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US3640783A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor devices with diffused platinum

Assignee: Optron Inc
•
Filing: 1969-08-11
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Granted: 1972-02-08
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Expires: 1989-08-11
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Abstract

Abstract A semiconductor device having platinum dispersed throughout said device. The dispersion of platinum within a semiconductor device results in improved electrical characteristics of the device. In a silicon diode, the improved characteristics include the reduction of reverse recovery time and an increase in the breakdown voltage. In a silicon transistor, the improved characteristics include the achievement of high switching speeds while maintaining high forward current gain.

Inventors

  • 👤 Robert F Bailey

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 09:55
CPC Classifications
H; H10; H10P; H10P95/00; H10D; H10D99/00; H10P32/00; H10P32/10; H10P32/17; H10P32/171; H10P32/18; Y; Y10; Y10S; Y10S148/00; Y10S148/062

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 59 words
A method for the fabrication of a silicon diode comprising the steps of: a. providing a silicon crystal body having a PN-junction being disposed therein; and b. heating said silicon crystal body in the presence of platinum to a temperature in the range of 925*-965* C. for a time sufficient to diffuse platinum atoms substantially throughout said silicon crystal.
Claim 2
Independent Claim 98 words
A method for the fabrication of a transistor comprising the steps of: a. providing a silicon crystal body with a first region of a first-conductivity type being disposed between and contiguous to a pair of second regions of a second conductivity type; and b. diffusing platinum throughout said body by heating said body in the presence of platinum to a temperature in the range of 925*-965* C. for a time sufficient to substantially disperse platinum atoms through said silicon crystal body whereby a transistor is produced having a substantially improved forward current transfer ratio and reduced switching speed.
Claim 3
Dependent Claim 18 words
A method as in claim 3, wherein a silicon crystal body with an NPN-transistor disposed therein is provided.

References Cited (Backward Citations)

US3067485A Cited
US3486950A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1975-02-07 1975-08-09 1976-02-08 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1979-02-07 1979-08-09 1980-02-08 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1983-02-07 1983-08-09 1984-02-08 $7700.00 Window Closed / Lapsed

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