US4871416A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and device for cleaning substrates
Assignee: Oki Electric Industry Co Ltd
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Filing: 1988-11-15
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Granted: 1989-10-03
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Expires: 2008-11-15
Abstract
Abstract For cleaning substrates in a cleaning device, a reaction furnace of the cleaning device in which a substrate has been installed is evacuated and then supplied with a reducing gas, and a natural oxide film on the substrate is removed by heating it in an atmosphere of reducing gas, the reaction furnace is then is evacuated and a reactive gas is introduced into the reaction furnace, and contaminants on the substrate are removed by etching the substrate in the reactive gas that has been chemically activated by UV radiation.
Inventors
- 👤 Hisashi Fukuda
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 18:15
CPC Classifications
H; H10; H10P; H10P70/00; H10P70/20; H10P70/10; H10P70/12; H01; H01J; H01J37/00; H01J37/32; H01J37/32431; H01J37/32798; H01J37/32853; H01J37/32862; H10P14/00; H10P14/60; H10P14/63; H10P14/6302; H10P14/6304; H10P14/6306; H10P14/6308; H10P14/6309; H10P14/6322; H10P14/65; H10P14/6502; H10P14/6504; H10P14/6512; H10P72/00; H10P72/04; H10P72/0402; H10P72/0418; H10P72/0421; Y; Y10; Y10S; Y10S134/00; Y10S134/902; Y10S438/00; Y10S438/906
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
95 words
A method of cleaning substrates comprising the steps of: (a) evacuating a reaction furnace of a substrate cleaning device in which a substrate has been installed; (b) introducing a reducing gas into said reaction furnace of a substrate cleaning device; (c) removing a natural oxide film on said substrate by heating it in an atmosphere of reducing gas; (d) evacuating said reaction furnace; (e) introducing a reactive gas into said reaction furnace; and (f) removing contaminants on said substrate by etching said substrate in said reactive gas that has been chemically activated by UV radiation.
Claim 2
Independent Claim
95 words
A method of cleaning substrates comprising the steps of: (a) evacuating a reaction furnace of a substrate cleaning device in which a substrate has been installed; (b) introducing a reducing gas into said reaction furnace of a substrate cleaning device; (c) removing a natural oxide film on said substrate by heating it in an atmosphere of reducing gas; (d) evacuating said reaction furnace; (e) introducing a reactive gas into said reaction furnace; and (f) removing contaminants on said substrate by etching said substrate in said reactive gas that has been chemically activated by UV radiation.
Claim 3
Dependent Claim
29 words
A method of cleaning a substrate as set forth in claim 1, wherein during the removal of the natural oxide film at said step (c) said substrate is heated.
Claim 4
Dependent Claim
39 words
A method of cleaning a substrate as set forth in claim 2, wherein during the removal of the natural oxide film at said step (c) said substrate is heated to a temperature of not lower than about 1000° C.
Claim 5
Dependent Claim
39 words
A method of cleaning a substrate as set forth in claim 1, wherein the removal of the natural oxide film from said substrate is carried out while said reaction furnace is supplied with the reducing gas and is evacuated.
Claim 6
Dependent Claim
43 words
A method of cleaning a substrate as set forth in claim 4, wherein the removal of the natural oxide film from said substrate is performed while said reaction furnace is evacuated to maintain a pressure of not lower than about 10 -2 Torr.
Claim 7
Dependent Claim
27 words
A method of cleaning a substrate as set forth in claim 1, wherein during the removal of the contaminants at said step (f) said substrate is heated.
Claim 8
Dependent Claim
37 words
A method of cleaning a substrate as set forth in claim 6, wherein during the removal of the contaminants at said step (f) said substrate is heated to a temperature of not higher than about 300° C.
Claim 9
Dependent Claim
37 words
A method of cleaning a substrate as set forth in claim 1, wherein the removal of the contaminants from said substrate is carried out while said reaction furnace is supplied with the reactive gas and is evacuated.
Claim 10
Dependent Claim
40 words
A method of cleaning a substrate as set forth in claim 8, wherein the removal of the contaminants from said substrate is performed while said reaction furnace is evacuated to maintain pressure of not lower than about 10 -2 Torr.
Claim 11
Dependent Claim
37 words
A method of cleaning a substrate as set forth in claim 1, further comprising the step of (g) filling the reaction furnace with an inert gas prior to the installation of said substrate for said step (a).
Claim 12
Dependent Claim
39 words
A method of cleaning a substrate as set forth in claim 1, further comprising the step of (h) cleaning the substrate using a chemical agent and pure water prior to the installation of the substrate for said step (a).
Claim 13
Dependent Claim
31 words
A method of cleaning a substrate as set forth in claim 1, wherein the evacuation at said step (a) is performed to create a vacuum of 10 -6 Torr or less.
Claim 14
Dependent Claim
31 words
A method of cleaning a substrate as set forth in claim 1, wherein the evacuation at said step (d) is performed to create a vacuum of 10 -6 Torr or less.
Claim 15
Dependent Claim
83 words
A substrate cleaning device comprising: a reaction furnace in which a substrate is installed; an evacuating means for evacuating the reaction furnace; a gas supply means which can supply the furnace with at least a reducing gas to remove a natural oxide film from said substrate and a reactive gas to remove contaminants from said substrate; a heating means to heat said substrate in a reducing gas atmosphere supplied to said furnace; and a UV irradiation means to chemically activate said reactive gas.
Claim 16
Dependent Claim
83 words
A substrate cleaning device comprising: a reaction furnace in which a substrate is installed; an evacuating means for evacuating the reaction furnace; a gas supply means which can supply the furnace with at least a reducing gas to remove a natural oxide film from said substrate and a reactive gas to remove contaminants from said substrate; a heating means to heat said substrate in a reducing gas atmosphere supplied to said furnace; and a UV irradiation means to chemically activate said reactive gas.
Claim 17
Dependent Claim
50 words
A substrate cleaning device as set forth in claim 14 wherein said heating means comprises an infra-red lamp, said UV irradiation means comprises an ultra-violet lamp; and said heating means and UV irradiation installed outside the furnace so that IR and UV radiation can penetrate into the furnace from outside.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-10-02 | 1993-04-03 | 1993-10-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-10-02 | 1997-04-03 | 1997-10-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-10-02 | 2001-04-03 | 2001-10-03 | $7700.00 | Window Closed / Lapsed |