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US5084671A Expired / Lapsed US ⏱️ 0.0 years remaining

Electric probing-test machine having a cooling system

Assignee: Tokyo Electron Ltd
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Filing: 1990-04-20
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Granted: 1992-01-28
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Expires: 2010-04-20
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Abstract

Abstract An electric probing-test machine comprises a probe card having a plurality of probes contacted with chips of a semiconductor wafer and serving to apply test signal to a tester which judges whether circuits on the chips of the wafer are correct or deficient, a main chuck for holding the wafer at a test temperature, a system for cooling the main chuck, and a controller for controlling the cooling system. The main chuck includes a chuck top contacted directly with the wafer, a jacket arranged to conduct heat exchange relative to the chuck top, and a temperature sensor for detecting the temperature of the chuck top. The cooling system has a pump for supplying a coolant from a reservoir to the jacket. Responsive to temperature information detected by the temperature sensor, the amount of the coolant supplied from the reservoir to the jacket is controlled by the controller to thereby control the temperature of the chuck top.

Inventors

  • 👤 Eiji Miyata
  • 👤 Masahiko Sugiyama
  • 👤 Masahiko Kohno
  • 👤 Masataka Hatta

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 23:04
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2855; G01R31/286; G01R31/2868; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07314; G01R31/2872; G01R31/2874; G01R31/2875; F; F25; F25B; F25B21/00; F25B21/02; F25B21/04

