← Back to Patent Explorer
US5023164A Expired / Lapsed US ⏱️ 0.0 years remaining

Highly sensitive dry developable deep UV photoresist

Assignee: International Business Machines Corp
•
Filing: 1989-10-23
•
Granted: 1991-06-11
•
Expires: 2009-10-23
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract Highly sensitive, highly absorbing deep ultraviolet and vacuum ultraviolet resists which comprise a novolak resin protected with an acid labile group and a photoinitiator which generates a strong acid upon exposure to deep ultraviolet or vacuum ultraviolet radiation. The exposed resists are reacted with organometallic compounds to form reactive ion etch resistant patterns.

Inventors

  • 👤 William R. Brunsvold
  • 👤 Philip Chiu
  • 👤 Willard E. Conley, Jr.
  • 👤 Dale M. Crockatt
  • 👤 Melvin W. Montgomery
  • 👤 Wayne M. Moreau

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 21:43
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/004; G03F7/039

Claims Analysis

Total Claims: 17
Claim 1
Independent Claim 85 words
A dry developable photoresist composition which comprises a phenol-aldehyde type condensation product, wherein at least 90% of the hydroxyl groups of which are substituted with acid labile groups which inhibit the reaction of the protected reaction product with organometallic reagents and a photoactive compound which generates a strong acid upon exposure to deep UV radiation or vacuum UV radiation to remove the acid labile groups from the condensation product in its exposed regions to enable reaction of the de-protected hydroxy groups with the organometallic reagents.
Claim 2
Dependent Claim 85 words
A dry developable photoresist composition which comprises a phenol-aldehyde type condensation product, wherein at least 90% of the hydroxyl groups of which are substituted with acid labile groups which inhibit the reaction of the protected reaction product with organometallic reagents and a photoactive compound which generates a strong acid upon exposure to deep UV radiation or vacuum UV radiation to remove the acid labile groups from the condensation product in its exposed regions to enable reaction of the de-protected hydroxy groups with the organometallic reagents.
Claim 3
Dependent Claim 84 words
The photoresist composition of claim 1 wherein the phenol aldehyde type condensation product may be represented by the general formula ##STR4## where R is selected from the group consisting of H, --CH 3 and phenyl R' is selected from the group consisting of H, alkyl and aryl, and R" is selected from the group consisting of H, halo, nitro, alkoxy, alkyl, aryl, and hydroxyl, and where the aromatic ring may have fused thereto an additional ring structure to form a napthhol or anthracene unit.
Claim 4
Dependent Claim 25 words
The photoresist composition of claim 2 wherein the phenol aldehyde type condensation product is selected from the group consisting of meta-cresol novolak and naphthol novolak.
Claim 5
Dependent Claim 49 words
The photoresist composition of claim 1 wherein the acid labile protecting group forms a secondary or tertiary carbonium ion upon reaction with acid having an available alpha proton and is degradable to form an olefin and an hydronium ion to continue the acid hydrolysis in the region of exposure.
Claim 6
Dependent Claim 36 words
The photoresist composition of claim 1 wherein the photoactive compound is selected from the group consisting of metallic and nonmetallic onium salts, tosylates and non-metallic sulfonic acid precursors which generate strong acids upon exposure to radiation.
Claim 7
Dependent Claim 25 words
The photoresist composition of claim 5 wherein the metallic onium salt is selected from the group consisting of diaryliodonium salts, arylsulfonium salts, and arylselenonium salts.
Claim 8
Dependent Claim 21 words
The photoresist composition of claim 1 wherein at least 95% of the hydroxyl groups are substituted with said acid labile groups.
Claim 9
Dependent Claim 21 words
The photoresist composition of claim 1 wherein at least 98% of the hydroxyl groups are substituted with said acid liabile groups.
Claim 10
Dependent Claim 32 words
The photoresist composition of claim 1 which is dissolved in a solvent selected from the group consisting of xylene, alphyl acetate, propylene glycol alkyl ether acetate, and ethyl lactate, and mixtures thereof.
Claim 11
Dependent Claim 15 words
The photoresist composition of claim 9 wherein the solvent is propylene glycol methyl ether acetate.
Claim 12
Dependent Claim 45 words
The photoresist composition of claim 9 wherein the protected phenol-aldehyde condensation product is present in an amount from 15-40% by weight of the composition, and the photoactive compound is present in an amount from 1 to 40% by weight of the protected phenol-aldehyde condensation product.
Claim 13
Dependent Claim 20 words
