US4725561A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Process for the production of mutually electrically insulated monocrystalline silicon islands using laser recrystallization
Assignee: Individual
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Filing: 1985-10-01
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Granted: 1988-02-16
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Expires: 2005-10-01
Abstract
Abstract This process consists of producing patterns (17) of an insulating material on a monocrystalline silicon substrate (12), depositing on the complete structure an amorphous or polycrystalline silicon film (26), covering the latter with a layer (28) of an encapsulating material, carrying out a heat treatment on the structure obtained serving to vertically embed in substrate (12) the insulating material patterns (17) and forming above the latter a monocrystalline silicon layer (33), eliminating the encapsulating material layer (28) and etching the monocrystalline silicon layer obtained (33), so as to form said islands (34).
Inventors
- 👤 Michel Haond
- 👤 Jean-Pierre Colinge
- 👤 Daniel Bensahel
- 👤 Didier Dutartre
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 23:25
CPC Classifications
H; H10; H10P; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10P14/00; H10P14/20; H10P14/24; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/32; H10P14/3202; H10P14/3238; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3451; H10P14/36; H10P14/38; H10P14/3802; H10W; H10W10/00; H10W10/01; H10W10/061; H10W10/10; H10W10/181; H10P90/1912
Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
171 words
A process for producing mutually electrically insulated monocrystalline silicon islands, comprising in succession: (a) producing continuous parallel strips of a first insulating material on a monocrystalline substrate, (b) depositing a non-monocrystalline silicon film on the insulated substrate, (c) covering said deposited silicon film with a continuous layer of an encapsulating material, (d) subjecting the obtained structure to a heat treatment, thereby vertically embedding said parallel strips in the substrate and forming above said embedded strips a monocrystalline silicon film through said encapsulating layer by a heating means, whereby said heating is effected by sweeping said heating means in a direction parallel to said parallel strips, and said heating forming a molten silicon zone moving across the entire surface of the film, whereby said continuous parallel strips become embedded to the lower edge of said molten zone, said molten zone consisting essentially of said non-monocrystalline silicon layer and a portion of said substrate layer, (e) eliminating said encapsulating material layers, and (f) etching said monocrystalline silicon layer obtained, thereby forming said islands.
Claim 2
Dependent Claim
171 words
A process for producing mutually electrically insulated monocrystalline silicon islands, comprising in succession: (a) producing continuous parallel strips of a first insulating material on a monocrystalline substrate, (b) depositing a non-monocrystalline silicon film on the insulated substrate, (c) covering said deposited silicon film with a continuous layer of an encapsulating material, (d) subjecting the obtained structure to a heat treatment, thereby vertically embedding said parallel strips in the substrate and forming above said embedded strips a monocrystalline silicon film through said encapsulating layer by a heating means, whereby said heating is effected by sweeping said heating means in a direction parallel to said parallel strips, and said heating forming a molten silicon zone moving across the entire surface of the film, whereby said continuous parallel strips become embedded to the lower edge of said molten zone, said molten zone consisting essentially of said non-monocrystalline silicon layer and a portion of said substrate layer, (e) eliminating said encapsulating material layers, and (f) etching said monocrystalline silicon layer obtained, thereby forming said islands.
Claim 3
Dependent Claim
16 words
The process according to claim 1, wherein the non-monocrystalline silicon film is an amorphous silicon film.
Claim 4
Dependent Claim
16 words
The process according to claim 1, wherein the non-monocrystalline silicon film is a polycrystalline silicon film.
Claim 5
Dependent Claim
17 words
The process according to claim 1, wherein the continuous parallel strips are regularly spaced from one another.
Claim 6
Dependent Claim
41 words
The process according to claim 1, wherein the strips of the first insulating material are produced by covering the substrate with a layer of said first insulating material and then etching said layer until certain zones of said substrate are exposed.
Claim 7
Dependent Claim
78 words
The process according to claim 1, wherein the first insulating material strips are obtained by performing the following steps: (a) covering the substrate with at least one preliminary layer of insulating material, (b) etching said preliminary layer so as to produce in said layer patterns which are complementary to those to be obtained, and until certain substrate zones are exposed, (c) thermally oxidizing the exposed zones of said substrate, and (d) eliminating the remainder of the preliminary layer.
Claim 8
Dependent Claim
17 words
The process according to claim 6, wherein following step (b), the exposed substrate zones are partially etched.
Claim 9
Dependent Claim
14 words
The process according to claim 1, wherein the first insulating material is silicon oxide.
Claim 10
Dependent Claim
27 words
The process according to claim 1, wherein the encapsulating material layer is formed from a silicon oxide layer or a silicon nitride layer or a combination thereof.
Claim 11
Dependent Claim
37 words
The process according to claim 1, wherein the heat treatment comprises heating the face of the silicon substrate opposite to the silicon film in a substantially uniform manner and at a temperature below the silicon melting temperature.
Claim 12
Dependent Claim
65 words
The process according to claim 1, wherein step (f) comprises: (a) producing a mask on the silicon layer obtained, which represents an image of the strips of said first insulating material, (b) eliminating the regions of the silicon layer which have not been masked up to the level of the strips of the first insulating material embedded in said substrate, and (c) eliminating said mask.
Claim 13
Dependent Claim
21 words
The process according to claim 11, wherein the mask is made from silicon oxide or silicon nitride or a combination thereof.
Claim 14
Dependent Claim
33 words
The process according to claim 1, wherein after step (f), the flanks of the islands and the substrate regions exposed between said islands are covered with a layer of a second insulating material.
Claim 15
Dependent Claim
21 words
The process according to claim 1, which further comprises following step (f), filling spaces between said islands with a third material.
Claim 16
Dependent Claim
38 words
The process according to claim 14, wherein the filling of the spaces is carried out by depositing on the complete structure a layer of said third material and by eliminating the third material located outside of said spaces.
Claim 17
Dependent Claim
14 words
The process according to claim 14, wherein the third material is a polyimide resin.
Claim 18
Dependent Claim
17 words
The process according to claim 1, wherein the silicon film has a thickness of approximately 0.5 micrometers.
References Cited (Backward Citations)
US4233091A
Cited
US4323417A
Cited
US4319954A
Cited
US4565584A
Cited
US4497683A
Cited
US4523962A
Cited
US4542580A
Cited
US4507158A
Cited
US4519128A
Cited
US4545823A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-02-15 | 1991-08-17 | 1992-02-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-02-15 | 1995-08-17 | 1996-02-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-02-15 | 1999-08-17 | 2000-02-16 | $7700.00 | Window Closed / Lapsed |