Circuit for generating test equalization pulse

Claim 2

In an integrated circuit which includes a circuit for generating an equalization pulse in response to receiving one or more address transition signals on a multi-input logic circuit, wherein the equalization pulse will be present at least as long as a signal is present at an input of the logic circuit, an improvement comprising: a test pad on the integrated circuit for receiving an external test signal; and coupling means for coupling the test signal to an input of the logic circuit, wherein the test signal causes generation of the equalization pulse.

Claim 3

The integrated circuit of claim 1 wherein the logic circuit provides a transition from a second logic level to a first logic level at a common node whenever a signal is present on an input.

Claim 4

The integrated circuit of claim 2 further comprising: delay means coupled to the common node for providing a delayed signal in response to the common node switching from the second logic level to the first logic level, the delayed signal occurring a predetermined time duration following the switching of the common node; charging means coupled to the logic means and to the delay means for supplying current to the common node to drive the common node to the second logic level in response to receiving the delayed signal; inhibit means coupled to the charging means and the coupling means for receiving the address transition signals and the test signal and for inhibiting the charging means from supplying current to the common node in response to receiving one or more of the test signal and address transition signals; and output means coupled to the common node for providing the equalization pulse in response to the logic state of the common node.

Claim 5

The integrated circuit of claim 3 wherein the inhibit means comprises: a NOR gate, which has a predetermined time delay which is less than the predetermined time duration of the delay means, having inputs for receiving the address transition signals and the test signal, and an output; and a NAND gate having a first input coupled to the output of the NOR gate, a second input for receiving the delayed signal, and an output coupled to the charging means.

Claim 6

The integrated circuit of claim 4 wherein the charging means comprises: a P channel transistor having a first current electrode coupled to a first power supply terminal, a second current electrode coupled to the common node, and a control electrode coupled to the output of the NAND gate; an inverter having an input coupled to the output of the NAND gate, and an output; and an N channel transistor having a first current electrode coupled to the first power supply terminal, a second current electrode coupled to the common node, and a control electrode coupled to the output of the inverter.

Claim 7

The integrated circuit of claim 5 wherein the logic means comprises a plurality of transistors each having a first current electrode coupled to the common node, a second current electrode coupled to a second power supply terminal, and a control electrode for receiving a corresponding address transition signal or test signal.

Claim 8

The integrated circuit of claim 6 further comprising latch means coupled to the common node for sustaining the logic state present on the common node when all of said plurality of transistors, the N channel transistor, and the P channel transistor are turned off.

Claim 9

The integrated circuit of claim 7 wherein the coupling of the delay means to the common node is achieved via the output means.

Claim 10

In an integrated circuit which has a circuit for generating an equalization pulse in response to an address transition, a method comprising the steps of: receiving a signal of variable duration which is generated externally from the integrated circuit; and providing the equalization pulse for the duration of said signal.

Claim 11

In an integrated circuit which has a circuit for generating an equalization pulse in response to an address transition, a method comprising the steps of: receiving a signal of variable duration which is generated externally from the integrated circuit; and providing the equalization pulse for the duration of said signal.

Claim 12

In an integrated circuit which includes a circuit for generating a pulse responsive to address transition signals generated from respective address transitions, wherein the address transition signals are of a shorter duration than the duration intended for the pulse, an improvement comprising: a test pad on the integrated circuit for receiving an external test signal of variable duration; and means coupled to the test pad for generating and sustaining the pulse for the duration of the external test signal.

Claim 13

In an integrated circuit which includes a circuit for generating a pulse responsive to address transition signals generated from respective address transitions, wherein the address transition signals are of a shorter duration than the duration intended for the pulse, an improvement comprising: a test pad on the integrated circuit for receiving an external test signal of variable duration; and means coupled to the test pad for generating and sustaining the pulse for the duration of the external test signal.