Patent JPS6064489A successfully refreshed from Google Patents.
← Back to Patent Explorer
US4868622A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor light-detecting device with alloyed isolating region

Assignee: Toshiba Corp
•
Filing: 1987-10-27
•
Granted: 1989-09-19
•
Expires: 2007-10-27
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A semiconductor light detecting device comprises a substrate, a first stacked layer of a first conductivity type formed on the substrate by alternately laminating a compound semimetal layer and a compound semiconductor layer repeatedly, a second stacked layer of a second conductivity type formed on the first stacked layer by alternately laminating the compound semimetal layer and the compound semiconductor layer repeatedly, and an isolation region formed by selectively irradiating the first and second stacked layers with an energy beam. A plurality of light detecting elements isolated from each other by the isolation region are formed on the substrate so as to provide the semiconductor light detecting device.

Inventors

  • 👤 Keitaro Shigenaka

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 19:59
CPC Classifications
H; H10; H10F; H10F39/00; H10F39/10; H10F39/12; H10F39/18; H10F39/184; Y; Y10; Y10S; Y10S257/00; Y10S257/926

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 116 words
A semiconductor light detecting device having a plurality of light-detecting elements comprising: a substrate; a first stacked layer of a first conductivity type formed on the substrate by alternately laminating a compound semimetal layer and a compound semiconductor layer selected from the group consisting of the combinations of HgTe/CdTe, HgTe/ZnTe and HgTe/MnTe; a second stacked layer of a second conductivity type formed on the first stacked layer by alternately laminating the compound semimetal layer and the compound semiconductor layer; and an isolation region for isolating a plurality of light-detecting elements from one another, said isolation region consisting essentially of an alloy being formed by selectively irradiating the first and second stacked layers with a laser beam.
Claim 2
Dependent Claim 116 words
A semiconductor light detecting device having a plurality of light-detecting elements comprising: a substrate; a first stacked layer of a first conductivity type formed on the substrate by alternately laminating a compound semimetal layer and a compound semiconductor layer selected from the group consisting of the combinations of HgTe/CdTe, HgTe/ZnTe and HgTe/MnTe; a second stacked layer of a second conductivity type formed on the first stacked layer by alternately laminating the compound semimetal layer and the compound semiconductor layer; and an isolation region for isolating a plurality of light-detecting elements from one another, said isolation region consisting essentially of an alloy being formed by selectively irradiating the first and second stacked layers with a laser beam.
Claim 3
Dependent Claim 28 words
The semiconductor light detecting device according to claim 1, wherein the material constituting the substrate is selected from the group consisting of CdTe, CdZnTe, CdSeTe, GaAs and Si.
Claim 4
Dependent Claim 34 words
The semiconductor light detecting device according to claim 1, wherein the first stacked layer is a p-type layer prepared by alternately laminating an undoped HgTe layer and as As- or P-doped CdTe layer repeatedly.
Claim 5
Dependent Claim 44 words
The semiconductor light detecting device according to claim 1, wherein the second stacked layer is an at least nominally n-type layer prepared by alternately laminating an undoped HgTe layer and a layer selected from the group of undoped CdTe layers and In-doped CdTe layers.
Claim 6
Dependent Claim 32 words
The semiconductor light detecting device according to claim 1, wherein the thickness of a pair of the compound semimetal and compound semiconductor layers falls within the range of between 30Å and 300Å.
Claim 7
Dependent Claim 144 words
A semiconductor light detecting device having a plurality of light-detecting elements comprising: a substrate; a first stacked layer of a first conductivity type formed on the substrate by alternately laminating a compound semimetal layer and a compound semiconductor layer selected from the group consisting of the combinations of HgTe/CdTe, HgTe/ZnTe and HgTe/MnTe; a second stacked layer of a second conductivity type formed on the first stacked layer by alternately laminating the compound semimetal layer and the compound semiconductor layer; and an isolation region for isolating a plurality of light-detecting elements from one another, said isolation region consisting essentially of an alloy being formed by selectively irradiating the first and second stacked layers with an energy beam which is selected from the group consisting of a Nd:YAG laser applied with a Q switch; a ruby laser applied with a Q switch, and an electron beam.
Claim 8
Dependent Claim 144 words
A semiconductor light detecting device having a plurality of light-detecting elements comprising: a substrate; a first stacked layer of a first conductivity type formed on the substrate by alternately laminating a compound semimetal layer and a compound semiconductor layer selected from the group consisting of the combinations of HgTe/CdTe, HgTe/ZnTe and HgTe/MnTe; a second stacked layer of a second conductivity type formed on the first stacked layer by alternately laminating the compound semimetal layer and the compound semiconductor layer; and an isolation region for isolating a plurality of light-detecting elements from one another, said isolation region consisting essentially of an alloy being formed by selectively irradiating the first and second stacked layers with an energy beam which is selected from the group consisting of a Nd:YAG laser applied with a Q switch; a ruby laser applied with a Q switch, and an electron beam.

References Cited (Backward Citations)

US4198251A Cited
US4290825A Cited
US4373678A Cited
JPS5772369A Cited
US4511408A Cited
US4594603A Cited
US4771010A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-09-18 1993-03-20 1993-09-19 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-09-18 1997-03-20 1997-09-19 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-09-18 2001-03-20 2001-09-19 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag