Semiconductor device for obtaining an accurate threshold voltage adjustment

Claim 1

A semiconductor device comprising a semiconductor body having a major surface, a charge coupled device provided at said major surface and comprising an input stage having a source region, a surface-adjoining channel region, and a second gate electrode above the channel region and insulated therefrom for defining a storage site for collecting charge carriers supplied by the source region, said source region and said storage site being switchably connected, said input stage further comprising a first gate electrode above the channel region, insulated therefrom and situated between the source region and said second gate electrode for opening and closing the connection between the source region and said storage site underneath said second gate electrode, the semiconductor body further comprising a field effect transistor having a source region, a drain region, an intermediate channel region, and a gate electrode insulated from the channel region of said field effect transistor, the gate electrode and the drain electrode of said field effect transistor both being connected to said second gate electrode of the input stage of the charge coupled device, a current source, the source region of said input stage and the source region of the field-effect transistor both being connected to said current source, channel widths of the field effect-transistor and the input stage both being so small that threshold voltages in both channels are determined by narrow channel effects, lengths of the channel region of said field-effect transistor and of the channel region below said second gate electrode being equal, and said channel widths being different from each other so that the threshold voltages of said field effect transistor and said second gate electrode are different.