Data path chip test architecture

Claim 2

In a clocked integrated circuit implemented on a semiconductor chip, and having a control register, a multiple input linear feedback shift register, a plurality of test points located at predetermined nodes in said circuit, a plurality of memory registers, and further having a common load/test circuit implemented on the semiconductor chip, a method of testing the integrated circuit using the common load/test circuit to provide a resultant test signature indicative of the values at said nodes, comprising the steps of: a. specifying in the control register the set of test points to be tested; b. loading test data into at least one of the memory registers by way of the common load/test circuit; c. commencing testing of the test points during a test period, the test period having defined subperiods in which the test is not performed, the test period defined by several of the integrated circuit clock cycles; d. sampling the set of test points during each clock cycle to provide a set of test data; e. entering said test data into the multiple input linear feedback shift register; and f. at the conclusion of the test period, shifting the resulting test data out of the shift register thereby to provide said signature; wherein the semiconductor chip comprises a data path logic unit in a video graphics system and wherein the testing of step is performed during video monitor refresh and wherein the step of shifting the resulting test data of step is performed during video monitor vertical retrace.

Claim 3

The method of claim 1 further comprising the step of masking selected test points which a test is not desired.

Claim 4

The method of claim 1 wherein the integrated circuit has input terminals connected to the common load/test circuit, and wherein the step of testing includes the step of applying data to said input terminals and the step of reading signal values at said nodes.

Claim 5

In a clocked integrated circuit implemented on a semiconductor chip and having a control register, a multiple input linear feedback shift register, a plurality of test points located at predetermined nodes in said circuit, a plurality of memory registers, and further having a common load/test circuit implemented on the semiconductor chip, a method of testing the integrated circuit using the common load/test circuit to provide a resultant test signature indicative of the values at said nodes, comprising the steps of: a. specifying in the control register the set of test points to be tested; b. loading at least one of the memory registers with test data by way of the common load/test circuit; c. commencing testing of the test points during a test period, the test period having defined subperiods in which the test is not performed, the test period defined by several of the integrated circuit clock cycles; d. sampling the set of test points during each clock cycle to provide a set of test data; e. entering said test data into the multiple input linear feedback shift register; and f. at the conclusions of the test period, comparing the resulting signature to a prestored, dynamically-variable expected signature value providing a pass/fail result.

Claim 6

In a clocked integrated circuit implemented on a semiconductor chip and having a control register, a multiple input linear feedback shift register, a plurality of test points located at predetermined nodes in said circuit, a plurality of memory registers, and further having a common load/test circuit implemented on the semiconductor chip, a method of testing the integrated circuit using the common load/test circuit to provide a resultant test signature indicative of the values at said nodes, comprising the steps of: a. specifying in the control register the set of test points to be tested; b. loading at least one of the memory registers with test data by way of the common load/test circuit; c. commencing testing of the test points during a test period, the test period having defined subperiods in which the test is not performed, the test period defined by several of the integrated circuit clock cycles; d. sampling the set of test points during each clock cycle to provide a set of test data; e. entering said test data into the multiple input linear feedback shift register; and f. at the conclusions of the test period, comparing the resulting signature to a prestored, dynamically-variable expected signature value providing a pass/fail result.

Claim 7

The method of claim 4 further comprising the step of masking selected test points for which a test is not desired.

Claim 8

The method of claim 4 wherein the integrated circuit has input terminals connected to the common load/test circuit, and wherein the step of testing includes the step of applying data to said input terminals and the step of reading signal values at said nodes.

