US4829520A
Expired / Lapsed
US
⏱️ 0.0 years remaining
In-place diagnosable electronic circuit board
Assignee: Nokia Bell Labs
•
Filing: 1987-03-16
•
Granted: 1989-05-09
•
Expires: 2007-03-16
Abstract
Abstract An on-board self diagnostic capability is realized in a circuit board with a microprocessor which is located on the circuit board and which interacts for diagnostic purposes with the functional circuitry on the board. The microprocessor interacts with an electrically erasable read-only-memory (EEROM) that is also located on the circuit board. Diagnostic signals occurring during the circuit board's normal operation are automatically detected and stored in the EEROM. Additionally, a control port at the circuit board permits activation in the microprocessor of diagnostic routines that accept input test data, apply test sequences to the functional circuitry and store the diagnostic results in the EEROM. Also, through control of the microprocessor, the EEROM is accessed to retrieve previously stored diagnostic results.
Inventors
- 👤 William H. Toth
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 20:22
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G06; G06F; G06F11/00; G06F11/22; G06F11/26; G06F11/267
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
74 words
A method for failure tagging of a removable electronic sub-assembly containing functional circuitry, means for testing said functional circuitry and a robust memory for storing results obtained by said means for testing, comprising the steps of: applying a test sequence stored in said means for testing to said functional circuitry in response to a storing results obtained in response to said test sequence in a block of said robust memory located on said sub-assembly.
Claim 2
Independent Claim
74 words
A method for failure tagging of a removable electronic sub-assembly containing functional circuitry, means for testing said functional circuitry and a robust memory for storing results obtained by said means for testing, comprising the steps of: applying a test sequence stored in said means for testing to said functional circuitry in response to a storing results obtained in response to said test sequence in a block of said robust memory located on said sub-assembly.
Claim 3
Dependent Claim
38 words
The method of claim 1 wherein said stimulus occurs when power is applied to said sub-assembly, when a fault is detected by elements within said functional circuitry, or when a test request signal is applied to said sub-assembly.
Claim 4
Dependent Claim
40 words
The method of claim 1, further comprising a step of reading the contents of said robust memory after said step of storing, and performing an integrity check on the information stored in said robust memory by said step of storing.
Claim 5
Dependent Claim
44 words
The method of claim 3, further comprising a step of storing said results in another block of said robust memory when said step of performing integrity check indicates that said step of storing, previous to said step of performing an integrity check, has failed.
Claim 6
Independent Claim
120 words
A method for maintaining operational integrity of an electronic system containing a plurality of removable sub-assemblies, each sub-assembly containing functional circuitry, means for testing said functional circuitry, and a robust memory for storing results obtained by said means for testing, comprising the steps of: detecting via said means for testing, fault conditions in said functional circuitry; storing via said means for testing, indications of said fault conditions in said robust memory located on said sub-assembly; identifying via said means for testing, from said fault conditions the occurrence of conditions requiring repair of a failed sub-assembly in said system; and reading the contents of said robust memory situated on said failed sub-assembly to locate the cause of failure of said sub-assembly.
Claim 7
Independent Claim
120 words
A method for maintaining operational integrity of an electronic system containing a plurality of removable sub-assemblies, each sub-assembly containing functional circuitry, means for testing said functional circuitry, and a robust memory for storing results obtained by said means for testing, comprising the steps of: detecting via said means for testing, fault conditions in said functional circuitry; storing via said means for testing, indications of said fault conditions in said robust memory located on said sub-assembly; identifying via said means for testing, from said fault conditions the occurrence of conditions requiring repair of a failed sub-assembly in said system; and reading the contents of said robust memory situated on said failed sub-assembly to locate the cause of failure of said sub-assembly.
Claim 8
Dependent Claim
28 words
The method of claim 5, further comprising the steps of repairing said failed sub-assembly and recasting the robust memory situated on said failed sub-assembly into a content-less state.
Claim 9
Dependent Claim
57 words
A circuit assembly for performing a preselected function comprising first means for performing said preselected function; second means, responsive to an applied stimulus, for developing a test sequence and applying said test sequence to said first means; and robust memory means for storing selected signals of said first means that occur in response to said test sequence.
Claim 10
Dependent Claim
57 words
A circuit assembly for performing a preselected function comprising first means for performing said preselected function; second means, responsive to an applied stimulus, for developing a test sequence and applying said test sequence to said first means; and robust memory means for storing selected signals of said first means that occur in response to said test sequence.
Claim 11
Dependent Claim
18 words
The circuit assembly of claim 7 further comprising means for reading the contents of said robust memory means.
Claim 12
Dependent Claim
63 words
The circuit assembly of claim 7 wherein said second means comprises: processor memory means for storing said test sequence; input/output means for accepting test requests; and processor means for performing tests in response to said test requests by applying said test sequence stored in said processor memory means to said first means and by storing said selected signals in said robust memory means.
Claim 13
Dependent Claim
26 words
The circuit assembly of claim 9 wherein said processor means reads the contents of said robust memory means and applies said contents to said input/output means.
Claim 14
Dependent Claim
48 words
The circuit assembly of claim 7 wherein said second means comprises: input/output means for accepting test requests; and processor means responsive to said test requests for developing said test sequence, applying said test sequence to said first means, and storing said selected signals in said robust memory means.
Claim 15
Dependent Claim
16 words
The circuit of claim 11 wherein said test sequence is a function of said selected signals.
Claim 16
Independent Claim
134 words
A method for maintaining operational integrity of an electronic system containing a plurality of removable sub-assemblies, each sub-assembly containing functional circuitry, means for testing said functional circuitry, and a robust memory for storing results obtained by said means for testing, comprising the steps of: applying a test sequence stored in said means to said functional circuitry for testing in response to a stimulus applied to said means for testing; storing said results obtained in response to said test sequence in said robust memory; identifying from said step of applying a test sequence the occurrence of conditions requiring repair of a failed sub-assembly in said system; and removing said failed sub-assembly from said system and reading the contents of said EEROM situated on said failed sub-assembly to locate the cause of failure of said sub-assembly.
Claim 17
Independent Claim
134 words
A method for maintaining operational integrity of an electronic system containing a plurality of removable sub-assemblies, each sub-assembly containing functional circuitry, means for testing said functional circuitry, and a robust memory for storing results obtained by said means for testing, comprising the steps of: applying a test sequence stored in said means to said functional circuitry for testing in response to a stimulus applied to said means for testing; storing said results obtained in response to said test sequence in said robust memory; identifying from said step of applying a test sequence the occurrence of conditions requiring repair of a failed sub-assembly in said system; and removing said failed sub-assembly from said system and reading the contents of said EEROM situated on said failed sub-assembly to locate the cause of failure of said sub-assembly.
References Cited (Backward Citations)
US4434489A
Cited
US4606024A
Cited
US4578773A
Cited
US4633466A
Cited
US4720672A
Cited
US4633467A
Cited
US4688222A
Cited
US4718064A
Cited
US4726024A
Cited
US4736374A
Cited
US4727545A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-05-08 | 1992-11-07 | 1993-05-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-05-08 | 1996-11-07 | 1997-05-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-05-08 | 2000-11-07 | 2001-05-09 | $7700.00 | Window Closed / Lapsed |