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US4764797A Expired / Lapsed US ⏱️ 0.0 years remaining

Chemical-sensitive semiconductor device

Assignee: EMI Group Ltd
•
Filing: 1986-07-08
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Granted: 1988-08-16
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Expires: 2006-07-08
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Abstract

Abstract A chemical-sensitive semiconductor device in the form of a chemical-sensitive field effect transistor, suitable for testing relatively small volumes of a fluid analyte, comprises a substrate provided with a passageway, interconnecting its major surfaces, along which the analyte can pass. Drain and source regions are formed at opposite ends of the passageway and a chemical-sensitive gate region is formed on the sides of the passageway.

Inventors

  • 👤 John E. A. Shaw
  • 👤 Alastair Sibbald

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 07:20
CPC Classifications
G; G01; G01N; G01N27/00; G01N27/26; G01N27/403; G01N27/414

Claims Analysis

Total Claims: 13
Claim 1
Independent Claim 45 words
A chemical-sensitive semiconductor device comprising a substrate of a semiconductor material, a passageway interconnecting major surfaces of the substrate along which a sample under test may pass and a chemical-sensitive gate region formed on a wall of the passageway and wherein said passageway is tapered.
Claim 2
Dependent Claim 45 words
A chemical-sensitive semiconductor device comprising a substrate of a semiconductor material, a passageway interconnecting major surfaces of the substrate along which a sample under test may pass and a chemical-sensitive gate region formed on a wall of the passageway and wherein said passageway is tapered.
Claim 3
Dependent Claim 18 words
A device according to claim 1 wherein said passageway is in the form of a truncated, square-based pyramid.
Claim 4
Dependent Claim 26 words
A device according to claim 1 or claim 2 in the form of a chemical-sensitive field effect transistor having a drain region and a source region.
Claim 5
Dependent Claim 21 words
A device according to claim 3 wherein the drain region and the source region are at opposite ends of the passageway.
Claim 6
Dependent Claim 41 words
A device according to claim 3 wherein the drain and source regions of the transistor are of one polarity type and one of the drain region and the source region is formed in an epitaxial layer of the opposite polarity type.
Claim 7
Dependent Claim 31 words
A device according to claim 3 wherein the drain and source regions of the transistor are remote from the chemical-sensitive gate region and are coupled thereto by an extended gate conductor.
Claim 8
Dependent Claim 102 words
A device according to claim 1 including a first field effect transistor having a first said tapered passageway provided with a first chemical-sensitive gate region and a second field effect transistor having a second said tapered passageway provided with a second chemical-sensitive gate region, wherein one only of the first and second chemical-sensitive gate regions is sensitive to a particular analyte and both of the gate regions have substantially the same sensitivity to the influence of light and temperature, the first and second field effect transistors being coupled together to be capable of producing an output signal representing said particular analyte only.
Claim 9
Dependent Claim 18 words
A device according to claim 1 or claim 2 in the form of a chemical-sensitive gate controlled diode.
Claim 10
Dependent Claim 19 words
A device according to claim 1 including a duct arranged to convey analyte to, and away from, said passageway.
Claim 11
Dependent Claim 17 words
A device according to claim 3 including a reference electrode mounted in a wall of said duct.
Claim 12
Dependent Claim 30 words
A device according to claim 9 wherein said chemical-sensitive gate region includes a layer of a chemical-sensitive material, said material being deposited also on an inner surface of the duct.
Claim 13
Dependent Claim 28 words
A device according to claim 10 or claim 11 wherein said reference electrode includes a porous plug which, in use, is exposed to analyte passing along said duct.

References Cited (Backward Citations)

US4103227A Cited
GB2096824A Cited
US4612465A Cited
US4508613A Cited
US4597002A Cited
US4609932A Cited
US4660063A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-08-16 1992-02-15 1992-08-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-08-16 1996-02-15 1996-08-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-08-16 2000-02-15 2000-08-16 $7700.00 Window Closed / Lapsed

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