The photoresist composition of claim 1 wherein the protected phenol-aldehyde condensation product is a t-butylcarbonate of a m-cresol novolak resin.
Claim 14
Dependent Claim 133 words
A dry developable photoresist composition which comprises a phenol-aldehyde type condensation product, wherein at least 90% of the hydroxyl groups of which are substituted with acid labile groups selected from the group consisting of t-butyloxycarbonyl, 2-propyloxycarbonyl, t-butyl ether, and t-butylcarbonyl which inhibit the reaction of the protected reaction product with organometallic reagents which upon reaction with acid forms a secondary or tertiary carbonium ion having an available alpha proton and which is degradable to form an olefin and an hydronium ion to continue acid hydrolysis in exposed regions and a photoactive compound which generates a strong acid upon exposure to deep UV radiation or vacuum UV radiation to remove the acid labile groups from the condensation product in its exposed regions to enable reaction of the de-protected hydroxy groups with the organometalic reagents.
Claim 15
Dependent Claim 133 words
A dry developable photoresist composition which comprises a phenol-aldehyde type condensation product, wherein at least 90% of the hydroxyl groups of which are substituted with acid labile groups selected from the group consisting of t-butyloxycarbonyl, 2-propyloxycarbonyl, t-butyl ether, and t-butylcarbonyl which inhibit the reaction of the protected reaction product with organometallic reagents which upon reaction with acid forms a secondary or tertiary carbonium ion having an available alpha proton and which is degradable to form an olefin and an hydronium ion to continue acid hydrolysis in exposed regions and a photoactive compound which generates a strong acid upon exposure to deep UV radiation or vacuum UV radiation to remove the acid labile groups from the condensation product in its exposed regions to enable reaction of the de-protected hydroxy groups with the organometalic reagents.
Claim 16
Dependent Claim 191 words
A dry developable photoresist composition which comprises a phenol-aldehyde type condensation product, wherein at least 90% of the hydroxyl groups of which are substituted with acid labile groups which inhibit the reaction of the protected reaction product with organometallic reagents and a photoactive compound which comprises a non-metallic sulfonic acid precursor of the form ##STR5## wherein Q is selected from the group consisting of --CF 3 , --CF 2 CF 3 , --CF 2 CF 2 H, --(CF 2 ) n --Z where n=1 to 4 and Z is H, alkyl, aryl, ##STR6## where m=1 to 5, where X and Y (1) form a cylcic or polycyclic ring which may contain one or more hetero-atoms, (2) form a fused aromatic ring, (3) may be independently H, alkyl or aryl, (4) may be attached to another sulfonyloxyimido-containing residue, or (5) may be attached to a polymeric chain or backbone said photoactive compound generates a strong acid upon exposure to deep UV radiation or vacuum UV radiation to remove the acid labile groups from the condensation product in its exposed regions to enable reaction of the de-protected hydroxy groups with the organometallic reagents.
Claim 17
Dependent Claim 191 words
A dry developable photoresist composition which comprises a phenol-aldehyde type condensation product, wherein at least 90% of the hydroxyl groups of which are substituted with acid labile groups which inhibit the reaction of the protected reaction product with organometallic reagents and a photoactive compound which comprises a non-metallic sulfonic acid precursor of the form ##STR5## wherein Q is selected from the group consisting of --CF 3 , --CF 2 CF 3 , --CF 2 CF 2 H, --(CF 2 ) n --Z where n=1 to 4 and Z is H, alkyl, aryl, ##STR6## where m=1 to 5, where X and Y (1) form a cylcic or polycyclic ring which may contain one or more hetero-atoms, (2) form a fused aromatic ring, (3) may be independently H, alkyl or aryl, (4) may be attached to another sulfonyloxyimido-containing residue, or (5) may be attached to a polymeric chain or backbone said photoactive compound generates a strong acid upon exposure to deep UV radiation or vacuum UV radiation to remove the acid labile groups from the condensation product in its exposed regions to enable reaction of the de-protected hydroxy groups with the organometallic reagents.

References Cited (Backward Citations)

US4404272A Cited
US4500628A Cited
US4491628A Cited
US4564575A Cited
US4552838A Cited
US4810601A Cited
US4708925A Cited
US4681923A Cited
US4980264A Cited
US4939070A Cited
US4931379A Cited
US4810613A Cited
US4837121A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-06-10 1994-12-10 1995-06-11 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-06-10 1998-12-10 1999-06-11 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-06-10 2002-12-10 2003-06-11 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag