Below a minute burn-in

Claim 1

A method for testing electronic components having a normal operating temperature, at a test operating temperature, for reducing infant mortality rates and for providing a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: stabilizing the component at a first temperature different than the normal operating temperature and at a predetermined temperature difference from the test operating temperature; placing the component in a test means for testing the component; measuring a first value of a parameter of the component at the first temperature; based upon the measured first value, calculating an expected second temperature parameter value; calculating a range of the expected second temperature parameter value; ramping the temperature of the component; measuring a second value of the parameter of the component at a second temperature; comparing the measured second temperature parameter value to the expected second temperature parameter value; determining whether the measured second temperature parameter value is within the calculated range of the expected second temperature parameter value.

Claim 2

A method for testing electronic components having a normal operating temperature, at a test operating temperature, for reducing infant mortality rates and for providing a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: stabilizing the component at a first temperature different than the normal operating temperature and at a predetermined temperature difference from the test operating temperature; placing the component in a test means for testing the component; measuring a first value of a parameter of the component at the first temperature; based upon the measured first value, calculating an expected second temperature parameter value; calculating a range of the expected second temperature parameter value; ramping the temperature of the component; measuring a second value of the parameter of the component at a second temperature; comparing the measured second temperature parameter value to the expected second temperature parameter value; determining whether the measured second temperature parameter value is within the calculated range of the expected second temperature parameter value.

Claim 11

A method for testing electronic components having a normal operating input voltage bias, to reduce infant mortality rates and provide for a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: placing the component in a test means for testing the component; biasing the component to a specified set of input voltage levels; measuring a first value of a parameter of the component at a first test operating input bias voltage; based upon the measured first value, calculating an expected second value of the parameter; calculating a range of the expected second parameter value; biasing the component to a second set of input voltage levels; measuring a second parameter of the component; comparing the measured second parameter to the expected second parameter value; determining whether the measured second parameter value is within the predetermined range of the expected second parameter value.

Claim 12

A method for testing electronic components having a normal operating input voltage bias, to reduce infant mortality rates and provide for a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: placing the component in a test means for testing the component; biasing the component to a specified set of input voltage levels; measuring a first value of a parameter of the component at a first test operating input bias voltage; based upon the measured first value, calculating an expected second value of the parameter; calculating a range of the expected second parameter value; biasing the component to a second set of input voltage levels; measuring a second parameter of the component; comparing the measured second parameter to the expected second parameter value; determining whether the measured second parameter value is within the predetermined range of the expected second parameter value.

Claim 14

A method for testing electronic components having a normal operating input voltage bias, to reduce infant mortality rates and provide for a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: placing the component in a test means for testing the component; biasing the component to a specified set of input voltage levels; measuring a first value of a parameter of the component at a first test operating input bias voltage; based upon the measured first value, calculating an expected second value of the parameter; calculating a range of the expected second parameter value; biasing the component to a second set of input voltage levels; measuring a second parameter of the component; comparing the measured second parameter to the expected second parameter value; determining whether the measured second parameter value is within the predetermined range of the expected second parameter value; comparing the first measured value to a first set of go/no go limits established by historical data and by comparing the second measured value to a second set of go/no go limits established by historical data; wherein the test parameter being measured comprises an A.C. parametric and A.C. functional measurement.

Claim 15

A method for testing electronic components having a normal operating input voltage bias, to reduce infant mortality rates and provide for a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: placing the component in a test means for testing the component; biasing the component to a specified set of input voltage levels; measuring a first value of a parameter of the component at a first test operating input bias voltage; based upon the measured first value, calculating an expected second value of the parameter; calculating a range of the expected second parameter value; biasing the component to a second set of input voltage levels; measuring a second parameter of the component; comparing the measured second parameter to the expected second parameter value; determining whether the measured second parameter value is within the predetermined range of the expected second parameter value; comparing the first measured value to a first set of go/no go limits established by historical data and by comparing the second measured value to a second set of go/no go limits established by historical data; wherein the test parameter being measured comprises an A.C. parametric and A.C. functional measurement.

