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US4810619A Expired / Lapsed US ⏱️ 0.0 years remaining

Photolithography over reflective substrates comprising a titanium nitride layer

Assignee: Intersil Corp
•
Filing: 1987-08-12
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Granted: 1989-03-07
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Expires: 2007-08-12
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Abstract

Abstract For fine line lithography of a reflective substrate, a layer of titanium nitride is applied between the reflective surface and the photoresist that is absorbant at the wavelength of light used to expose the photoresist. The resolution of the photoresist is improved, even when an absorbant dye is used in the photoresist. The titanium nitride can be readily removed at the same time as the reflective layer is patterned, thereby avoiding the need of a separate step to remove the absober layer during etching of the reflective substrate.

Inventors

  • 👤 Thomas R. Pampalone
  • 👤 Brian C. Lee
  • 👤 Edward C. Douglas

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 14:35
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/004; G03F7/09; G03F7/091

Claims Analysis

Total Claims: 14
Claim 1
Independent Claim 81 words
In a process for patterning a reflective layer on a substrate which comprises depositing said reflective layer, coating said layer with photoresist, exposing a portion of said photoresist, developing said photoresist to provide openings in the photoresist layer to the reflective layer and etching away the reflective layer in said opening, the improvement which comprises providing a titanium nitride layer intermediate the photoresist layer and the reflective layer, and after the etching step removing the remaining photoresist and the titanium nitride.
Claim 2
Dependent Claim 81 words
In a process for patterning a reflective layer on a substrate which comprises depositing said reflective layer, coating said layer with photoresist, exposing a portion of said photoresist, developing said photoresist to provide openings in the photoresist layer to the reflective layer and etching away the reflective layer in said opening, the improvement which comprises providing a titanium nitride layer intermediate the photoresist layer and the reflective layer, and after the etching step removing the remaining photoresist and the titanium nitride.
Claim 3
Dependent Claim 15 words
A process according to claim 1 wherein the reflective layer is a layer of aluminum.
Claim 4
Dependent Claim 16 words
A process according to claim 1 wherein the reflective layer is a layer of tantalum silicide.
Claim 5
Dependent Claim 14 words
A process according to claim 1 wherein the titanium nitride is stoichiometric titanium nitride.
Claim 6
Dependent Claim 15 words
A process according to claim 1 wherein the titanium nitride is a non-stoichiometric titanium nitride.
Claim 7
Dependent Claim 12 words
A process according to claim 1 wherein the titanium nitride contains oxygen.
Claim 8
Dependent Claim 12 words
A process according to claim 1 wherein the substrate has topographical features.
Claim 9
Dependent Claim 17 words
A process according to claim 1 wherein the photoresist contains an absorbent dye, absorbent at said frequency.
Claim 10
Dependent Claim 20 words
A process according to claim 1 wherein the reflective layer is aluminum and the etchant is a plasma containing chlorine.
Claim 11
Dependent Claim 21 words
A process according to claim 4 wherein the reflective layer is tantalum silicide and the etchant is a plasma containing chlorine.
Claim 12
Dependent Claim 14 words
A process according to claim 3 wherein the etchant is a plasma containing chloroform.
Claim 13
Dependent Claim 39 words
A process according to claim 1 wherein the reflective layer is tantalum silicide, the titanium nitride is TiO x N y , wherein x is about 0.8-1.3, y is about 0.8-1.2 and the etchant is a plasma containing chlorine.
Claim 14
Dependent Claim 25 words
A process according to claim 1 in which the remaining photoresist and the titanium nitride are removed at the same time with the same material.

References Cited (Backward Citations)

US2791504A Cited
US3201239A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-03-06 1992-09-05 1993-03-07 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-03-06 1996-09-05 1997-03-07 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-03-06 2000-09-05 2001-03-07 $7700.00 Window Closed / Lapsed

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