US4786616A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for heteroepitaxial growth using multiple MBE chambers
Assignee: AT&T Inc
•
Filing: 1987-06-12
•
Granted: 1988-11-22
•
Expires: 2007-06-12
Abstract
Abstract A method for epitaxially growing a layer of III-V material on a wafer of a material such as silicon comprises the steps of placing the wafer (16') in a first ultra-high vacuum chamber (11), and epitaxially growing a transition layer such as germanium on the wafer. An intermediate high vacuum chamber (13) is used to transport the wafer 16' to a second ultra-high vacuum chamber (12), and the second chamber (12) is used to epitaxially grow a layer of III-V material over the transition layer. Gate valves (33 and 15) are sequentially opened and closed to that the second vacuum chamber (12) cannot be contaminated by gases or particles from the first vacuum chamber (11). Wafer transport from chamber (11) to (13) is achieved without exposure to the atmosphere or to significant pressure changes thus avoiding the waste of transfer time or the formation of native oxide on the wafer surface.
Inventors
- 👤 Muhammad A. Awal
- 👤 El Hang Lee
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 03:00
CPC Classifications
C; C30; C30B; C30B23/00; C30B23/02; Y; Y10; Y10S; Y10S148/00; Y10S148/021; Y10S148/169
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
219 words
A method for making semiconductor devices comprising the steps of, epitaxially growing, in an ultra-high vacuum and on a crystalline substrate, a first layer of a first material, and then epitaxially growing, in an ultra-high vacuum and over the first layer, a second layer of a second material that is different from the first material, characterized in that the first layer is epitaxially grown in a first vacuum chamber that has been separately evacuated to a high vacuum condition; vapors and particulates of the first layer material are evacuated from the first vacuum chamber; an intermediate vacuum chamber is separately evacuated to a high vacuum condition; the first and intermediate vacuum chambers are thereafter brought into mutual communication so that together they constitute a combined single high vacuum chamber and the substrate is transported to the intermediate vacuum chamber; the first vacuum chamber is next UHV-sealed from the intermediate vacuum chamber; a second vacuum chamber is separately evacuated to a high vacuum condition; the intermediate and second vacuum chambers are thereafter brought into mutual communication so that together they constitute a single high vacuum chamber and the substrate is transported to the second vacuum chamber; the intermediate vacuum chamber is next UHV-sealed from the second vacuum chamber; and the second layer is next epitaxially grown over the first layer.
Claim 2
Independent Claim
219 words
A method for making semiconductor devices comprising the steps of, epitaxially growing, in an ultra-high vacuum and on a crystalline substrate, a first layer of a first material, and then epitaxially growing, in an ultra-high vacuum and over the first layer, a second layer of a second material that is different from the first material, characterized in that the first layer is epitaxially grown in a first vacuum chamber that has been separately evacuated to a high vacuum condition; vapors and particulates of the first layer material are evacuated from the first vacuum chamber; an intermediate vacuum chamber is separately evacuated to a high vacuum condition; the first and intermediate vacuum chambers are thereafter brought into mutual communication so that together they constitute a combined single high vacuum chamber and the substrate is transported to the intermediate vacuum chamber; the first vacuum chamber is next UHV-sealed from the intermediate vacuum chamber; a second vacuum chamber is separately evacuated to a high vacuum condition; the intermediate and second vacuum chambers are thereafter brought into mutual communication so that together they constitute a single high vacuum chamber and the substrate is transported to the second vacuum chamber; the intermediate vacuum chamber is next UHV-sealed from the second vacuum chamber; and the second layer is next epitaxially grown over the first layer.
Claim 3
Dependent Claim
42 words
The method of claim 1, further characterized in that the step of evacuating each vacuum chamber is accomplished by a separate vacuum pump connected to such vacuum chamber which evacuates such vacuum chamber to a pressure of less than 10 -7 torr.
Claim 4
Dependent Claim
51 words
The method of claim 2, further characterized in that the substrate is of a material selected from the group consisting of silicon and germanium; the first material is a material selected from the group consisting of group IV materials and alkali halide materials; and the second material is a III-V material.
Claim 5
Dependent Claim
50 words
The method of claim 3, further characterized in that the growth and quality of the first layer is monitored in-situ by directing a first laser beam into the first vacuum chamber onto a surface of the first layer and retrieving from the first chamber laser light scattered from said surface.
Claim 6
Dependent Claim
51 words
The method of claim 4, further characterized in that the structural and electronic quality of the first layer is further examined by directing a second laser beam into the intermediate chamber onto the surface of the transition layer and retrieving from the intermediate chamber laser light scattered from the said surface.
Claim 7
Dependent Claim
54 words
The method of claim 5, further characterized in that the growth of the second layer is monitored by directing a third laser beam into the second vacuum chamber onto the upper surface of the second layer and retrieving from the second vacuum chamber laser light scattered from the upper surface of the second layer.
Claim 8
Dependent Claim
102 words
The method of claim 1, further characterized in that the substrate is first loaded into the intermediate vacuum chamber while intermediate vacuum chamber is at substantially atmospheric pressure; the intermediate vacuum chamber is then evacuated to a high vacuum condition; and the first and intermediate chambers are next brought into mutual communication so that together they constitute a combined single high vacuum chamber, the substrate is transported to the first chamber, the intermediate chamber is UHV-sealed from the first chamber, the first chamber is further pumped to an ultra-high vacuum condition, and thereafter the first layer is epitaxially grown on the substrate.
Claim 9
Dependent Claim
82 words
The method of claim 7, further characterized in that after the second layer has been epitaxially grown, the intermediate and second vacuum chambers are brought into mutual communication so that together they constitute a single high vacuum chamber and the substrate is transported to the intermediate vacuum chamber; the second vacuum chamber is next UHV-sealed from the intermediate vacuum chamber; the intermediate vacuum chamber is returned to a pressure near atmospheric pressure; and the substrate is unloaded from the intermediate vacuum chamber.
Claim 10
Dependent Claim
14 words
The method of claim 3, further characterized in that the substrate is crystalline silicon.
Claim 11
Dependent Claim
14 words
The method of claim 9, further characterized in that the first material is germanium.
Claim 12
Dependent Claim
15 words
The method of claim 10, further characterized in that the second material is gallium arsenide.
Claim 13
Dependent Claim
46 words
The method of claim 11, further characterized in that a third layer of calcium fluoride is epitaxially grown in the first chamber over the first layer of germanium; and the second layer of gallium arsenide is epitaxially grown in the second chamber over the third layer.
Claim 14
Dependent Claim
15 words
The method of claim 9, further characterized in that the first material is calcium fluoride.
References Cited (Backward Citations)
US4047624A
Cited
US4171235A
Cited
US4159919A
Cited
US4615298A
Cited
US4492716A
Cited
US4505950A
Cited
US4543267A
Cited
US4498416A
Cited
US4681773A
Cited
US4430149A
Cited
US4666734A
Cited
US4477311A
Cited
US4554030A
Cited
US4632712A
Cited
US4592306A
Cited
US4645683A
Cited
US4664062A
Cited
US4693777A
Cited
US4676884A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-11-22 | 1992-05-23 | 1992-11-22 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-11-22 | 1996-05-23 | 1996-11-22 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-11-22 | 2000-05-23 | 2000-11-22 | $7700.00 | Window Closed / Lapsed |