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Pattern-forming material and its production and use

Assignee: Fujitsu Ltd
•
Filing: 1987-03-16
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Granted: 1989-09-05
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Expires: 2007-03-16
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Abstract

Abstract A high-energy radiation-sensitive pattern-forming resist material consisting of polysilsesquioxane having no hydroxyl group in its molecule. The pattern-forming material of this invention has an improved sensitivity to high-energy radiation exposure, a high resistance to dry etching, a high resolution capability, and an improved thermal stability.

Inventors

  • 👤 Shun-ichi Fukuyama
  • 👤 Yasuhiro Yoneda
  • 👤 Masashi Miyagawa
  • 👤 Kota Nishii

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 18:28
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/004; G03F7/075; G03F7/0757; Y; Y10; Y10S; Y10S438/00; Y10S438/942; Y10S438/948

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 74 words
A high-energy radiation-sensitive, pattern-forming resist material which consists of polysilsesquioxane having no hydroxyl group in its molecule, said polysilsesquioxane being silylated polysilsesquioxane of the formula: ##STR12## in which R 1 and R 2 are the same or different and each represents a substituted or unsubstituted alkyl group, a substituted or unsubstituted aryl group, or a substituted or unsubstituted vinyl group, and m is a positive integer in the approximate range of 25 to 4,000.
Claim 2
Dependent Claim 74 words
A high-energy radiation-sensitive, pattern-forming resist material which consists of polysilsesquioxane having no hydroxyl group in its molecule, said polysilsesquioxane being silylated polysilsesquioxane of the formula: ##STR12## in which R 1 and R 2 are the same or different and each represents a substituted or unsubstituted alkyl group, a substituted or unsubstituted aryl group, or a substituted or unsubstituted vinyl group, and m is a positive integer in the approximate range of 25 to 4,000.
Claim 3
Dependent Claim 76 words
A high-energy radiation-sensitive, pattern-forming resist material which consists of polysilsesquioxane having no hydroxyl group in its molecule, said polysilsesquioxane being a silylated polysilsesquioxane of the formula: ##STR13## in which R 1 and R 2 are the same or different and each represents a substituted or unsubstituted alkyl, aryl or vinyl group, R 3 is a substituted or unsubstituted alkyl or aryl group, and m is a positive integer in the approximate range of 25 to 4,000.
Claim 4
Dependent Claim 76 words
A high-energy radiation-sensitive, pattern-forming resist material which consists of polysilsesquioxane having no hydroxyl group in its molecule, said polysilsesquioxane being a silylated polysilsesquioxane of the formula: ##STR13## in which R 1 and R 2 are the same or different and each represents a substituted or unsubstituted alkyl, aryl or vinyl group, R 3 is a substituted or unsubstituted alkyl or aryl group, and m is a positive integer in the approximate range of 25 to 4,000.

References Cited (Backward Citations)

EP0049127A1 Cited
US4600685A Cited
JPS57141642A Cited
DE3139316A1 Cited
EP0076656A2 Cited
EP0096596A1 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-09-04 1993-03-06 1993-09-05 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-09-04 1997-03-06 1997-09-05 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-09-04 2001-03-06 2001-09-05 $7700.00 Window Closed / Lapsed

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