Integrated dynamic write-read memory

Claim 2

Integrated dynamic write-read memory having mutually identical memory cells based on MOS technology and arranged as columns and rows in a matrix, the memory cells, respectively, being formed of a series arrangement of a transfer transistor of the enhancement type and a storage capacitance, the write-read memory further having a plurality of bit lines, each of which is assigned to one of the matrix columns, the transfer transistor of each of the memory cells of a respective matrix column having a channel path with a free terminal connecting the respective memory cell to the bit line assigned to the respective matrix column, and the storage capacitance of each of the memory cells having a free pole connecting the respective memory cell to a common potential of the write-read memory, comprising means for applying a pulsed voltage at the common potential to the free pole of the storage capacitance via a pulsed circuit part of the matrix which, during a read-out of information stored in the individual memory cells, effectively accelerates a discharge of the memory cells resulting from the read-out.

Claim 3

Integrated memory according to claim 1 including means for generating the pulsed voltage by switching between two different potentials, the pulsed voltage having a time rate of change depending upon electrical signals occurring at word lines and at the respective bit lines.

Claim 4

Integrated memory according to claim 2 wherein said means for applying said voltage to said pole of said storage capacitance is connected thereto via at least one pulsed MOS field effect transistor.

Claim 5

Integrated memory according to claim 1 wherein each matrix row and each word line of the memory are respectively assigned a first one of said circuit components having a pulsed voltage supplied to said pole of the respective storage capacitance for triggering the memory cells assigned to the respective word line, the first circuit components being of identical construction, and including a second circuit component for controlling said first circuit components in common.

Claim 6

Integrated memory according to claim 4 wherein said first circuit component comprises an RS flip-flop connected to a reference potential, and three additional transistors, said RS flip-flop having transistors of the same type as that of said three additional transistors and having a first signal output connected via a first one of said additional transistors acting as a resistance to a first operating potential, said RS flip-flop having another output connected, on one hand, to the word line assigned to the respective first circuit component and, on the other hand, to a gate of a second one of said three additional transistors, said second and a third transistor of said additional transistors having source-drain paths arranged in series, said series arrangement of said second and third additional transistors being connected via the source of said second additional transistor to a pulsed voltage supplied by said second circuit component, said series arrangement of said second and third additional transistors being also connected via said third additional transistor to a supply potential, the gate of said third transistor being connected to said first signal output of said RS flip-flop, said series arrangement of said second and third additional transistors having a circuit point located between said transistors of said series arrangement and connected to said pole of the storage capacitance assigned to said first circuit component.

Claim 7

Integrated memory according to claim 5 wherein said first operating potential provided for feeding said first component is at least equal to said supply potential.

Claim 8

Integrated memory according to claim 6 wherein said first operating potential is slightly greater than said supply potential.

Claim 9

Integrated memory according to claim 6 wherein said first operating potential is exactly equal to said supply potential.

Claim 10

An integrated memory according to claim 8 wherein a slight increase is imparted to the word line signal during read-out.

Claim 11

Integrated memory according to claim 5 wherein said second circuit component serves to commonly feed said first circuit components and comprises six further transistors of the same type as those of the transfer transistors in said first circuit component and in said memory cells, three of said further transistors having the source-drain paths thereof connected in series, a first one of said three further transistors being connected by the drain thereof to said supply potential, and by the source thereof, on the one hand, to said source of said additional transistors to which said pulsed voltage is applied in said first circuit components and, on the other hand, to the drain of a second one of said three further transistors of said second circuit component, the source terminal of said second one of said three further transistors being connected to the gate and the drain of a third one of said three further transistors, the source of said third one of said three further transistors being connected to said reference potential of the memory, the gates of said first one and said second one of said three further transistors being controlled, respectively, in pulsed form.

Claim 12

Integrated memory according to claim 10 wherein a fourth transistor of said second circuit component has a drain by which it is connected to said supply potential, a gate by which it is connected to a first clock signal, and a source by which it is connected both to the gate of the first one of said three further transistors and to the gate of a fifth transistor of said second circuit component and to the drain of a sixth transistor of said second circuit component, and including a second clock signal controllingly connected simultaneously to the source and to the drain of said fifth transistor of said second circuit component, and a third clock signal controllingly connected to the gate of said sixth transistor of said second circuit component together with the gate of the second one of said three further transistors in said second circuit component, the source of said sixth transistor of said second circuit component being directly connected to said reference potential.

Claim 13

Integrated memory according to claim 11 including first means for supplying said first clock signal to said fourth transistor of said second circuit component, second means for supplying said second clock signal to said fifth transistor of said second circuit component, and third means for supplying said third clock signal to said second one of said three further transistors and to said sixth transistor of said second circuit component, said first, second and third signal supplying means being of such construction that said third clock signal is inverted relative to said first clock signal, said first clock signal and said second clock signal having falling sides coincident as to time, said first clock signal having a rising side slightly preceding a rising side of said second clock signal.