US4559102A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for recrystallizing a polycrystalline, amorphous or small grain material
Assignee: Sony Corp
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Filing: 1983-05-09
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Granted: 1985-12-17
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Expires: 2003-05-09
Abstract
Abstract For recrystallizing a layer of polysilicon extending over a layer of silicon dioxide on a substrate of silicon single crystal, the silicon dioxide layer is interrupted at seeding locations which are spaced apart in at least one direction and at which the polysilicon layer comes into contact with the substrate, a beam of charged particles is impacted and focused on the polysilicon layer, the substrate and beam are relatively displaced so that the beam of charged particles scans at least a portion of the polysilicon layer in the direction in which the seeding locations are spaced apart, the speed with which the beam relatively scans the polysilicon layer is determined so that the polysilicon layer is subjected to zone melting at the area of impact thereon for growing silicon single crystals by lateral epitaxial recrystallization of the polysilicon from the seeding locations, and charge buildup on the layer of silicon dioxide is avoided to prevent interference with focusing of the beam.
Inventors
- 👤 Yoshinori Hayafuji
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 18:13
CPC Classifications
C; C30; C30B; C30B13/00; C30B13/34; C30B13/16; C30B13/22; Y; Y10; Y10S; Y10S117/00; Y10S117/905
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
167 words
A method of recrystallizing a polycrystalline or amorphous upper layer extending over an electrically isolating layer on a single crystal semiconductor substrate in which said isolating layer is interrupted at seeding locations which are spaced apart in one direction and at which said polycrystalline or amorphous upper layer comes into contact with said substrate, the method comprising: impacting on said upper layer a beam of charged particles which is focused at said upper layer; relatively displacing said substrate and beam in said one direction so that said beam scans at least a portion of said polycrystalline or amorphous upper layer; determining the speed with which said beam scans the upper layer so that the latter is subjected to zone melting when impacted by said beam for growing single crystals by lateral epitaxial recrystallization of said polycrystalline or amorphous upper layer from said seeding locations; and avoding charge buildup on said isolating layer by providing said electrically isolating layer with a resistivity of less than 10 13 ohms-cm.
Claim 2
Independent Claim
167 words
A method of recrystallizing a polycrystalline or amorphous upper layer extending over an electrically isolating layer on a single crystal semiconductor substrate in which said isolating layer is interrupted at seeding locations which are spaced apart in one direction and at which said polycrystalline or amorphous upper layer comes into contact with said substrate, the method comprising: impacting on said upper layer a beam of charged particles which is focused at said upper layer; relatively displacing said substrate and beam in said one direction so that said beam scans at least a portion of said polycrystalline or amorphous upper layer; determining the speed with which said beam scans the upper layer so that the latter is subjected to zone melting when impacted by said beam for growing single crystals by lateral epitaxial recrystallization of said polycrystalline or amorphous upper layer from said seeding locations; and avoding charge buildup on said isolating layer by providing said electrically isolating layer with a resistivity of less than 10 13 ohms-cm.
Claim 3
Dependent Claim
43 words
A method of recrystallizing a polycrystalline or amorphous upper layer as in claim 1; wherein the step of avoiding charge buildup includes the further steps of connecting said substrate to earth potential and connecting said member of electrically conductive material to said substrate.
Claim 4
Dependent Claim
38 words
A method of recrystallizing a polycrystalline or amorphous upper layer as in claim 1; wherein, for said avoiding of charge buildup, said electrically isolating layer is polycrystalline or amorphous silicon having a resistivity of about 10 7 ohms-cm.
Claim 5
Dependent Claim
28 words
A method of recrystallizing a polycrystalline or amorphous upper layer as in claim 3; wherein said electrically isolating layer or polycrystalline or amorphous silicon is doped with oxygen.
Claim 6
Dependent Claim
47 words
A method of recrystallizing a polycrystalline or amorphous upper layer as in claim 1; wherein charge buildup on said isolating layer is substantially caused by negatively charged particles and said step of avoiding charge buildup includes the further step of doping said upper layer with an impurity.
