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Semiconductor laser device and a method of fabricating the same

Assignee: Sharp Corp
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Filing: 1991-04-12
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Granted: 1992-05-05
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Expires: 2011-04-12
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Abstract

Abstract A semiconductor laser device is provided which includes a semiconductor substrate and a multi-layered structure disposed on the substrate, the multi-layered structure containing an Al x Ga 1-x As (0<x<1) first cladding layer formed on the substrate, an Al y Ga 1-y As (0<y<1, x>y) active layer for laser oscillation formed on the first cladding layer, an Al x Ga 1-x As (0<x<1) second cladding layer formed on the active layer, and an Al z Ga 1-z As (0<z<1) current blocking layer formed above the second cladding layer, the current blocking layer having a striped groove as a current injection path. The method includes the steps of: forming a multi-layered structure on a semiconductor substrate, the multi-layered structure containing in order, an Al x Ga 1-x As (0<x<1) first cladding layer, an Al y Ga 1-y As (0<y<1, x>y) active layer for laser oscillation, an AlGaAs (0<x<1) second cladding layer, a GaAs buffer layer, an Al u Ga 1-u As (0<u<1) etching stopper layer, an Al z Ga 1-z As (0<z<1, z<u) current blocking layer, and a GaAs protective layer; etching the protective layer and the current blocking layer to form a striped groove as a current injection path; removing the exposed portion of the etching stopper layer on the bottom of the striped groove; removing the portion of the buffer layer on the bottom of the striped groove and at least one part of the protective layer by a melt-back technique; and growing an Al x Ga 1-x As (0<x<1) third cladding layer so as to bury the striped groove therein and growing a GaAs contact layer on the third cladding layer.

Inventors

  • 👤 Hiroyuki Hosoba
  • 👤 Akinori Seki
  • 👤 Toshio Hata
  • 👤 Masafumi Kondou
  • 👤 Takahiro Suyama
  • 👤 Sadayoshi Matsui

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 01:50
CPC Classifications
H; H01; H01S; H01S5/00; H01S5/20; H01S5/22; H01S5/223; H01S5/2231; H01S5/2054; H01S5/2081; H01S5/209; H01S5/30; H01S5/32; H01S5/323; H01S5/32308; H01S5/32316

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 97 words
A semiconductor laser device comprising a semiconductor substrate and a multi-layered structure disposed on the substrate, said multi-layered structure containing an Al x Ga 1-x As (0<x<1) first cladding layer formed on the substrate, an Al y Ga 1-y As (0<y<1,x>y) active layer for laser oscillation formed on said first cladding layer, an Al x Ga 1-x As (0<x<1) second cladding layer formed on said active layer, and an Al z Ga 1-z As (0<z<1) current blocking layer formed above the second cladding layer, said current blocking layer having a striped groove as a current injection path.
Claim 2
Dependent Claim 97 words
A semiconductor laser device comprising a semiconductor substrate and a multi-layered structure disposed on the substrate, said multi-layered structure containing an Al x Ga 1-x As (0<x<1) first cladding layer formed on the substrate, an Al y Ga 1-y As (0<y<1,x>y) active layer for laser oscillation formed on said first cladding layer, an Al x Ga 1-x As (0<x<1) second cladding layer formed on said active layer, and an Al z Ga 1-z As (0<z<1) current blocking layer formed above the second cladding layer, said current blocking layer having a striped groove as a current injection path.
Claim 3
Dependent Claim 24 words
A semiconductor laser device according to claim 1, wherein said multi-layered structure further contains a GaAs light-absorbing layer formed underneath the current blocking layer.
Claim 4
Dependent Claim 24 words
A semiconductor laser device according to claim 1, wherein the Al mole fraction z in the current blocking layer ranges from 0.05 to 0.40.
Claim 5
Independent Claim 178 words
A method for the production of a semiconductor laser device, comprising the steps of: forming a multi-layered structure on a semiconductor substrate, said multi-layered structure containing in order, an Al x Ga 1-x As (0<x<1) first cladding layer, an Al y Ga 1-y As (0<y<1,x>y) active layer for laser oscillation, an AlGaAs (0<x<1) second cladding layer, a GaAs buffer layer, an Al u Ga 1-u As (0<u<1) etching stopper layer, an Al z Ga 1-z As (0<z<1,z<u) current blocking layer, and a GaAs protective layer; etching the protective layer and the current blocking layer to form a striped groove as a current injection path; removing the exposed portion of the etching stopper layer on the bottom of the striped groove; removing the portion of the buffer layer on the bottom of the striped groove and at least one part of the protective layer by a melt-back technique; and growing an Al x Ga 1-x As (0<x<1) third cladding layer so as to bury the striped groove therein and growing a GaAs contact layer on the third cladding layer.
Claim 6
Independent Claim 178 words
A method for the production of a semiconductor laser device, comprising the steps of: forming a multi-layered structure on a semiconductor substrate, said multi-layered structure containing in order, an Al x Ga 1-x As (0<x<1) first cladding layer, an Al y Ga 1-y As (0<y<1,x>y) active layer for laser oscillation, an AlGaAs (0<x<1) second cladding layer, a GaAs buffer layer, an Al u Ga 1-u As (0<u<1) etching stopper layer, an Al z Ga 1-z As (0<z<1,z<u) current blocking layer, and a GaAs protective layer; etching the protective layer and the current blocking layer to form a striped groove as a current injection path; removing the exposed portion of the etching stopper layer on the bottom of the striped groove; removing the portion of the buffer layer on the bottom of the striped groove and at least one part of the protective layer by a melt-back technique; and growing an Al x Ga 1-x As (0<x<1) third cladding layer so as to bury the striped groove therein and growing a GaAs contact layer on the third cladding layer.
Claim 7
Dependent Claim 48 words
A method for the production of a semiconductor laser device according to claim 4, wherein a GaAs light-absorbing layer is formed between the etching stopper layer and the current blocking layer, and wherein the light-absorbing layer is etched together with the protective layer and the current blocking layer.

References Cited (Backward Citations)

EP0031808A2 Cited
JPS603178A Cited
EP0142845A2 Cited
US4813051A Cited
US4868838A Cited
US4856013A Cited
US4984244A Cited
US5042044A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-05-05 1995-11-04 1996-05-05 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-05-05 1999-11-04 2000-05-05 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-05-05 2003-11-04 2004-05-05 $7700.00 Window Closed / Lapsed

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