Planarizing silsesquioxane copolymer coating

Claim 2

A process for forming an insulating layer on a substrate, comprising the steps of: applying to said substrate an organic solution, prepared by reacting an aminoalkoxysilane monomer, an arylalkoxysilane or an arylsilazane monomer and water in an organic solvent; and heating said coated substrate at a temperature and for a time as to evaporate said solvent and form a layer of cured ladder-type silsesquioxane copolymer; and wherein said reaction is carried out by employing a mole ratio of arklyalkoxysilane or arylsilazane monomer to aminoalkoxysilane monomer in the range from about 1:3 to about 4:1 and a mole ratio of water/total monomer in the range from about 0.5:1 to about 2:1.

Claim 3

The process of claim 1, wherein said aminoalkoxysilane monomer is an aminotrialkoxysilane represented by the formula: ##STR2## wherein: R 1 is a hydrogen atom; a saturated hydrocarbon residue or an amino-substituted, saturated hydrocarbon residue, having 1 to 5 carbon atoms; a phenyl group or an alkyl-substituted phenyl group or derivatives thereof, the alkyl group having 1 to 5 carbon atoms; R 2 is a saturated hydrocarbon residue having 2 to 6 carbon atoms; and R 3 is a saturated hydrocarbon residue having 1 to 5 carbon atoms; or a mixture thereof.

Claim 4

The process of claim 1, wherein said arylalkoxysilane or arylsilazane monomer is represented by the formula, R 4 -Si-(Y) 3 , wherein R 4 is an unsubstituted or substituted aromatic residue and Y is (OR 5 ) or N(R 6 ) 2 , wherein R 5 is a saturated hydrocarbon residue having 1 to 5 carbon atoms and R 6 is a hydrogen atom or a saturated hydrocarbon residue having 1 to 5 carbon atoms.

Claim 5

The process of claim 1, wherein said solution is allowed to age for a period of at least about 2 hours, before application to said substrate.

Claim 6

The process of claim 1, wherein said reaction is carried out by employing a mole ratio of arylalkoxysilane monomer to aminoalkoxysilane monomer in the range from about 2:3 to about 2.5:1.

Claim 7

The process of claim 1, wherein said coated substate is heated in excess of about 150° C.

Claim 8

The process of claim 1, wherein said reaction is carried out by employing a mole ratio of water/total monomer in the range from about 0.9:1 to about 1.7:1.

Claim 9

The process of claim 1, wherein said solvent is selected from the group consisting of methanol, ethanol and isopropanol.

Claim 10

The process of claim 1, wherein said solution is prepared by first dissolving said arylalkoxysilane or arylsilazane monomer in said solvent, adding water, and then adding said aminoalkoxysilane monomer.

Claim 11

The process of claim 1, wherein said organic solution is prepared by reacting an aminoalkoxysilane monomer, an arylalkoxysilane or arylsilazane monomer, a tetraalkoxysilane monomer and water in a solvent.

Claim 12

The process of claim 10, wherein said tetraalkoxysilane monomer is tetraethoxysilane and is employed in a proportion of up to about 45 percent based on the moles of total monomer.

Claim 13

A process for forming an insulating layer on a substrate of a semiconductor device, comprising the steps of: dissolving an arylalkoxysilane or arylsilazane monomer in a solvent to form a solution of said monomer in said solvent, said arylalkoxysilane or arylsilazane monomer being represented by the formula, R 4 --Si--(Y) 3 , wherein R 4 is an unsubstituted or substituted phenyl group and Y is OR 5 or N(R 6 ) 2 , wherein R 5 is a saturated hydrocarbon residue having 1 to 4 carbon atoms, and R 6 is a hydrogen atom or a saturated hydrocarbon residue having 1 to 4 carbon atoms; adding water to said solution; adding an aminotrialkoxysilane monomer to said solution, said aminotrialkoxysilane monomer being represented by the formula: ##STR3## wherein: R 1 is a hydrogen atom or a saturated hydrocarbon residue or an amino-substituted, saturated hydrocarbon residue, having 2 or 3 carbon atoms; R 2 is a saturated hydrocarbon residue having 3 to 6 carbon atoms; and R 3 is a saturated hydrocarbon residue having 1 to 4 carbon atoms; or a mixture thereof; wherein said mole ratio of arylalkoxysilane or arylsilazane monomer to aminoalkoxysilane monomer ranges from about 1:3 to about 4:1, and said mole ratio of water/total monomer ranges from about 0.5:1 to about 2:1; allowing said solution to age for a period of time which is sufficient to allow condensation reactions to stabilize; coating said substrate with a layer of said aged solution; and heating said coated substrate at a temperature and for a time as to evaporate said solvent and form a layer of cured ladder-type silsesquioxane copolymer.

