US4925812A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Platinum diffusion process
Assignee: Infineon Technologies Americas Corp
•
Filing: 1989-09-21
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Granted: 1990-05-15
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Expires: 2009-09-21
Abstract
Abstract Platinum atoms are uniformly dispersed throughout a silicon wafer containing preformed junctions by depositing a layer of platinum on a clean silicon surface and thereafter immediately heating the wafer to about 500° C. to form platinum silicide. Alternatively, a layer of palladium may be deposited on the surface of the wafer, a layer of platinum is deposited atop the palladium and the wafer is heated to form a palladium silicide with platinum atoms uniformly dispersed throughout the silicide layer. The wafer is heated to about 900° C. for a short time which is sufficiently high to cause the platinum atoms to diffuse into the silicon wafer but is too low and lasts for too short a time to cause the movement of the preformed junctions within the wafer.
Inventors
- 👤 Herbert J. Gould
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 14:41
CPC Classifications
H; H10; H10P; H10P32/00; H10P32/10; H10P32/18; H10P32/17; H10P32/171; Y; Y10; Y10S; Y10S438/00; Y10S438/904
Claims Analysis
Total Claims: 28
Claim 1
Independent Claim
123 words
A process for introducing platinum atoms into a semiconductor body to reduce minority carrier lifetime comprising the steps of forming a layer of palladium on a surface of said semiconductor body, and thereafter forming a layer of platinum atop said palladium layer and thereafter heating said semiconductor body, said palladium and said platinum layers to a first temperature sufficient to form palladium silicide having platinum atoms uniformly dissolved in said layer of palladium silicide, and thereafter heating said semiconductor body and said palladium silicide to a second and higher temperature sufficiently high and for a sufficiently short time to cause platinum atoms to diffuse into said semiconductor body but which is too low to cause palladium atoms to diffuse into said semiconductor body.
Claim 2
Dependent Claim
123 words
A process for introducing platinum atoms into a semiconductor body to reduce minority carrier lifetime comprising the steps of forming a layer of palladium on a surface of said semiconductor body, and thereafter forming a layer of platinum atop said palladium layer and thereafter heating said semiconductor body, said palladium and said platinum layers to a first temperature sufficient to form palladium silicide having platinum atoms uniformly dissolved in said layer of palladium silicide, and thereafter heating said semiconductor body and said palladium silicide to a second and higher temperature sufficiently high and for a sufficiently short time to cause platinum atoms to diffuse into said semiconductor body but which is too low to cause palladium atoms to diffuse into said semiconductor body.
Claim 3
Dependent Claim
13 words
The process of claim 1 wherein said second temperature is about 900° C.
Claim 4
Dependent Claim
21 words
The process of claim 1 wherein said palladium and platinum layers are deposited on said semiconductor body by electron beam evaporation.
Claim 5
Dependent Claim
47 words
The process of claim 1 wherein said semiconductor body contains at least one P-N junction therein; said junction being formed in said semiconductor body in a step which precedes said step of heating said semiconductor body to cause diffusion of said platinum atoms into said semiconductor body.
Claim 6
Dependent Claim
21 words
The process of claim 4 wherein said palladium and platinum layers are deposited on said semiconductor body by electron beam evaporation.
Claim 7
Dependent Claim
17 words
The process of claim 1 wherein said semiconductor body comprises a thin, flat wafer of monocrystalline silicon.
Claim 8
Dependent Claim
16 words
The process of claim 1, wherein said semiconductor body contains a plurality of P-N junctions therein.
Claim 9
Dependent Claim
20 words
The process of claim 7 wherein the position of said plurality of P-N junctions remains stable at said second temperature.
Claim 10
Dependent Claim
26 words
The process of claim 1 wherein said layer of palladium silicide is removed from said semiconductor body after diffusing said platinum atoms into said semiconductor body.
Claim 11
Dependent Claim
26 words
The process of claim 4 wherein said layer of palladium silicide is removed from said semiconductor body after diffusing said platinum atoms into said semiconductor body.
Claim 12
Dependent Claim
26 words
The process of claim 8 wherein said layer of palladium silicide is removed from said semiconductor body after diffusing said platinum atoms into said semiconductor body.
