Semiconductor memory device with error check and correcting function

Claim 2

A semiconductor memory device having a function for checking and correcting bit errors, comprising: storing means for storing information of a plurality of bits, error check and correcting means for checking and correcting bit errors of the information stored in said storing means, said error check and correcting means generating a predetermined count signal every time it corrects a bit error, counting means for counting said predetermined count signal generated from said error check and correcting means and output means for selectively outputting the information read out from said storing means and the number counted by said counting means.

Claim 3

The semiconductor memory device according to claim 1, wherein said output means is responsive to a read command signal externally applied for outputting information indicating the counted number.

Claim 4

The semiconductor memory device according to claim 2, wherein said storing means, said error check and correcting means and said counting means are formed on the same semiconductor substrate.

Claim 5

The semiconductor memory device according to claim 1, wherein said counting means is responsive to a counting starting signal externally applied for starting a counting operation after the information indicating the counted number previously stored is erased and outputting the information indicating the counted number after the information stored in said storing means is read out.

Claim 6

The semiconductor memory device according to claim 4, wherein said counting starting signal has a potential of a higher level than an ordinary logical level.

Claim 7

The semiconductor memory device according to claim 4, wherein said storing means, said error check and correcting means and said counting means are formed on the same semiconductor substrate.

Claim 8

The semiconductor memory device according to claim 1, wherein said storing means, said error check and correcting means and said counting means are formed on the same semiconductor substrate.

Claim 9

The semiconductor memory device according to claim 1, wherein said storing means comprises a plurality of memory cells each storing information.

Claim 10

The semiconductor memory device according to claim 8, wherein each of said plurality of memory cells comprises an electrically erasable and programmable read-only memory.

Claim 11

A semiconductor memory device having a function for checking and correcting bit errors, comprising: a memory cell array comprising a plurality of memory cells arranged in a plurality of rows and columns, first selecting means for selecting any of rows in said memory cell array, second selecting means for selecting any of columns in said memory cell array, writing means for writing data to the memory cell selected by said first and second selecting means, reading means for reading out data stored in the memory cell selected by said first and second selecting means, error check and correcting means for checking and correcting bit errors included in data stored in the memory cell selected by said first and second selecting means, said error check and correcting means generating a predetermined count signal every time it corrects a bit error, counting means for counting said predetermined count signal generated from said error check and correcting means and output means for selectively outputting the information read out from said storing means and the number counted by said counting means.

Claim 12

A semiconductor memory device having a function for checking and correcting bit errors, comprising: a memory cell array comprising a plurality of memory cells arranged in a plurality of rows and columns, first selecting means for selecting any of rows in said memory cell array, second selecting means for selecting any of columns in said memory cell array, writing means for writing data to the memory cell selected by said first and second selecting means, reading means for reading out data stored in the memory cell selected by said first and second selecting means, error check and correcting means for checking and correcting bit errors included in data stored in the memory cell selected by said first and second selecting means, said error check and correcting means generating a predetermined count signal every time it corrects a bit error, counting means for counting said predetermined count signal generated from said error check and correcting means and output means for selectively outputting the information read out from said storing means and the number counted by said counting means.

Claim 13

The semiconductor memory device according to claim 10, wherein said memory cell array comprises a data region for storing data bits and a check bit region for storing check bits, said error check and correcting means comprises check bit generating means for generating check bits based on data bits stored in said data bit region in said memory cell array and applying the same to said check bit region, and check and correcting means responsive to said check bits stored in said check bit region in said memory cell array for checking and correcting bit errors of said corresponding data bits.

Claim 14

The semiconductor memory device according to claim 11, wherein said counting means is responsive to a counting starting signal externally applied for starting a counting operation after the information indicating the counted number previously stored is erased and outputting the information indicating the counted number after the information stored in said storing means is read out.

Claim 15

The semiconductor memory device according to claim 10, wherein each of said plurality of memory cells comprises an electrically erasable and programmable read-only memory.

Claim 18

A semiconductor memory device having a function for checking and correcting bit errors, comprising: storing means for storing information of a plurality of bits, error check and correcting means for checking and correcting bit errors of the information stored in said storing means, said error check and correcting means generating a predetermined count signal every time it corrects a bit error, and counting mans for counting said predetermined count signal generated from said error check and correcting means, wherein said counting means is responsive to a counting starting signal externally applied for starting a counting operation after the information indicating the counted number of previously stored is erased and outputting the information indicating the counted number after the information stored in said storing means is read out.

Claim 19

A semiconductor memory device having a function for checking and correcting bit errors, comprising: storing means for storing information of a plurality of bits, error check and correcting means for checking and correcting bit errors of the information stored in said storing means, said error check and correcting means generating a predetermined count signal every time it corrects a bit error, and counting mans for counting said predetermined count signal generated from said error check and correcting means, wherein said counting means is responsive to a counting starting signal externally applied for starting a counting operation after the information indicating the counted number of previously stored is erased and outputting the information indicating the counted number after the information stored in said storing means is read out.