Claim 16

A method for testing electronic components having a normal operating input voltage bias, to reduce infant mortality rates and provide for a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: placing the component in a test means for testing the component; biasing the component to a specified set of input voltage levels; measuring a first value of a parameter of the component at a first test operating input bias voltage; based upon the measured first value, calculating an expected second value of the parameter; calculating a range of the expected second parameter value; biasing the component to a second set of input voltage levels; measuring a second parameter of the component; comparing the measured second parameter to the expected second parameter value; determining whether the measured second parameter value is within the predetermined range of the expected second parameter value; comparing the first measured value to a first set of go/no go limits established by historical data and by comparing the second measured value to a second set of go/no go limits established by historical data; wherein before the step of measuring the first measurement, the step of applying a high frequency to an input of the component; also, the test parameter being measured comprises a high frequency parameter.

Claim 17

A method for testing electronic components having a normal operating input voltage bias, to reduce infant mortality rates and provide for a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: placing the component in a test means for testing the component; biasing the component to a specified set of input voltage levels; measuring a first value of a parameter of the component at a first test operating input bias voltage; based upon the measured first value, calculating an expected second value of the parameter; calculating a range of the expected second parameter value; biasing the component to a second set of input voltage levels; measuring a second parameter of the component; comparing the measured second parameter to the expected second parameter value; determining whether the measured second parameter value is within the predetermined range of the expected second parameter value; comparing the first measured value to a first set of go/no go limits established by historical data and by comparing the second measured value to a second set of go/no go limits established by historical data; wherein before the step of measuring the first measurement, the step of applying a high frequency to an input of the component; also, the test parameter being measured comprises a high frequency parameter.

Claim 19

A method for testing electronic components having a normal operating input voltage bias, to reduce infant mortality rates and provide for a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: placing the component in a test means for testing the component; biasing the component to a specified set of input voltage levels; measuring a first value of a parameter of the component at a first test operating input bias voltage; based upon the measured first value, calculating an expected second value of the parameter; calculating a range of the expected second parameter value; biasing the component to a second set of input voltage levels; measuring a second parameter of the component; comparing the measured second parameter to the expected second parameter value; determining whether the measured second parameter value is within the predetermined range of the expected second parameter value; wherein a third value of the parameter is measured at a third set of input voltage levels and compared to an expected third value having a different range for comparison; wherein the range is a statistical error calculated from the first value having a first uncertainty associated therewith and the second value having a second uncertainty associated therewith.

Claim 20

A method for testing electronic components having a normal operating input voltage bias, to reduce infant mortality rates and provide for a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: placing the component in a test means for testing the component; biasing the component to a specified set of input voltage levels; measuring a first value of a parameter of the component at a first test operating input bias voltage; based upon the measured first value, calculating an expected second value of the parameter; calculating a range of the expected second parameter value; biasing the component to a second set of input voltage levels; measuring a second parameter of the component; comparing the measured second parameter to the expected second parameter value; determining whether the measured second parameter value is within the predetermined range of the expected second parameter value; wherein a third value of the parameter is measured at a third set of input voltage levels and compared to an expected third value having a different range for comparison; wherein the range is a statistical error calculated from the first value having a first uncertainty associated therewith and the second value having a second uncertainty associated therewith.

Claim 21

A method for testing electronic components having a normal operating input voltage bias, to reduce infant mortality rates and provide for a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: placing the component in a test means for testing the component; biasing the component to a specified set of input voltage levels; measuring a first value of a parameter of the component at a first test operating input bias voltage; based upon the measured first value, calculating an expected second value of the parameter; calculating a range of the expected second parameter value; biasing the component to a second set of input voltage levels; measuring a second parameter of the component; comparing the measured second parameter to the expected second parameter value; determining whether the measured second parameter value is within the predetermined range of the expected second parameter value; wherein the range is a statistical error calculated from the first value having a first uncertainty associated therewith and the second value having a second uncertainty associated therewith.

Claim 22

A method for testing electronic components having a normal operating input voltage bias, to reduce infant mortality rates and provide for a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: placing the component in a test means for testing the component; biasing the component to a specified set of input voltage levels; measuring a first value of a parameter of the component at a first test operating input bias voltage; based upon the measured first value, calculating an expected second value of the parameter; calculating a range of the expected second parameter value; biasing the component to a second set of input voltage levels; measuring a second parameter of the component; comparing the measured second parameter to the expected second parameter value; determining whether the measured second parameter value is within the predetermined range of the expected second parameter value; wherein the range is a statistical error calculated from the first value having a first uncertainty associated therewith and the second value having a second uncertainty associated therewith.

