Abstract The invention provides a new structure for a subsurface junction field effect transistor (SJFET) and a new process for its fabrication, the process being especially compatible with existing processes for the fabrication of bipolar devices. Spaced zones of p + type are diffused into an n-type epitaxial layer to terminate the channel and connect to source and drain terminals. Spaced zones of n + type are diffused into the epitaxial layer to define the channel width. The corresponding zones for the bipolar device can be formed at the same time. A passivating layer of silicon dioxide is applied and the subsurface p-type channel formed by ion implantation to leave a thin n-type layer between the channel and the silicon dioxide layer. Upon application of a metal layer over the silicon dioxide layer in the neighborhood of the channel, and its connection to the back gate terminal, a stable electron accumulation layer forms at the surface of the n-type layer which interfaces with the silicon dioxide layer. This electron accumulating layer buffers the device against variations in the characteristics of the silicon dioxide layer and its interfaces with the adjacent layers. The resultant matching of devices on the same chip or wafer is equivalent to that of more complex and time-consuming prior art processes requiring a second implant step to produce a buffering n + type layer.
A subsurface junction effect transistor device having a gate, a p-type source and a p-type drain, said device comprising: a layer of n-type epitaxial silicon material having a surface; a p-type channel implanted in the said layer of n-type epitaxial silicon material below the surface thereof to provide an electron accummulating n-type layer between said p-type channel and an adjacent portion of said surface of the n-type epitaxial silicon material said electron accummulating n-type layer having a layer thickness corresponding to its local extrinsic Debye length, and said p-type channel having a channel thicknes more than an order of magnitude greater than the extrinsic Debye length of said electron accumulating layer; said p-type channel directly merging into said p-type source and said p-type drain; a silicon dioxide passivating layer overlying at least the electron-accumulating n-type layer; and a conductive metal layer electrically connected to the gate said conductive metal layer overlying the silicon dioxide passivating layer and said conductive metal layer constituting means for providing an electron-accumulating n-type zone in the electron-accumulating n-type layer at said adjacent protion of said surface interfacing with said silicon dioxide passivating layer, said electron accumulating n-type zone providing an electric field for raising the surface potential in the electron accumulating n-type zone above the potential of the gate for buffering said p-type channel from said silicon dioxide passivating layer.
Claim 2
Dependent Claim
225 words
A subsurface junction effect transistor device having a gate, a p-type source and a p-type drain, said device comprising: a layer of n-type epitaxial silicon material having a surface; a p-type channel implanted in the said layer of n-type epitaxial silicon material below the surface thereof to provide an electron accummulating n-type layer between said p-type channel and an adjacent portion of said surface of the n-type epitaxial silicon material said electron accummulating n-type layer having a layer thickness corresponding to its local extrinsic Debye length, and said p-type channel having a channel thicknes more than an order of magnitude greater than the extrinsic Debye length of said electron accumulating layer; said p-type channel directly merging into said p-type source and said p-type drain; a silicon dioxide passivating layer overlying at least the electron-accumulating n-type layer; and a conductive metal layer electrically connected to the gate said conductive metal layer overlying the silicon dioxide passivating layer and said conductive metal layer constituting means for providing an electron-accumulating n-type zone in the electron-accumulating n-type layer at said adjacent protion of said surface interfacing with said silicon dioxide passivating layer, said electron accumulating n-type zone providing an electric field for raising the surface potential in the electron accumulating n-type zone above the potential of the gate for buffering said p-type channel from said silicon dioxide passivating layer.
Claim 3
Dependent Claim
31 words
A device as claimed in claim 1, wherein the electron-accumulating n-type layer is coupled to the layer of n-type epitaxial silicon material through at least one n-type zone adjoining the channel.
Claim 4
Dependent Claim
27 words
A device as claimed in claim 1 or 2, in combination with a bipolar transistor device formed on the said layer of an n-type epitaxial silicon material.