Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
215 words
An integrated circuit structure having a semiconductor material body, an integral isolation and substrate contact structure for isolating semiconductor devices from one another, and for providing a conducting path to a substrate common to said semiconductor devices, comprising; a pattern of embedded isolation structures surrounding said semiconductor devices; at least one of said embedded isolation structures comprising a combination having a first portion and a second portion, said first portion comprising a shallow recessed oxide portion extending approximately from the surface of said semiconductor material body downward into said semiconductor material body; said recessed oxide portion having substantially vertical edges, said edges abutting an adjacent one of said semiconductor devices, said second portion comprising a deep portion extending through said recessed oxide portion and extending further into the semiconductor material body to the common substrate of said integrated circuit devices; said recessed oxide portion being substantially shallower than said deep portion and also substantially surrounding those portions of said deep portion extending through said recessed oxide portion so that a collar of recessed oxide isolation is formed around said deep portion; an opening through said first and second portions from the surface of said semiconductor material body to said substrate, and a conducting material filling said opening to provide a conducting path to said substrate.
Claim 2
Dependent Claim
215 words
An integrated circuit structure having a semiconductor material body, an integral isolation and substrate contact structure for isolating semiconductor devices from one another, and for providing a conducting path to a substrate common to said semiconductor devices, comprising; a pattern of embedded isolation structures surrounding said semiconductor devices; at least one of said embedded isolation structures comprising a combination having a first portion and a second portion, said first portion comprising a shallow recessed oxide portion extending approximately from the surface of said semiconductor material body downward into said semiconductor material body; said recessed oxide portion having substantially vertical edges, said edges abutting an adjacent one of said semiconductor devices, said second portion comprising a deep portion extending through said recessed oxide portion and extending further into the semiconductor material body to the common substrate of said integrated circuit devices; said recessed oxide portion being substantially shallower than said deep portion and also substantially surrounding those portions of said deep portion extending through said recessed oxide portion so that a collar of recessed oxide isolation is formed around said deep portion; an opening through said first and second portions from the surface of said semiconductor material body to said substrate, and a conducting material filling said opening to provide a conducting path to said substrate.
Claim 3
Dependent Claim
13 words
The integrated circuit structure of claim 1 wherein said semiconductor material is silicon.
Claim 4
Dependent Claim
15 words
The integrated circuit structure of claim 1 wherein said second portion has substantially vertical sidewalls.
Claim 5
Dependent Claim
25 words
The integrated circuit structure of claim 1 wherein said conducting material filling the opening in said first and second portions is composed of polycrystalline silicon.
Claim 6
Dependent Claim
27 words
The integrated circuit structure of claim 1 wherein said first portion is greater than approximately 1.5 μm in width and less than approximately 1.5 μm in depth.
Claim 7
Dependent Claim
27 words
The integrated circuit structure of claim 1 wherein said second portion is less than approximately 5 μm in width and less than approximately 6 μm in depth.
Claim 8
Dependent Claim
23 words
The integrated circuit structure of claim 1 wherein a field effect transistor is located in at least some of said semiconductor material body.