Claims Analysis

Total Claims: 18
Claim 1
Independent Claim 193 words
An electric probing-test machine comprising: probe means having a plurality of probes contacted with an object and serving to apply test signal to a tester which judges whether circuits on the object are correct or deficient; chuck means, having a chuck top contacted directly with the object, for holding the object; cooling means for cooling the chuck means, and control means for controlling the cooling means wherein said chuck means includes: a heat exchange jacket arranged to conduct heat exchange relative to the chuck top; a cooling plate arranged between said chuck top and said heat exchange jacket; Peltier elements arranged between said chuck top and said heat exchange jacket; temperature detecting means for detecting the temperature of the chuck top; and coolant supply means, being included in said cooling means, for supplying a coolant from a coolant reservoir to the heat exchange jacket; wherein current applied to said Peltier elements and the amount of the coolant supplied from the coolant supply means to the heat exchange jacket is controlled by the control means responsive to temperature information detected by the temperature detecting means to thereby control the temperature of the chuck top.
Claim 2
Dependent Claim 193 words
An electric probing-test machine comprising: probe means having a plurality of probes contacted with an object and serving to apply test signal to a tester which judges whether circuits on the object are correct or deficient; chuck means, having a chuck top contacted directly with the object, for holding the object; cooling means for cooling the chuck means, and control means for controlling the cooling means wherein said chuck means includes: a heat exchange jacket arranged to conduct heat exchange relative to the chuck top; a cooling plate arranged between said chuck top and said heat exchange jacket; Peltier elements arranged between said chuck top and said heat exchange jacket; temperature detecting means for detecting the temperature of the chuck top; and coolant supply means, being included in said cooling means, for supplying a coolant from a coolant reservoir to the heat exchange jacket; wherein current applied to said Peltier elements and the amount of the coolant supplied from the coolant supply means to the heat exchange jacket is controlled by the control means responsive to temperature information detected by the temperature detecting means to thereby control the temperature of the chuck top.
Claim 3
Dependent Claim 71 words
The electric probing-test machine according to claim 1, wherein said coolant supply means includes a first pump for supplying the coolant to the heat exchange jacket and a second pump for discharging the coolant from the heat exchange jacket and wherein the coolant reservoir is common to the first and the second pump and a system is provided to circulate the coolant between the coolant reservoir and the heat exchange jacket.
Claim 4
Dependent Claim 36 words
The electric probing-test machine according to claim 1, wherein a bypass for returning the coolant to the coolant reservoir is arranged between a coolant supply pump of the coolant supply means and the heat exchange jacket.
Claim 5
Dependent Claim 186 words
The electric probing-test machine comprising: probe means having a plurality of probes contacted with an object and serving to apply test signal to a tester which judges whether circuits on the object are correct or deficient; chuck means, having a chuck top contacted directly with the object, for holding the object; cooling means for cooling the chuck means, and control means for controlling the cooling means wherein said chuck means includes; a heat exchange jacket arranged to conduct heat exchange relative to the chuck top; a cooling plate arranged between the chuck top and the heat exchange jacket, the cooling plate having a diameter larger than that of the chuck top; temperature detecting means for detecting the temperature of the chuck top; and cooling supply means included in said cooling means for supplying a coolant from a coolant reservoir to the heat exchange jacket, wherein the amount of the coolant supplied from the coolant supply means to the heat exchange jacket is controlled by the control means responsive to temperature information detected by the temperature detecting means to thereby control the temperature of the chuck top.
Claim 6
Dependent Claim 186 words
The electric probing-test machine comprising: probe means having a plurality of probes contacted with an object and serving to apply test signal to a tester which judges whether circuits on the object are correct or deficient; chuck means, having a chuck top contacted directly with the object, for holding the object; cooling means for cooling the chuck means, and control means for controlling the cooling means wherein said chuck means includes; a heat exchange jacket arranged to conduct heat exchange relative to the chuck top; a cooling plate arranged between the chuck top and the heat exchange jacket, the cooling plate having a diameter larger than that of the chuck top; temperature detecting means for detecting the temperature of the chuck top; and cooling supply means included in said cooling means for supplying a coolant from a coolant reservoir to the heat exchange jacket, wherein the amount of the coolant supplied from the coolant supply means to the heat exchange jacket is controlled by the control means responsive to temperature information detected by the temperature detecting means to thereby control the temperature of the chuck top.
Claim 7
Dependent Claim 44 words
The electric probing-test machine according to claim 1, wherein a cooling plate is arranged between the chuck top and the heat exchange jacket and the cooling plate has such a peripheral portion that covers a part of the peripheral portion of the chuck top.
Claim 8
Dependent Claim 33 words
The electric probing-test machine according to claim 1, wherein a cooling plate is arranged between the top and the heat exchange jacket and the cooling plate is made of copper or copper alloy.
Claim 9
Dependent Claim 26 words
The electric probing-test machine according to claim 1, wherein the passage in the heat exchange jacket through which the coolant flows is a labyrinth flow path.
Claim 10
Dependent Claim 23 words
The electric probing-test machine according to claim 1, wherein a heater is located in the heat exchange jacket remote from the chuck top.
Claim 11
Dependent Claim 26 words
The electric probing-test machine according to claim 1, wherein said temperature detecting means has a second sensor for detecting the temperature of the heat exchange jacket.
Claim 12
Dependent Claim 20 words
The electric probing-test machine according to claim 1, wherein the heat exchange jacket can be detached from the chuck top.
Claim 13
Dependent Claim 38 words
The electric probing-test machine according to claim 1, further comprising enclosing means for enclosing the chuck means together with the object and a means for supplying dry gas into a space which is enclosed by the enclosing means.
Claim 14
Dependent Claim 42 words
The apparatus according to claim 1, wherein said cooling plate has a diameter substantially the same as that of said chuck top, and wherein the cooling plate is formed so that a peripheral portion thereof is thicker than a central portion thereof.
Claim 15
Dependent Claim 24 words
The apparatus according to claim 1, further comprising a supply pump for supplying said coolant from said coolant reservoir to said heat exchange jacket.
Claim 16
Dependent Claim 24 words
The apparatus according to claim 1, further comprising a return pump for returning said coolant from said heat exchange jacket to said coolant reservoir.
Claim 17
Dependent Claim 26 words
The apparatus according to claim 3, wherein a coolant discharge opening of said bypass is positioned above the surface of the liquid in said coolant reservoir.
Claim 18
Dependent Claim 19 words
The apparatus according to claim 1, further comprising a heating coil immersed in the coolant in said coolant reservoir.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-01-27 1995-07-29 1996-01-28 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-01-27 1999-07-29 2000-01-28 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-01-27 2003-07-29 2004-01-28 $7700.00 Window Closed / Lapsed

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