Semiconductor device of an LDD structure having a floating gate

Claim 2

A semiconductor device having a read-only program function, comprising: a first MISFET having a gate electrode and a semiconductor region as a source or drain region, said semiconductor region comprising a first semiconductor region and a second semiconductor region formed between said gate electrode and said first semiconductor region, said second semiconductor region having a lower impurity concentration than that of said first semiconductor region; and a plurality of second MISFETs, each having a gate electrode structure and a semiconductor region as a source or drain region and being arrayed in a matrix to be used as a memory cell, said gate electrode structure comprising a first gate electrode and a second gate electrode formed over and aligned with said first gate electrode, said semiconductor region comprising a third semiconductor region and a fourth semiconductor region formed between said third semiconductor region and said gate electrode structure, wherein said first, second, third and fourth semiconductor regions all have the same conductivity type, wherein said fourth semiconductor regions of said second MISFETs are formed substantially in alignment with the peripheral edges of the first and second gate electrodes of said second MISFETs, wherein said second semiconductor region is formed substantially in alignment with a peripheral edge of said gate electrode of said first MISFET, wherein said first and third semiconductor regions are formed substantially in alignment with peripheral edges of sidewall insulation films respectively formed on the peripheral edges of said first and second gate electrodes of said second MISFETs and on a peripheral edge of the gate electrode of the first MISFET, and wherein said formation of said second and fourth semiconductor regions is performed so that said fourth semiconductor region has a lower impurity concentration than that of said third semiconductor region, but a higher impurity concentration than that of said second semiconductor region.

Claim 3

A semiconductor device according to claim 1 wherein the impurity concentration of said first semiconductor region is the same as that of said third semiconductor region.

Claim 4

A semiconductor device according to claim 1 wherein said second and fourth semiconductor regions are doped with phosphorus and arsenic, respectively.

Claim 5

A semiconductor device according to claim 1 wherein said second and fourth semiconductor regions are shallower than said first and third semiconductor regions, respectively.

Claim 6

A semiconductor device according to claim 5 further comprising P-channel MISFETs, each having a gate electrode and a semiconductor region as a source or drain region, wherein said first and second MISFETs are N-channel MISFETs.

Claim 7

A semiconductor device having a read-only memory function and provided with a memory cell array comprising memory cells arrayed in a matrix and with a peripheral circuit, said semiconductor device comprising: at least one first MISFET constituting said peripheral circuit, and having a gate electrode and semiconductor regions as source or drain regions; a plurality of word lines extending in said memory cell array in a first direction; a plurality of data lines extending in said memory cell array in a second direction to cross said word lines; and second MISFETs constituting said memory cells, each of said second MISFETs having a gate electrode structure and semiconductor regions as source or drain regions, said gate electrode structure comprising a first gate electrode and a second gate electrode formed over and aligned with said first gate electrode, one of said semiconductor regions being connected to said data lines, and said second gate electrode being formed integrally with said word lines. wherein said semiconductor regions of said first and second MISFETs are each comprised of a first semiconductor region and a second semiconductor region formed between said first semiconductor region and said gate electrode structure, said second semiconductor region having a lower impurity concentration than that of said first semiconductor region, wherein said first and second semiconductor regions of said first and second MISFETs are all of the same conductivity type, wherein said second semiconductor regions of said second MISFETs are formed substantially in alignment with peripheral edges of the first and second gate electrodes, wherein said second semiconductor region of said first MISFET is formed substantially in alignment with a peripheral edge of the gate electrode of said first MISFET, wherein said first semiconductor regions of both said first and second MISFETs are formed substantially in alignment with peripheral edges of sidewall insulation films respectively formed on the peripheral edges of said first and second gate electrodes of the second MISFET and on a peripheral edge of the gate electrode of the first MISFET, and wherein said formation of said second semiconductor regions of said first and second MISFETs is performed so that the impurity concentration of said second semiconductor region of said second MISFET is higher than that of said second semiconductor region of said first MISFET.

Claim 8

A semiconductor device having a read-only memory function and provided with a memory cell array comprising memory cells arrayed in a matrix and with a peripheral circuit, said semiconductor device comprising: at least one first MISFET constituting said peripheral circuit, and having a gate electrode and semiconductor regions as source or drain regions; a plurality of word lines extending in said memory cell array in a first direction; a plurality of data lines extending in said memory cell array in a second direction to cross said word lines; and second MISFETs constituting said memory cells, each of said second MISFETs having a gate electrode structure and semiconductor regions as source or drain regions, said gate electrode structure comprising a first gate electrode and a second gate electrode formed over and aligned with said first gate electrode, one of said semiconductor regions being connected to said data lines, and said second gate electrode being formed integrally with said word lines. wherein said semiconductor regions of said first and second MISFETs are each comprised of a first semiconductor region and a second semiconductor region formed between said first semiconductor region and said gate electrode structure, said second semiconductor region having a lower impurity concentration than that of said first semiconductor region, wherein said first and second semiconductor regions of said first and second MISFETs are all of the same conductivity type, wherein said second semiconductor regions of said second MISFETs are formed substantially in alignment with peripheral edges of the first and second gate electrodes, wherein said second semiconductor region of said first MISFET is formed substantially in alignment with a peripheral edge of the gate electrode of said first MISFET, wherein said first semiconductor regions of both said first and second MISFETs are formed substantially in alignment with peripheral edges of sidewall insulation films respectively formed on the peripheral edges of said first and second gate electrodes of the second MISFET and on a peripheral edge of the gate electrode of the first MISFET, and wherein said formation of said second semiconductor regions of said first and second MISFETs is performed so that the impurity concentration of said second semiconductor region of said second MISFET is higher than that of said second semiconductor region of said first MISFET.