Claim 13
Dependent Claim
151 words
A process for diffusing lifetime-reducing atoms of a heavy metal into a silicon body containing P-N junctions at a temperature too low to distort the positions of said P-N junctions; said process comprising the steps of depositing a silicide-forming metal on a surface of said silicon body; said silicide-forming metal diffusing into silicon at a higher temperature than the temperature at which said heavy metal diffuses into silicon; and depositing a layer of said heavy metal atop said silicide-forming metal, and then heating said silicon body to a first temperature sufficient to form a silicide whereby atoms of said heavy metal disburse throughout said silicide, and thereafter heating said silicon body to a second and higher temperature and for a short time sufficient to cause said atoms of said heavy metal to diffuse into said silicon body but too low to cause movement of said P-N junctions within said silicon body.
Claim 14
Dependent Claim
151 words
A process for diffusing lifetime-reducing atoms of a heavy metal into a silicon body containing P-N junctions at a temperature too low to distort the positions of said P-N junctions; said process comprising the steps of depositing a silicide-forming metal on a surface of said silicon body; said silicide-forming metal diffusing into silicon at a higher temperature than the temperature at which said heavy metal diffuses into silicon; and depositing a layer of said heavy metal atop said silicide-forming metal, and then heating said silicon body to a first temperature sufficient to form a silicide whereby atoms of said heavy metal disburse throughout said silicide, and thereafter heating said silicon body to a second and higher temperature and for a short time sufficient to cause said atoms of said heavy metal to diffuse into said silicon body but too low to cause movement of said P-N junctions within said silicon body.
Claim 15
Dependent Claim
24 words
The process of claim 12 wherein said silicide is removed from said silicon body after said heavy metal atoms diffuse into said silicon body.
Claim 16
Dependent Claim
11 words
The process of claim 12 wherein said silicide-forming metal is palladium.
Claim 17
Dependent Claim
11 words
The process of claim 12 wherein said heavy metal is platinum.
Claim 18
Dependent Claim
11 words
The process of claim 14 wherein said heavy metal is platinum.
Claim 19
Dependent Claim
24 words
The process of claim 16 wherein said silicide is removed from said silicon body after said heavy metal atoms diffuse into said silicon body.
Claim 20
Dependent Claim
13 words
The process of claim 15 wherein said second temperature is about 900° C.
Claim 21
Dependent Claim
12 words
The process of claim 16 wherein said temperature is about 900° C.
Claim 22
Dependent Claim
119 words
A process for introducing platinum atoms into a silicon wafer to reduce minority carrier lifetime comprising the steps of forming a layer of platinum on the back surface of a silicon wafer which has a pattern of P-N junctions formed into its opposite surface; and immediately thereafter and before an oxide can form between said layer of platinum and said silicon wafer, heating said wafer to form a platinum silicide on said back surface which is free of an intervening oxide layer, and thereafter diffusing platinum atoms from said silicide into said wafer by heating said wafer to a temperature higher than about 850° C. but lower than the temperature at which said junctions will move within said wafer
Claim 23
Dependent Claim
119 words
A process for introducing platinum atoms into a silicon wafer to reduce minority carrier lifetime comprising the steps of forming a layer of platinum on the back surface of a silicon wafer which has a pattern of P-N junctions formed into its opposite surface; and immediately thereafter and before an oxide can form between said layer of platinum and said silicon wafer, heating said wafer to form a platinum silicide on said back surface which is free of an intervening oxide layer, and thereafter diffusing platinum atoms from said silicide into said wafer by heating said wafer to a temperature higher than about 850° C. but lower than the temperature at which said junctions will move within said wafer
Claim 24
Dependent Claim
15 words
The process of claim 20 wherein said platinum layer is formed by electron beam evaporation.
Claim 25
Dependent Claim
19 words
The process of claim 20 wherein said wafer is heated in a forming gas atmosphere to form said silicide.
Claim 26
Dependent Claim
19 words
The process of claim 21 wherein said wafer is heated in a forming gas atmosphere to form said silicide.
Claim 27
Dependent Claim
20 words
The process of claim 20 wherein said silicide is removed from said wafer after diffusing platinum atoms into said wafer.
Claim 28
Dependent Claim
20 words
The process of claim 22 wherein said silicide is removed from said wafer after diffusing platinum atoms into said wafer.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1993-05-14 | 1993-11-13 | 1994-05-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-05-14 | 1997-11-13 | 1998-05-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-05-14 | 2001-11-13 | 2002-05-15 | $7700.00 | Window Closed / Lapsed |