Claim 23

A method for testing electronic components having a normal operating input voltage bias, to reduce infant mortality rates and provide for a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: placing the component in a test means for testing the component; biasing the component to a specified set of input voltage levels; measuring a first value of a parameter of the component at a first test operating input bias voltage; based upon the measured first value, calculating an expected second value of the parameter; calculating a range of the expected second parameter value; biasing the component to a second set of input voltage levels; measuring a second parameter of the component; comparing the measured second parameter to the expected second parameter value; determining whether the measured second parameter value is within the predetermined range of the expected second parameter value; wherein the parameter of the component is a high frequency parameter and before each measuring step the method comprises the step of supplying a high frequency input signal to the component.

Claim 24

A method for testing electronic components having a normal operating input voltage bias, to reduce infant mortality rates and provide for a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: placing the component in a test means for testing the component; biasing the component to a specified set of input voltage levels; measuring a first value of a parameter of the component at a first test operating input bias voltage; based upon the measured first value, calculating an expected second value of the parameter; calculating a range of the expected second parameter value; biasing the component to a second set of input voltage levels; measuring a second parameter of the component; comparing the measured second parameter to the expected second parameter value; determining whether the measured second parameter value is within the predetermined range of the expected second parameter value; wherein the parameter of the component is a high frequency parameter and before each measuring step the method comprises the step of supplying a high frequency input signal to the component.

Claim 25

A method for testing electronic components having a normal operating input voltage bias, to reduce infant mortality rates and provide for a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: placing the component in a test means for testing the component; biasing the component to a specified set of input voltage levels; measuring a first value of a parameter of the component at a first test operating input bias voltage; based upon the measured first value, calculating an expected second value of the parameter; calculating a range of the expected second parameter value; biasing the component to a second set of input voltage levels; measuring a second parameter of the component; comparing the measured second parameter to the expected second parameter value; determining whether the measured second parameter value is within the predetermined range of the expected second parameter value; wherein the parameter of the component is an A.C. parameter and before each measuring step, the method comprises the step of supplying an A.C. input signal to the component.

Claim 26

A method for testing electronic components having a normal operating input voltage bias, to reduce infant mortality rates and provide for a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: placing the component in a test means for testing the component; biasing the component to a specified set of input voltage levels; measuring a first value of a parameter of the component at a first test operating input bias voltage; based upon the measured first value, calculating an expected second value of the parameter; calculating a range of the expected second parameter value; biasing the component to a second set of input voltage levels; measuring a second parameter of the component; comparing the measured second parameter to the expected second parameter value; determining whether the measured second parameter value is within the predetermined range of the expected second parameter value; wherein the parameter of the component is an A.C. parameter and before each measuring step, the method comprises the step of supplying an A.C. input signal to the component.

Claim 27

A method for burn-in of electronic components having a nominal operating temperature, the method allowing consolidation of package test, burn-in, and post burn-in test, the method eliminating lengthy burn-in batch processing, the method comprising the steps of: stabilizing the component at a first temperature different than the nominal operating temperature and at a predetermined temperature difference from the test operating temperature; placing the component in a test means for high frequency parametric testing of the component; measuring a first value of a parameter of the component at the first temperature; ramping the temperature of the component; measuring a second value of the parameter of the component at a second temperature; comparing the first value to the second value.

Claim 28

A method for burn-in of electronic components having a nominal operating temperature, the method allowing consolidation of package test, burn-in, and post burn-in test, the method eliminating lengthy burn-in batch processing, the method comprising the steps of: stabilizing the component at a first temperature different than the nominal operating temperature and at a predetermined temperature difference from the test operating temperature; placing the component in a test means for high frequency parametric testing of the component; measuring a first value of a parameter of the component at the first temperature; ramping the temperature of the component; measuring a second value of the parameter of the component at a second temperature; comparing the first value to the second value.

