Abstract A method for curing spin-on-glass formed on a wafer film which insulates the metal layers and flattens any step difference in the process for manufacturing a multi-layered metal layer of a highly integrated semiconductor device which comprises establishing a predetermined initial temperature in a heating chamber with an ultraviolet light source. A wafer, on which a SOG film to be cured is formed, is then introdued into the heated chamber and the temperature gradually increased to a predetermined maximum temperature. The SOG film is irradiated with ultraviolet light at a predetermined wavelength simultaneously with the application of heat at the maximum temperature for a predetermined time. The wafer is then cooled.
A method for curing SOG a spin-on-glass formed on a wafer film which is formed in order to insulate the metal layers from each other and to flatten the step difference in the process for manufacturing a multilayered metal layer of a highly integrated semiconductor device comprising: establishing in a heating chamber which includes an ultraviolet light source a predetermined initial temperature; introducing a wafer, on which a SOG film to be cured is formed, into the heated chamber and increasing the temperature gradually to a predetermined maximum temperature; irradiating the SOG film with ultraviolet light at a predetermined wavelength while maintaining the maximum temperature for a predetermined time; and cooling the wafer.
Claim 2
Independent Claim
113 words
A method for curing SOG a spin-on-glass formed on a wafer film which is formed in order to insulate the metal layers from each other and to flatten the step difference in the process for manufacturing a multilayered metal layer of a highly integrated semiconductor device comprising: establishing in a heating chamber which includes an ultraviolet light source a predetermined initial temperature; introducing a wafer, on which a SOG film to be cured is formed, into the heated chamber and increasing the temperature gradually to a predetermined maximum temperature; irradiating the SOG film with ultraviolet light at a predetermined wavelength while maintaining the maximum temperature for a predetermined time; and cooling the wafer.
Claim 3
Dependent Claim
18 words
The method of claim 1 wherein the predetermined maximum temperature in the chamber is set to 200° C.
Claim 4
Dependent Claim
35 words
The method of claim 1 wherein the predetermined initial temperature is gradually increased to the predetermined maximum temperature by gradually increasing the temperature from 200° C., to 240° C. over a period of 30 seconds.
Claim 5
Dependent Claim
27 words
The method of claim 1 wherein the predetermined maximum temperature is 240° C., the predetermined duration of time is 120 seconds and the predetermined wavelength is 300nm.
Claim 6
Dependent Claim
20 words
The method of claim 1 wherein the wafer is cooled in the chamber to a final temperature of 130° C.
Claim 7
Independent Claim
144 words
A method for curing SOG a spin-on-glass formed on a wafer film which is formed in order to insulate the metal layers from each other and to flatten the step difference in the process for manufacturing a multi-layered metal layer of a highly integrated semiconductor device comprising: establishing in a heating chamber which includes an ultraviolet light source a predetermined initial temperature of 200° C.; introducing a wafer, on which a SOG film to be cured is formed, into the heated chamber and increasing the temperature gradually over a period of 30 seconds to a predetermined maximum temperature of 240° C.; irradiating the SOG film with ultraviolet light at a predetermined wavelength of 300 nm while maintaining the maximum temperature at 240° C. for a predetermined time of 120 seconds; and cooling the wafer to a final temperature in the chamber of 130° C.
Claim 8
Independent Claim
144 words
A method for curing SOG a spin-on-glass formed on a wafer film which is formed in order to insulate the metal layers from each other and to flatten the step difference in the process for manufacturing a multi-layered metal layer of a highly integrated semiconductor device comprising: establishing in a heating chamber which includes an ultraviolet light source a predetermined initial temperature of 200° C.; introducing a wafer, on which a SOG film to be cured is formed, into the heated chamber and increasing the temperature gradually over a period of 30 seconds to a predetermined maximum temperature of 240° C.; irradiating the SOG film with ultraviolet light at a predetermined wavelength of 300 nm while maintaining the maximum temperature at 240° C. for a predetermined time of 120 seconds; and cooling the wafer to a final temperature in the chamber of 130° C.