Claim 14

A process for forming an insulating layer on a substrate of a semiconductor device, comprising the steps of: dissolving an arylalkoxysilane or arylsilazane monomer in a solvent to form a solution of said monomer in said solvent, said arylalkoxysilane or arylsilazane monomer being represented by the formula, R 4 --Si--(Y) 3 , wherein R 4 is an unsubstituted or substituted phenyl group and Y is OR 5 or N(R 6 ) 2 , wherein R 5 is a saturated hydrocarbon residue having 1 to 4 carbon atoms, and R 6 is a hydrogen atom or a saturated hydrocarbon residue having 1 to 4 carbon atoms; adding water to said solution; adding an aminotrialkoxysilane monomer to said solution, said aminotrialkoxysilane monomer being represented by the formula: ##STR3## wherein: R 1 is a hydrogen atom or a saturated hydrocarbon residue or an amino-substituted, saturated hydrocarbon residue, having 2 or 3 carbon atoms; R 2 is a saturated hydrocarbon residue having 3 to 6 carbon atoms; and R 3 is a saturated hydrocarbon residue having 1 to 4 carbon atoms; or a mixture thereof; wherein said mole ratio of arylalkoxysilane or arylsilazane monomer to aminoalkoxysilane monomer ranges from about 1:3 to about 4:1, and said mole ratio of water/total monomer ranges from about 0.5:1 to about 2:1; allowing said solution to age for a period of time which is sufficient to allow condensation reactions to stabilize; coating said substrate with a layer of said aged solution; and heating said coated substrate at a temperature and for a time as to evaporate said solvent and form a layer of cured ladder-type silsesquioxane copolymer.

Claim 15

The process of claim 12, wherein said mole ratio of arylalkoxysilane or arylsilazane monomer to aminoalkoxysilane monomer ranges from about 2:3 to about 2.5:1, and said mole ratio of water/total monomer ranges from about 0.9:1 to about 1.7:1.

Claim 16

The process of claim 13, wherein said aminotrialkoxysilane monomer is selected from the group consisting of γ-aminopropyltrimethoxysilane, γ-aminopropyltriethoxysilane, N-β-(aminoethyl)-γ-aminopropyltrimethoxysilane and N-β-(aminoethyl)-γ-aminopropyltriethoxysilane, and said arylalkoxysilane monomer is phenyltriethoxysilane.

Claim 17

The process of claim 14, wherein tetraethoxysilane is added to said solution and is employed in a proportion of about 20 to about 45 percent based on the moles of total monomer.

Claim 18

The process of claim 15, wherein said solvent is selected from the group consisting of methanol, ethanol and propanol; said solution is allowed to age for a period ranging from about 8 to about 72 hours; and said coated substrate is heated in excess of about 200° C.

Claim 19

An insulating layer prepared according to the process of claim 1.

Claim 20

An insulating layer prepared according to the process of claim 12.

Claim 21

An insulating layer prepared according to the process of claim 16.

Claim 22

A semiconductor device, comprising an insulating layer prepared according to the process of claim 1.

Claim 23

A semiconductor device, comprising an insulating layer prepared according to the process of claim 12.

Claim 24

A semiconductor device, comprising an insulating layer prepared according to the process of claim 16.