Claim 9

In an integrated circuit implemented on a semiconductor chip, test architecture also implemented on said semiconductor chip for testing said integrated circuit to provide a pass/fail result for a specified set of test points, comprising: a. a clocked integrated circuit having registers, at least one of the registers comprising a control register, the control register providing means for specifying the set of test points to be tested; b. a common load/test bus on the integrated circuit for loading data into the registers and for reading data from the registers, said common load/test bus being operable during normal operation of the integrated circuit; c. test points on the integrated circuit for providing signal values thereat during testing; d. means, coupled tot he common load/test bus, for commencing testing of the test points during a test period, the test period having defined subperiods in which the test is not performed, the test period defined by several of the integrated circuit clock cycles; e. a linear feedback shift register, the linear feedback shift register having an output, the linear feedback shift register being coupled to the common load/test bus for computing a signature corresponding to the values of the test points; and e. an expected signature register, coupled to the common load/test bus, for storing a dynamically-variable expected signature value to be compared with the computed signature from the linear feedback shift register to provide a pass/fail result at the output.

Claim 10

In an integrated circuit implemented on a semiconductor chip, test architecture also implemented on said semiconductor chip for testing said integrated circuit to provide a pass/fail result for a specified set of test points, comprising: a. a clocked integrated circuit having registers, at least one of the registers comprising a control register, the control register providing means for specifying the set of test points to be tested; b. a common load/test bus on the integrated circuit for loading data into the registers and for reading data from the registers, said common load/test bus being operable during normal operation of the integrated circuit; c. test points on the integrated circuit for providing signal values thereat during testing; d. means, coupled tot he common load/test bus, for commencing testing of the test points during a test period, the test period having defined subperiods in which the test is not performed, the test period defined by several of the integrated circuit clock cycles; e. a linear feedback shift register, the linear feedback shift register having an output, the linear feedback shift register being coupled to the common load/test bus for computing a signature corresponding to the values of the test points; and e. an expected signature register, coupled to the common load/test bus, for storing a dynamically-variable expected signature value to be compared with the computed signature from the linear feedback shift register to provide a pass/fail result at the output.

Claim 11

The test architecture of claim 7 further comprising a test mask register for masking test points from testing.

Claim 12

The test architecture of claim 7 wherein said bus serves as a load bus and a test bus and wherein common logic is used for loading and testing the integrated circuit.

Claim 13

The test architecture of claim 7 wherein common logic is used for testing the integrated circuit and for dumping the contents of the registers.

Claim 14

The test architecture of claim 7 wherein common logic performs signature analysis compression of the contents of the registers and of the signal values at the test points.

Claim 15

In an integrated circuit implemented on a semiconductor chip comprising a data path logic unit in a video graphics system, test architecture also implemented on said semiconductor chip for testing said integrated circuit to provide a test signature therefor for a specified set of test points, comprising: a. a clocked integrated circuit having registers, at least one of the registers comprising a control register, the control register providing means for specifying the set of test points to be tested; b. a common load/test bus on the integrated circuit for loading data into the registers and for reading data from the registers during video monitor refresh, said common load/test bus being operable during normal operation of the integrated circuit; c. test points on the integrated circuit for providing signal values thereat during testing; d. means, coupled to the common load/test bus, for commencing testing of the test points during a test period, the test period having defined subperiods in which the test is not performed, the test period defined by several of the integrated circuit clock cycles; e. a linear feedback shift register, the linear feedback shift register having an output, coupled to the common load/test bus for computing a signature corresponding to the values of the test points and providing this signature at the output.

Claim 16

In an integrated circuit implemented on a semiconductor chip comprising a data path logic unit in a video graphics system, test architecture also implemented on said semiconductor chip for testing said integrated circuit to provide a test signature therefor for a specified set of test points, comprising: a. a clocked integrated circuit having registers, at least one of the registers comprising a control register, the control register providing means for specifying the set of test points to be tested; b. a common load/test bus on the integrated circuit for loading data into the registers and for reading data from the registers during video monitor refresh, said common load/test bus being operable during normal operation of the integrated circuit; c. test points on the integrated circuit for providing signal values thereat during testing; d. means, coupled to the common load/test bus, for commencing testing of the test points during a test period, the test period having defined subperiods in which the test is not performed, the test period defined by several of the integrated circuit clock cycles; e. a linear feedback shift register, the linear feedback shift register having an output, coupled to the common load/test bus for computing a signature corresponding to the values of the test points and providing this signature at the output.