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Method for making a composite substrate for electronic semiconductor parts

Assignee: SCHWARZKOFF DEVELOPMENT Corp
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Filing: 1986-09-17
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Granted: 1988-10-11
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Expires: 2006-09-17
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Abstract

Abstract A method is provided for making a composite substrate for electronic semiconductor parts. The composite substrate has a metal core, an insulating layer, and a conducting layer. The insulating layer is deposited by chemical vapor deposition in the gaseous phase on the metal core, or by chemical vapor deposition in combination with other techniques, such as plasmaspraying and/or melting. The metal core is comprised of a highly heat-resistant refractory metal, e.g., molybdenum, tungsten, titanium, molybdenum-manganese alloy, or a high-alloy steel having a permeability of about 1.002. The insulating layer is comprised of an inorganic material such as aluminum oxide or aluminum nitride. The conducting layer typically comprises copper.

Inventors

  • 👤 Kurt Mayr
  • 👤 Reinhard Staffler
  • 👤 Werner Tippelt
  • 👤 Walter Scharizer

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 07:16
CPC Classifications
H; H05; H05K; H05K1/00; H05K1/02; H05K1/03; H05K1/05; H05K1/053; H10; H10W; H10W70/00; H10W70/60; H10W70/67; H10W70/68; H10W70/6875; H10W99/00; H10W90/00; H10W90/701; H10W90/721; H10W90/724

Claims Analysis

Total Claims: 10
Claim 1
Independent Claim 75 words
A method for the manufacture of a composite substrate for electronic semiconductor parts comprising: providing a metal core comprised of a refractory metal selected from the group consisting of molybdenum, tungsten, titanium, molybdenum-manganese alloy, and high alloy steel or combinations thereof; depositing an inorganic material onto said metal core by chemical vapor deposition to form an insulating layer on said metal core; and depositing a conducting material onto said insulating layer by wet chemical deposition.
Claim 2
Independent Claim 75 words
A method for the manufacture of a composite substrate for electronic semiconductor parts comprising: providing a metal core comprised of a refractory metal selected from the group consisting of molybdenum, tungsten, titanium, molybdenum-manganese alloy, and high alloy steel or combinations thereof; depositing an inorganic material onto said metal core by chemical vapor deposition to form an insulating layer on said metal core; and depositing a conducting material onto said insulating layer by wet chemical deposition.
Claim 3
Dependent Claim 23 words
The method according to claim 1 wherein said refractory metal is selected from the group consisting of molybdenum and tungsten or combinations thereof.
Claim 4
Dependent Claim 19 words
The method according to claim 1 wherein an interlayer is interposed between said insulating layer and said conducting layer.
Claim 5
Dependent Claim 15 words
The method according to claim 3 wherein the interlayer is comprised of a polyimide film.
Claim 6
Dependent Claim 15 words
The method according to claim 1 wherein the conductive layer is deposited by electroless plating.
Claim 7
Dependent Claim 13 words
The method of claim 1 wherein the conducting layer is comprised of copper.
Claim 8
Dependent Claim 17 words
The method of claim 1 wherein the insulating layer is comprised of aluminum oxide or aluminum nitride.
Claim 9
Dependent Claim 39 words
The method of claim 1 wherein said insulating layer is deposited by chemical vapor deposition in combination with a method selected from the group consisting of plasmaspraying and melting on the surface of the metal core or combinations thereof.
Claim 10
Dependent Claim 46 words
The method of claim 8 wherein the insulating layer comprises aluminum oxide in combination with an inorganic material selected from the group consisting of aluminum nitride, silicon nitride, silicon dioxide, zirconium dioxide, magnesium oxide, cubic boron nitride, and carbon having a diamond structure, and combinations thereof.

References Cited (Backward Citations)

US3259558A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-10-11 1992-04-11 1992-10-11 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-10-11 1996-04-11 1996-10-11 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-10-11 2000-04-11 2000-10-11 $7700.00 Window Closed / Lapsed

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