Patent US5081064A successfully refreshed from Google Patents.
US5081064A
Expired / Lapsed
US
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Method of forming electrical contact between interconnection layers located at different layer levels
Assignee: Fujitsu Ltd
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Filing: 1990-06-04
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Granted: 1992-01-14
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Expires: 2010-06-04
Abstract
Abstract A method of forming an electrical contact between interconnection layers located at different layer levels includes the steps of forming a contact hole in an interlayer insulating film, and forming a metallic intermediate layer on an exposed surface portion of a first conductive interconnection layer and the interlayer insulating film. Then, a portion of said metallic intermediate layer exposed through said contact hole and an oxide film formed on said surface portion of the first conductive interconnection layer are eliminated by an etching process. This process is carried out in a vacuum. After that, in the vacuum, a second conductive interconnection layer is formed in said contact hole and formed on said interlayer insulating film so that an electrical contact between said first and second conductive interconnection layers are formed.
Inventors
- 👤 Minoru Inoue
- 👤 Ryuji Iwama
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 23:06
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/032; H10W20/052; H10W20/0523; H10W20/033; H10W20/034; H10W20/047; H10W20/056; H10W20/40; H10W20/41; H10W20/42
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
236 words
A method of forming an electrical contact between interconnection layers located at different layer levels, comprising the steps of: a) forming a first conductive interconnection layer on an insulating film on a semiconductor substrate; b) depositing an interlayer insulating film on said first conductive interconnection layer and said insulating film; c) forming a contact hole in said interlayer insulating film, wherein a surface portion of said first conductive interconnection layer is exposed through said contact hole; d) forming a metallic intermediate layer on said surface portion of the first conductive interconnection layer and said interlayer insulating film, said metallic intermediate layer having a first portion on said first conductive interconnection layer and a second portion on said first interlayer insulating film, wherein said first portion is thinner than said second portion; e) etching said metallic intermediate layer wherein said first portion and an oxide film naturally formed on said surface portion of said first conductive interconnection layer are removed from a bottom of said contact hole and said second portion is left on said interlayer insulating film; and f) forming a second conductive interconnection layer in said contact hole and on said second portion of said metallic intermediate layer wherein an electrical contact between said first and second conductive interconnection layers is formed, wherein said steps of etching said metallic intermediate layer, and forming the second conductive interconnection layer are successively carried out in a vacuum.
Claim 2
Independent Claim
236 words
A method of forming an electrical contact between interconnection layers located at different layer levels, comprising the steps of: a) forming a first conductive interconnection layer on an insulating film on a semiconductor substrate; b) depositing an interlayer insulating film on said first conductive interconnection layer and said insulating film; c) forming a contact hole in said interlayer insulating film, wherein a surface portion of said first conductive interconnection layer is exposed through said contact hole; d) forming a metallic intermediate layer on said surface portion of the first conductive interconnection layer and said interlayer insulating film, said metallic intermediate layer having a first portion on said first conductive interconnection layer and a second portion on said first interlayer insulating film, wherein said first portion is thinner than said second portion; e) etching said metallic intermediate layer wherein said first portion and an oxide film naturally formed on said surface portion of said first conductive interconnection layer are removed from a bottom of said contact hole and said second portion is left on said interlayer insulating film; and f) forming a second conductive interconnection layer in said contact hole and on said second portion of said metallic intermediate layer wherein an electrical contact between said first and second conductive interconnection layers is formed, wherein said steps of etching said metallic intermediate layer, and forming the second conductive interconnection layer are successively carried out in a vacuum.
Claim 3
Dependent Claim
22 words
A method as claimed in claim 1, wherein said metallic intermediate layer comprises a metallic material which is easily bonded to oxygen.
Claim 4
Dependent Claim
14 words
A method as claimed in claim 1, wherein said metallic intermediate layer comprises titanium.
Claim 5
Dependent Claim
14 words
A method as claimed in claim 1, wherein said metallic intermediate layer comprises aluminum.
Claim 6
Dependent Claim
19 words
A method as claimed in claim 1, wherein said metallic intermediate layer comprises an alloy of titanium and aluminum.
Claim 7
Dependent Claim
24 words
A method as claimed in claim 1, wherein said step (d) comprises the step of forming said metallic intermediate layer by a sputtering process.
Claim 8
Dependent Claim
25 words
A method as claimed in claim 1, wherein said step (d) comprises the step of forming said metallic intermediate layer by a vacuum evaporation process.
Claim 9
Dependent Claim
21 words
A method as claimed in claim 1, wherein said etching process used in said step (e) is a sputter etching process.
Claim 10
Dependent Claim
23 words
A method as claimed in claim 1, further comprising the step of heating said semiconductor substrate before said step (e) is carried out.
Claim 11
Dependent Claim
40 words
A method as claimed in claim 8, wherein said sputter etching is carried out by projecting argon ions onto said metallic intermediate layer in a state where an electrical field orienting said argon ions is applied to said semiconductor substrate.
Claim 12
Dependent Claim
18 words
A method as claimed in claim 1, wherein said electrical field is oriented perpendicularly to said semiconductor substrate.
Claim 13
Dependent Claim
20 words
A method as claimed in claim 1, wherein each of said first and second conductive interconnection layers comprises pure aluminum.
Claim 14
Dependent Claim
21 words
A method as claimed in claim 1, wherein each of said first and second conductive interconnection layers comprises aluminum and silicon.
Claim 15
Dependent Claim
21 words
A method as claimed in claim 1, wherein each of said first and second conductive interconnection layers comprises aluminum and copper.
Claim 16
Dependent Claim
22 words
A method as claimed in claim 1, wherein each of said first and second conductive interconnection layers comprises aluminum, titanium and copper.
Claim 17
Dependent Claim
22 words
A method as claimed in claim 1, wherein each of said first and second conductive interconnection layers comprises aluminum, titanium and silicon.
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1995-01-13 | 1995-07-15 | 1996-01-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-01-13 | 1999-07-15 | 2000-01-14 | $3760.00 | Window Closed / Lapsed |
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