CMOS reference voltage generation

Claim 2

A circuit arrangement for generating a reference voltage comprising: first FET device and second FET device, with each device having a control terminal, a drain terminal, a source terminal and a substrate terminal and both devices having the same base threshold voltage; an operational amplifier having a positive input terminal connected to the source terminal of the first FET device, a negative input terminal connected to the source terminal of the second FET device and an output terminal; a first means interconnecting the output terminal to the control terminal of the second FET device; a second means interconnecting the substrate terminal to the source terminal of said second FET device; a first biasing network for generating a first reference voltage connected to the control terminal of the first FET device; a second biasing network for generating a second reference voltage connected to the source and substrate terminals of the first FET device; and third means for generating identical current flow connected to the source electrodes of the first FET device and the second FET device.

Claim 3

The circuit arrangement of claim 1 further including a single rail power supply coupled to the third means.

Claim 4

The circuit arrangement of claim 1 wherein the first and second means include electrical conductors.

Claim 5

The circuit arrangement of claim 2 wherein the third means includes third and fourth FET devices connected in series between the single rail power supply and the source terminals of the first FET device and second FET device and fifth and sixth FET devices being configured in parallel relative to the series connected third and fourth FET devices and interconnecting the drain electrodes of the first and second FET devices to a ground potential.

Claim 6

The circuit arrangement of claim 4 wherein the FET devices include P-channel enhancement type.

Claim 7

The circuit arrangement of claim 4 wherein the W/L ratios of the third and fourth devices are the same.

Claim 8

The circuit arrangement of claim 4 wherein the W/L ratio of the third or the fourth FET device is twice the W/L ratio of the fifth or sixth FET device.

Claim 9

The circuit arrangement of claim 4 wherein the W/L ratio of the FET devices are the same.

Claim 10

The circuit arrangement of claim 1 wherein the second biasing network includes a plurality of FET devices connected in series between a single rail power supply and a ground potential.

Claim 11

The circuit arrangement of claim 9 wherein the FET devices include P-channel enhancement mode devices with each device having its substrate terminal connected to its source terminal and its gate terminal connected to its drain terminal.

Claim 12

An improved CMOS circuit arrangement for generating a process independent reference voltage from a single rail power supply comprising: a first FET and a second FET device, each drive having a control terminal, a substrate terminal, a source terminal and a drain terminal and both devices having the same base threshold; an operational amplifier having an output terminal connected to the control terminal of the first FET, a negative input terminal connected to the drain terminal of said first FET device and a positive input terminal connected to the drain electrode of the second FET device; a first pair of current setting FET devices, each one being connected between the drain terminal and ground potential of respective first and second FET devices; a second pair of voltage setting FET devices connected in series between the source terminals of the first and second FET devices and the single rail power supply; a plurality of FET devices connected in series between the ground potential and the single rail power supply; and means for interconnecting the substrate terminal of the first FET device to a selected node form between the plurality of FET devices.

Claim 13

An improved CMOS circuit arrangement for generating a process independent reference voltage from a single rail power supply comprising: a first FET and a second FET device, each drive having a control terminal, a substrate terminal, a source terminal and a drain terminal and both devices having the same base threshold; an operational amplifier having an output terminal connected to the control terminal of the first FET, a negative input terminal connected to the drain terminal of said first FET device and a positive input terminal connected to the drain electrode of the second FET device; a first pair of current setting FET devices, each one being connected between the drain terminal and ground potential of respective first and second FET devices; a second pair of voltage setting FET devices connected in series between the source terminals of the first and second FET devices and the single rail power supply; a plurality of FET devices connected in series between the ground potential and the single rail power supply; and means for interconnecting the substrate terminal of the first FET device to a selected node form between the plurality of FET devices.