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Semiconductor device having a semiconductor region in which a band gap being continuously graded

Assignee: Canon Inc
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Filing: 1989-09-28
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Granted: 1992-03-03
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Expires: 2009-09-28
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Abstract

Abstract An improved semiconductor device such as an improved graded band gap transistor and an improved graded band gap diode, characterized by comprising a non-single-crystal material containing silicon atom, a band gap adjusting atom and a localized level reducing atom and having a region in which a band gap being continuously graded at least one position other than junction position and only one of a conduction band and a valence band being continuously graded. It gives a significant improvement in both the frequency characteristic and the photoresponse.

Inventors

  • 👤 Keishi Saito
  • 👤 Yasushi Fujioka

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 07:42
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/40; H10D62/402; H10D62/80; H10F; H10F30/00; H10F30/20; H10F30/21; H10F30/22; H10F30/222; H10F30/24; H10F30/245; H10F71/00; H10F71/10; H10F71/103; H10F71/1035; H10P; H10P95/00; H10P95/90; H10W; H10W72/00; H10W72/071; H10W72/075; H10W72/07551; H10W72/07554; H10W72/50; H10W72/531; H10W72/536; H10W72/541; H10W72/547; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02P; Y02P70/00; Y02P70/50

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 144 words
A semiconductor device having a transistor comprising: (a) a collector region having a first conductivity type; (b) an emitter region having a first conductivity type; and (c) a base region having a second conductivity type opposite to said first conductivity type; wherein (i) each of said collector and emitter regions comprises a non-single-crystal semiconductor material containing silicon atoms as the main constituent; (ii) said base region comprises a non-single-crystal semiconductor material containing silicon atoms as the main constituent, band gap adjusting atoms and from 1 to 60 atomic % of hydrogen or halogen atoms as localized level reducing atoms; (iii) said base region having a band gap grading region in which a band gap is continuously graded; and (iv) said band gap grading semiconductor region having a conduction band and valence band, wherein only one of said conduction and valence bands is continuously graded.
Claim 2
Dependent Claim 144 words
A semiconductor device having a transistor comprising: (a) a collector region having a first conductivity type; (b) an emitter region having a first conductivity type; and (c) a base region having a second conductivity type opposite to said first conductivity type; wherein (i) each of said collector and emitter regions comprises a non-single-crystal semiconductor material containing silicon atoms as the main constituent; (ii) said base region comprises a non-single-crystal semiconductor material containing silicon atoms as the main constituent, band gap adjusting atoms and from 1 to 60 atomic % of hydrogen or halogen atoms as localized level reducing atoms; (iii) said base region having a band gap grading region in which a band gap is continuously graded; and (iv) said band gap grading semiconductor region having a conduction band and valence band, wherein only one of said conduction and valence bands is continuously graded.
Claim 3
Dependent Claim 146 words
A semiconductor device comprising a band gap grading semiconductor region between a first semiconductor region comprising a non-single-crystal semiconductor material containing silicon atoms as the main constituent, and a second semiconductor region comprising a non-single-crystal semiconductor material containing silicon atoms as the main constituent; said band gap grading semiconductor region forming a junction with said first semiconductor region and with said second semiconductor region; said band gap grading semiconductor region comprising a non-single-crystal semiconductor material containing silicon atoms as the main constituent, band gap adjusting atoms and from 1 to 60 atomic % of hydrogen or halogen atoms as localized level reducing atoms; said band gap grading semiconductor region having a region in which a band gap is continuously graded; and said band gap grading semiconductor region having a conduction band and valence band wherein only one of said conduction and valence bands is continuously graded.
Claim 4
Dependent Claim 146 words
A semiconductor device comprising a band gap grading semiconductor region between a first semiconductor region comprising a non-single-crystal semiconductor material containing silicon atoms as the main constituent, and a second semiconductor region comprising a non-single-crystal semiconductor material containing silicon atoms as the main constituent; said band gap grading semiconductor region forming a junction with said first semiconductor region and with said second semiconductor region; said band gap grading semiconductor region comprising a non-single-crystal semiconductor material containing silicon atoms as the main constituent, band gap adjusting atoms and from 1 to 60 atomic % of hydrogen or halogen atoms as localized level reducing atoms; said band gap grading semiconductor region having a region in which a band gap is continuously graded; and said band gap grading semiconductor region having a conduction band and valence band wherein only one of said conduction and valence bands is continuously graded.

References Cited (Backward Citations)

US4710786A Cited
US4254429A Cited
US4353081A Cited
US4460669A Cited
GB2150751A Cited
EP0178004A1 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-03-03 1995-09-02 1996-03-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-03-03 1999-09-02 2000-03-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-03-03 2003-09-02 2004-03-03 $7700.00 Window Closed / Lapsed

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