Data read circuit for use in semiconductor memory device

Claim 2

A data read circuit for use in a semiconductor memory device comprising: an input node connected to a bit line of said memory device; an output node for outputting a read-out signal; a first transistor connected between said input node and said output node and turned ON and OFF in accordance with a potential of the bit line connected to a selected memory cell transistor; a power source terminal; a second transistor connected between said power source terminal and said output node; an address transition detection circuit for generating a pulse signal in response to transition of potential of an address signal, said second transistor being connected to said address transition detection circuit and being momentarily turned ON in response to said transition of said address signal; and a third transistor having source and drain electrodes connected to said second transistor in parallel and turned ON and OFF in accordance with the read-out signal so that said third transistor is turned OFF when said selected memory cell transistor is turned ON.

Claim 3

A data read circuit according to claim 1, wherein said first transistor is an N channel type transistor having a source electrode connected to said input node and a drain electrode to connected to said output node, said circuit further comprising an inverter circuit including a fourth transistor and a fifth transistor connected in series and having a input connected to said input node and an output at the junction of said fourth and fifth transistors connected to a gate electrode of said first transistor.

Claim 4

A data read circuit according to claim 1, further comprising a Schmitt circuit having an input connected to said output node and an output connected to a gate electrode of said third transistor.

Claim 5

A data read circuit according to claim 1, wherein a value of mutual conductance of said second transistor is larger than that of said third transistor.

Claim 6

A data read circuit for use in a semiconductor memory device comprising: an input node connected to a bit line of said memory device; an output node for outputting a read-out signal; a first transistor connected between said input node and said output node and turned ON and OFF in accordance with a potential of the bit line connected to a selected memory cell transistor; a power source terminal; a second transistor connected between said power source terminal and said output node; and an address transition detection circuit for generating a pulse signal in response to transition of potential of an address signal, said second transistor being connected to said address transition detection circuit and being momentarily turned ON in response to an address transition.

Claim 7

A data read circuit for use in a semiconductor memory device comprising: an input node connected to a bit line of said memory device; an output node for outputting a read-out signal; a first transistor connected between said input node and said output node and turned ON and OFF in accordance with a potential of the bit line connected to a selected memory cell transistor; a power source terminal; a second transistor connected between said power source terminal and said output node; and an address transition detection circuit for generating a pulse signal in response to transition of potential of an address signal, said second transistor being connected to said address transition detection circuit and being momentarily turned ON in response to an address transition.

Claim 8

A data read circuit for use in a semiconductor memory device comprising: an input node connected to a bit line of said memory device; an output node for outputting a read-out signal; a first transistor connected between said input node and said output node and turned ON and OFF in accordance with a potential of the bit line connected to a selected memory cell transistor; a power source terminal; a second transistor connected between said power source terminal and said output node; an address transition detection circuit for generating a pulse signal in response to transition of potential of an address signal, said second transistor being connected to said address transition detection circuit to be turned ON in response to said pulse signal for a predetermined period after such transition; and a third transistor having source and drain electrodes connected to said second transistor in parallel and turned ON and OFF in accordance with the read-out signal so that said third transistor is turned OFF when said selected memory cell transistor is turned ON, wherein a value of mutual conductance of said second transistor is larger than that of said third transistor.

Claim 9

A data read circuit for use in a semiconductor memory device comprising: an input node connected to a bit line of said memory device; an output node for outputting a read-out signal; a first transistor connected between said input node and said output node and turned ON and OFF in accordance with a potential of the bit line connected to a selected memory cell transistor; a power source terminal; a second transistor connected between said power source terminal and said output node; an address transition detection circuit for generating a pulse signal in response to transition of potential of an address signal, said second transistor being connected to said address transition detection circuit to be turned ON in response to said pulse signal for a predetermined period after such transition; and a third transistor having source and drain electrodes connected to said second transistor in parallel and turned ON and OFF in accordance with the read-out signal so that said third transistor is turned OFF when said selected memory cell transistor is turned ON, wherein a value of mutual conductance of said second transistor is larger than that of said third transistor.