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US4769341A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of fabricating non-silicon materials on silicon substrate using an alloy of Sb and Group IV semiconductors

Assignee: Nokia Bell Labs
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Filing: 1986-12-29
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Granted: 1988-09-06
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Expires: 2006-12-29
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Abstract

Abstract A semiconductor device comprising an epitaxially grown tin and Group IV compound semiconductor region on which at least one other semiconductor is grown lattice matched to the adjacent portion of the tin containing region. A large number of semiconductors may thus be grown.

Inventors

  • 👤 Sergey Luryi

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 22:50
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/24; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/32; H10P14/3202; H10P14/3204; H10P14/3211; H10P14/3212; H10P14/3242; H10P14/3244; H10P14/3251; H10P14/3252; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3412; Y; Y10; Y10S; Y10S148/00; Y10S148/072; Y10S148/097; Y10S148/16; Y10S148/169; Y10S438/00; Y10S438/933; Y10S438/936

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 60 words
A method of fabricating a semiconductor device comprising the steps of: growing a compositionally graded crystalline region comprising alloy of Sn and at least on other semiconductor selected from the group consisting of Group IV semiconductors by a non-equilibrium process or a substrate; and growing a semiconductor region approximately lattice matched to the adjacent portion of said Sn comprising region.
Claim 2
Independent Claim 60 words
A method of fabricating a semiconductor device comprising the steps of: growing a compositionally graded crystalline region comprising alloy of Sn and at least on other semiconductor selected from the group consisting of Group IV semiconductors by a non-equilibrium process or a substrate; and growing a semiconductor region approximately lattice matched to the adjacent portion of said Sn comprising region.
Claim 3
Dependent Claim 16 words
A method as recited in claim 1 in which said non-equilibrium process comprises molecular beam epitaxy.
Claim 4
Dependent Claim 19 words
A method as recited in claim 2 in which said process proceed at a temperature less than 500° C.
Claim 5
Dependent Claim 18 words
A method as recited in claim 3 in which said crystalline region comprising Sn comprises a superlattice region.
Claim 6
Dependent Claim 23 words
A method as recited in claim 1 in which said substrate comprises a composition related from the group consisting of Si and Ge.
Claim 7
Dependent Claim 13 words
A method as recited in claim 5 in which said substrate comprises Si.

References Cited (Backward Citations)

US3626257A Cited
US3626328A Cited
US4088515A Cited
US4120706A Cited
US4159214A Cited
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US4675708A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-09-06 1992-03-07 1992-09-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-09-06 1996-03-07 1996-09-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-09-06 2000-03-07 2000-09-06 $7700.00 Window Closed / Lapsed

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