Claim 32

A method for testing electronic components, having a die and a package, having a normal operating temperature, at a test operating temperature, for reducing infant mortality rates and for providing a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: a. stabilizing the component at a first temperature below the absolute normal operating temperature and at a predetermined temperature difference from the test operating temperature; b. placing the component in a test means for testing component; c. biasing the component to a specified set of input voltage levels d. measuring a first value of a parameter of the component at the first temperature; e. calculating an expected second temperature parameter value; f. calculating a range of the expected second temperature parameter value; g. ramping the temperature of the component to a larger absolute temperature; h. biasing the component to a second set of input voltage levels i. measuring a second value of the parameter of the component at a second temperature; j. comparing the first value to the second value; k. determining whether measured first parameter value is within a predetermined range of the expected second temperature parameter value: l. repeating steps c-k a plurality of times until the die temperature and the package temperature are within a predetermined thermal time constant of a predetermined test operating temperature; m. waiting a predetermined time period; n. repeating steps c-m a plurality of times until a predetermined final above normal test operating temperature is reached in step 1 for the predetermined test operating temperature.

Claim 33

A method for testing electronic components, having a die and a package, having a normal operating temperature, at a test operating temperature, for reducing infant mortality rates and for providing a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: a. stabilizing the component at a first temperature below the absolute normal operating temperature and at a predetermined temperature difference from the test operating temperature; b. placing the component in a test means for testing component; c. biasing the component to a specified set of input voltage levels d. measuring a first value of a parameter of the component at the first temperature; e. calculating an expected second temperature parameter value; f. calculating a range of the expected second temperature parameter value; g. ramping the temperature of the component to a larger absolute temperature; h. biasing the component to a second set of input voltage levels i. measuring a second value of the parameter of the component at a second temperature; j. comparing the first value to the second value; k. determining whether measured first parameter value is within a predetermined range of the expected second temperature parameter value: l. repeating steps c-k a plurality of times until the die temperature and the package temperature are within a predetermined thermal time constant of a predetermined test operating temperature; m. waiting a predetermined time period; n. repeating steps c-m a plurality of times until a predetermined final above normal test operating temperature is reached in step 1 for the predetermined test operating temperature.

Claim 38

A method for testing an electronic component in wafer form, the wafer having a plurality of components called die, having a normal operating temperature, at a test operating temperature, for reducing infant mortality rates and for providing a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: a. stabilizing the component at a first temperature below the absolute normal operating temperature and at a predetermined temperature difference from the test operating temperature; b. placing the component in a test means for testing component; c. biasing the component to a specified set of input voltage levels d. measuring a first value of a parameter of the component at the first temperature; e. calculating an expected second temperature parameter value; f. calculating a range of the expected second temperature parameter value; g. ramping the temperature of the component to a larger absolute temperature; h. biasing the component to a second set of input voltage levels i. measuring a second value of the parameter of the component at a second temperature; j. comparing the first value to the second value; k. determining whether measured first parameter value is within a predetermined range of the expected second temperature parameter value: l. repeating steps c-k a plurality of times until the die temperature is within a predetermined thermal time constant of a predetermined test operating temperature; m. waiting a predetermined time period; n. repeating steps c-m a plurality of times until a predetermined final above normal test operating temperature is reached in step l for the predetermined test operating temperature.

Claim 39

A method for testing an electronic component in wafer form, the wafer having a plurality of components called die, having a normal operating temperature, at a test operating temperature, for reducing infant mortality rates and for providing a cost effective timely procedure to sort out bad components and pass good components, the method comprising the steps of: a. stabilizing the component at a first temperature below the absolute normal operating temperature and at a predetermined temperature difference from the test operating temperature; b. placing the component in a test means for testing component; c. biasing the component to a specified set of input voltage levels d. measuring a first value of a parameter of the component at the first temperature; e. calculating an expected second temperature parameter value; f. calculating a range of the expected second temperature parameter value; g. ramping the temperature of the component to a larger absolute temperature; h. biasing the component to a second set of input voltage levels i. measuring a second value of the parameter of the component at a second temperature; j. comparing the first value to the second value; k. determining whether measured first parameter value is within a predetermined range of the expected second temperature parameter value: l. repeating steps c-k a plurality of times until the die temperature is within a predetermined thermal time constant of a predetermined test operating temperature; m. waiting a predetermined time period; n. repeating steps c-m a plurality of times until a predetermined final above normal test operating temperature is reached in step l for the predetermined test operating temperature.