Claim 7
Dependent Claim
28 words
A method of recrystallizing a polycrystalline or amorphous upper layer as in claim 5; wherein said impurity is selected from the group consisting of phosphorus, boron and arsenic.
Claim 8
Dependent Claim
23 words
A method of recrystallizing a polycrystalline or amorphous upper layer as in claim 1; wherein said electrically isolating layer is SiO 2 .
Claim 9
Dependent Claim
56 words
A method of recrystallizing a polycrystalline or amorphous upper layer as in claim 1; wherein the step of avoiding charge buildup includes the further step of placing in contact with said upper layer a member of electrically conductive material which is pervious to said beam of charged particles and which is electrically connected to earth potential.
Claim 10
Dependent Claim
34 words
A method of recrystallizing a polycrystalline or amorphous upper layer as in claim 8; wherein said member of electrically conductive material is connected to said earth potential through said upper layer and said substrate.
Claim 11
Dependent Claim
27 words
A method of recrystallizing a polycrystalline or amorphous upper layer as in claim 9; wherein said member of electrically conductive material is incorporated in said upper layer.
Claim 12
Dependent Claim
25 words
A method of recrystallizing a polycrystalline or amorphous upper layer as in claim 10; wherein said member of electrically conductive material is a doped semiconductor.
Claim 13
Dependent Claim
38 words
A method of recrystallizing a polycrystalline or amorphous upper layer as in claim 8; wherein said member of electrically conductive material is in the form of a removable mask placed over, and in contact with said upper layer.
Claim 14
Dependent Claim
30 words
A method of recrystallizing a polycrystalline or amorphous upper layer as in claim 8; wherein said electrically conductive material is selected from the group consisting of refractory metals and silicides.
Claim 15
Independent Claim
200 words
A method of recrystallizing a polycrystalline or amorphous upper layer extending over an electrically isolating layer on a single crystal semiconductor substrate in which said isolating layer is interrupted at seeding locations which are spaced apart in one direction and at which said polycrystalline or amorphous upper layer comes into contact with said substrate, the method comprising: impacting on said upper layer a beam of charged particles that is focused at said upper layer; relatively displacing said substrate and beam in said one direction so that said beam scans at least a portion of said polycrystalline or amorphous upper layer; determining the speed with which said beam scans the upper layer so that the latter is subjected to zone melting when impacted by said beam for growing single crystals by lateral epitaxial recrystallization of said polycrystalline or amorphous upper layer from said seeding locations; and avoiding charge buildup on said isolating layer by placing adjacent said upper layer a member of electrically conductive material that is pervious to said beam of charged particles and electrically connected to earth potential and by providing a layer of Si 3 N 4 between said member of electrically conductive material and said upper layer.
Claim 16
Independent Claim
200 words
A method of recrystallizing a polycrystalline or amorphous upper layer extending over an electrically isolating layer on a single crystal semiconductor substrate in which said isolating layer is interrupted at seeding locations which are spaced apart in one direction and at which said polycrystalline or amorphous upper layer comes into contact with said substrate, the method comprising: impacting on said upper layer a beam of charged particles that is focused at said upper layer; relatively displacing said substrate and beam in said one direction so that said beam scans at least a portion of said polycrystalline or amorphous upper layer; determining the speed with which said beam scans the upper layer so that the latter is subjected to zone melting when impacted by said beam for growing single crystals by lateral epitaxial recrystallization of said polycrystalline or amorphous upper layer from said seeding locations; and avoiding charge buildup on said isolating layer by placing adjacent said upper layer a member of electrically conductive material that is pervious to said beam of charged particles and electrically connected to earth potential and by providing a layer of Si 3 N 4 between said member of electrically conductive material and said upper layer.
Claim 17
Dependent Claim
30 words
A method of recrystallizing a polycrystalline or amorphous upper layer as in claim 14; wherein said layer of Si 3 N 4 has a thickness of less than 100 angstroms.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1988-12-16 | 1989-06-17 | 1989-12-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1992-12-16 | 1993-06-17 | 1993-12-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1996-12-16 | 1997-06-17 | 1997-12-17 | $7700.00 | Window Closed / Lapsed |