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US5079615A Expired / Lapsed US ⏱️ 0.0 years remaining

Capacitor for a semiconductor

Assignee: Semiconductor Energy Laboratory Co Ltd
•
Filing: 1990-08-14
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Granted: 1992-01-07
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Expires: 2010-08-14
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Abstract

Abstract An improved capacitor for a semiconductor memory, and method for depositing material on a substrate is shown. The material to be deposited is energized by irradiation with light in a chamber in which a CVD method is carried out. The energy induced by the irradiation remains in the molecules of the material even after the molecules have lain on the substrate. With the residual energy, the molecules can wander on the substrate even to a hidden surface. Due to this wandering, the deposition can be performed also on the inside of a deep cave.

Inventors

  • 👤 Shunpei Yamazaki
  • 👤 Takashi Inujima

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 18:06
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/60; H10D1/68; C; C23; C23C; C23C16/00; C23C16/04; C23C16/045; C23C16/44; C23C16/48; C23C16/482; H10P; H10P34/00; H10P34/40; H10P34/42

Claims Analysis

Total Claims: 22
Claim 1
Independent Claim 85 words
A capacitor formed in a substrate comprising: a trench formed within a semiconductor substrate and having an opening at a surface of said substrate; an insulating film provided on the inside surface of said trench; and a capacitor extending in said trench, wherein said insulating film intervenes between said inside surface and said capacitor and said trench has an area, when measured with respect to a plane parallel to the surface of said substrate in its inner position, greater than the area of siad opening.
Claim 2
Dependent Claim 85 words
A capacitor formed in a substrate comprising: a trench formed within a semiconductor substrate and having an opening at a surface of said substrate; an insulating film provided on the inside surface of said trench; and a capacitor extending in said trench, wherein said insulating film intervenes between said inside surface and said capacitor and said trench has an area, when measured with respect to a plane parallel to the surface of said substrate in its inner position, greater than the area of siad opening.
Claim 3
Dependent Claim 25 words
The capacitor of claim 1 wherein said capacitor comprises a pair of electrode layers and a dielectric layer disposed between said pair of electrode layers.
Claim 4
Dependent Claim 15 words
The capacitor of claim 2 wherein each of said electrode layers comprises a conducting material.
Claim 5
Dependent Claim 15 words
The capacitor of claim 2 wherein each of said electrode layers comprises a semiconductor material.
Claim 6
Dependent Claim 23 words
The capacitor of claim 2 wherein said electrode layers are a layer comprising a conducting material and a layer comprising a semiconductor material.
Claim 7
Dependent Claim 23 words
The capacitor of claim 2 wherein said dielectric layer comprises a material selected from the group consisting of silicon oxide and silicon nitride.
Claim 8
Dependent Claim 13 words
The capacitor of claim 1 wherein said trench laterally extends at its bottom.
Claim 9
Dependent Claim 44 words
A capacitor formed in a substrate comprising: a trench formed within a semiconductor substrate; an insulating film provided on the inside surface of said trench; and a capacitor extending in said trench, wherein said insulating film intervenes between said inside surface and said capacitor.
Claim 10
Dependent Claim 44 words
A capacitor formed in a substrate comprising: a trench formed within a semiconductor substrate; an insulating film provided on the inside surface of said trench; and a capacitor extending in said trench, wherein said insulating film intervenes between said inside surface and said capacitor.
Claim 11
Dependent Claim 13 words
The capacitor of claim 8 wherein said capacitor further extends outside said trench.
Claim 12
Dependent Claim 25 words
The capacitor of claim 8 wherein said capacitor comprises a pair of electrode layers and a dielectric layer disposed between siad pair of electrode layers.
Claim 13
Dependent Claim 15 words
The capacitor of claim 10 wherein each of said electrode layers comprises a conducting material.
Claim 14
Dependent Claim 15 words
The capacitor of claim 10 wherein each of said electrode layers comprises a semiconductor material.
Claim 15
Dependent Claim 23 words
The capacitor of claim 10 wherein said electrode layers are a layer comprising a conducting material and a layer comprising a semiconductor material.
Claim 16
Dependent Claim 13 words
The capacitor of claim 10 wherein each of said electrode layers comprises silicon.
Claim 17
Dependent Claim 14 words
The capacitor of claim 10 wherein each of said electrode layers comprises titanium silicide.
Claim 18
Dependent Claim 20 words
The capacitor of claim 10 wherein said electrode layers are a layer comprising silicon and a layer comprising titanium silicide.
Claim 19
Dependent Claim 12 words
The capacitor of claim 8 wherein said insulating film comprises silicon oxide.
Claim 20
Dependent Claim 17 words
The capacitor of claim 10 wherein at least one of said electrode layers is doped with phosphorus.
Claim 21
Dependent Claim 17 words
The capacitor of claim 10 wherein at least one of said electrode layers is a polysilicon layer.
Claim 22
Dependent Claim 23 words
The capacitor of claim 10 wherein said dielectric layer comprises a material selected from the group consisting of silicon oxide and silicon nitride.

References Cited (Backward Citations)

US4017885A Cited
US4580331A Cited
US4735821A Cited
US4861622A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-01-06 1995-07-08 1996-01-07 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-01-06 1999-07-08 2000-01-07 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-01-06 2003-07-08 2004-01-07 $7700.00 Window Closed / Lapsed

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