; and an chemical etching the other surface of the substrate by 0.6 micro-meters or more just after the grinding step, without any further grinding treatment done on the other surface, just after the grinding step.

Inventors

  • 👤 Masanori Nishiguchi

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 22:35
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/60; H10P50/64; H10P50/642; H10P50/646; H10P52/00; H10P54/00; Y; Y10; Y10S; Y10S148/00; Y10S148/051; Y10S148/135

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 97 words
A method of manufacturing a semiconductor device comprising the steps of: forming a semiconductor element on one of major surfaces of a GaAs substrate; a grinding of the substrate to make the GaAs substrate to a predetermined thickness by grinding the other surface of the GaAs substrate with a grinding stone having an average grain size of 6 micro-meters or larger; and a chemical etching of the other surface of the substrate by 0.6 micro-meters or more just after the grinding step, without any further grinding treatment done on the other surface, just after the grinding step.
Claim 2
Independent Claim 97 words
A method of manufacturing a semiconductor device comprising the steps of: forming a semiconductor element on one of major surfaces of a GaAs substrate; a grinding of the substrate to make the GaAs substrate to a predetermined thickness by grinding the other surface of the GaAs substrate with a grinding stone having an average grain size of 6 micro-meters or larger; and a chemical etching of the other surface of the substrate by 0.6 micro-meters or more just after the grinding step, without any further grinding treatment done on the other surface, just after the grinding step.
Claim 3
Dependent Claim 21 words
A method according to claim 1, wherein said grinding step is of grinding said GaAs substrate using a diamond grinding stone.
Claim 4
Dependent Claim 37 words
A method according to claim 1, wherein said grinding step is of grinding said GaAs substrate using a diamond grinding stone of which an average grain size is larger than 6 micro-meters and smaller than 25 micro-meters.

References Cited (Backward Citations)

SU393073A1 Cited
US4226056A Cited
US4411107A Cited
FR2505713A1 Cited
US4587771A Cited
US4947598A Cited
US5035087A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-06-16 1995-12-16 1996-06-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-06-16 1999-12-16 2000-06-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-06-16 2003-12-16 2004-06-16 $7700.00 Window Closed / Lapsed

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