← Back to Patent Explorer
US4412377A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for manufacturing a hybrid integrated circuit device

Assignee: Toshiba Corp
•
Filing: 1982-01-21
•
Granted: 1983-11-01
•
Expires: 2002-01-21
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A method for manufacturing a hybrid integrated circuit device comprising a step of forming an Al 2 O 3 layer on a metal substrate, a step of forming on the Al 2 O 3 layer a resist layer having a pattern opposite to that of a copper layer which will be formed on the Al 2 O 3 layer by a later step, a step of forming the copper layer on the Al 2 O 3 layer using the resist layer as a mask, a step of impregnating thermosetting material into both the Al 2 O 3 layer and the copper layer, and a step of providing at least one semiconductor element on the copper layer.

Inventors

  • 👤 Kenji Nagashima
  • 👤 Hiroshi Matsumoto
  • 👤 Masataka Tanaka
  • 👤 Hirosi Oodaira
  • 👤 Nobuo Iwase

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 04:36
CPC Classifications
H; H05; H05K; H05K3/00; H05K3/22; H10; H10W; H10W40/00; H10W40/20; H10W40/25; H10W40/255; H10W70/00; H10W70/01; H10W70/05; H10W70/60; H10W70/67; H10W70/68; H10W70/6875; H10W90/00; H05K1/00; H05K1/02; H05K1/03; H05K1/05; H05K1/053; H05K2201/00; H05K2201/01; H05K2201/0104; H05K2201/0116; H05K2201/0137; H05K2201/0179; H05K2203/00; H05K2203/11; H05K2203/1147; H10W90/701; H10W90/751; H10W90/754; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49124; Y10T29/4913; Y10T29/49144

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 123 words
A method for manufacturing a hybrid integrated circuit device comprising the following steps in the stated order: a step of forming a ceramic layer on a metal substrate by flame-spraying a ceramic material onto the metal substrate; a step of forming on said ceramic layer a resist layer having a pattern opposite to that of a conductive layer which will be formed on said ceramic layer by a later step; a step of forming the conductive layer by flame-spraying a conductive material on said ceramic layer using said resist layer as a mask; a step of impregnating thermosetting insulative material into both said ceramic layer and said conductive layer; and a step of providing at least one semiconductor element on said conductive layer.
Claim 2
Independent Claim 123 words
A method for manufacturing a hybrid integrated circuit device comprising the following steps in the stated order: a step of forming a ceramic layer on a metal substrate by flame-spraying a ceramic material onto the metal substrate; a step of forming on said ceramic layer a resist layer having a pattern opposite to that of a conductive layer which will be formed on said ceramic layer by a later step; a step of forming the conductive layer by flame-spraying a conductive material on said ceramic layer using said resist layer as a mask; a step of impregnating thermosetting insulative material into both said ceramic layer and said conductive layer; and a step of providing at least one semiconductor element on said conductive layer.
Claim 3
Dependent Claim 30 words
A method for manufacturing a hybrid integrated circuit device according to claim 1 further including a step of removing the resist layer after the step of forming the conductive layer.
Claim 4
Dependent Claim 44 words
A method for manufacturing a hybrid integrated circuit device according to claim 1 wherein said ceramic material is a selected one of Al 2 O 3 , MgO.SiO 2 , 2MgO.SiO 2 , ZrO 2 .SiO 2 , MgO, BeO and TiO 2 .
Claim 5
Dependent Claim 21 words
A method for manufacturing a hybrid integrated circuit device according to claim 1 wherein said conductive material is a metal material.
Claim 6
Dependent Claim 19 words
A method for manufacturing a hybrid integrated circuit device according to claim 4 wherein said metal material is copper.
Claim 7
Dependent Claim 21 words
A method for manufacturing a hybrid integrated circuit device according to claim 2, wherein said conductive material is a metal material.

References Cited (Backward Citations)

US4031268A Cited
US4119480A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1986-10-31 1987-05-02 1987-11-01 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1990-10-31 1991-05-02 1991-11-01 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1994-10-31 1995-05-02 1995-11-01 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag