US4545112A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of manufacturing thin film transistors and transistors made thereby
Assignee: Unisys Corp
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Filing: 1983-08-15
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Granted: 1985-10-08
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Expires: 2003-08-15
Abstract
Abstract An improved method of manufacturing thin film transistors. A gate metal is patterned to form a gate electrode and a drain, gate and source contact pad for the transistor. To reduce shorts and capacitance between the gate and the source or the drain, an intermetal dielectric is patterned to form a central portion over a planar portion of the gate region and to cover any exposed gate edges.
Inventors
- 👤 Scott H. Holmberg
- 👤 Richard A. Flasck
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 00:28
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/67; H10D30/6757; H10D30/6704; H10D30/6706; H10D30/6729; H10D30/673; H10D30/6732; H10D30/674; H10D30/6741; H10D30/6743; H10D30/6746; H10D30/675
Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
71 words
A method of manufacturing thin film transistors comprising: providing a substrate; depositing a gate electrode on said substrate having at least one exposed edge; depositing a gate insulator on said gate electrode; depositing a semiconductor material on said insulator; depositing an intermetal dielectric adjacent said edge of said gate electrode; and depositing a drain electrode onto at least a portion of said intermetal dielectric adjacent said edge of said gate electrode.
Claim 2
Independent Claim
71 words
A method of manufacturing thin film transistors comprising: providing a substrate; depositing a gate electrode on said substrate having at least one exposed edge; depositing a gate insulator on said gate electrode; depositing a semiconductor material on said insulator; depositing an intermetal dielectric adjacent said edge of said gate electrode; and depositing a drain electrode onto at least a portion of said intermetal dielectric adjacent said edge of said gate electrode.
Claim 3
Dependent Claim
80 words
The method as claimed in claim 1 including: depositing said gate insulator to substantially cover said gate electrode and depositing said semiconductor material to substantially cover said gate insulator; depositing said intermetal dielectric over said gate electrode, said insulator and said semiconductor material; removing a central portion of said intermetal dielectric to expose a substantially planar portion of said semiconductor material prior to depositing said drain electrode; and depositing a source electrode concurrently with and spaced from said drain electrode.
Claim 4
Dependent Claim
33 words
The method as claimed in claim 2 wherein: providing said substrate includes providing a glass substrate; depositing an insulator layer on said substrate; and depositing a conductive oxide layer on said insulator layer.
Claim 5
Dependent Claim
40 words
The method as claimed in claim 3 wherein: depositing said gate electrode includes depositing a refractory metal layer on said conductive oxide layer; and removing portions of said refractory metal and said conductive oxide layer to form said gate electrode.
Claim 6
Dependent Claim
47 words
The method as claimed in claim 4 further including: removing portions of said refractory metal and said conductive oxide layer to form at least one gate electrode, gate contact pad, drain contact pad and source contact pad with said gate electrode coupled to said gate contact pad.
Claim 7
Dependent Claim
70 words
The method as claimed in claim 2 including: depositing a drain contact pad, a source contact pad and a gate contact pad on said substrate spaced from one another, said gate electrode and said gate contact pad deposited together integral with one another; depositing said drain electrode to connect said semiconductor material to said drain pad; and depositing said source electrode to connect said semiconductor material to said source pad.
Claim 8
Dependent Claim
27 words
The method as claimed in claim 6 including: depositing said drain electrode to cover said drain pad; and depositing said source electrode to cover said source pad.
Claim 9
Dependent Claim
19 words
The method as claimed in claim 1 wherein: depositing said semiconductor material includes plasma depositing an amorphous silicon alloy.
Claim 10
Dependent Claim
54 words
The method as claimed in claim 1 including: depositing said intermetal dielectric to cover said gate electrode; removing a central portion of said dielectric to expose a substantially planar portion of said gate electrode prior to depositing said insulator and said semiconductor material thereon; and depositing a source electrode concurrently with said drain electrode.
Claim 11
Dependent Claim
33 words
The method as claimed in claim 9 wherein: providing said substrate includes providing a glass substrate; depositing an insulator layer on said substrate; and depositing a conductive oxide layer on said insulator layer.
Claim 12
Dependent Claim
40 words
The method as claimed in claim 10 wherein: depositing said gate electrode includes depositing a refractory metal layer on said conductive oxide layer; and removing portions of said refractory metal and said conductive oxide layer to form said gate electrode.
Claim 13
Dependent Claim
19 words
The method as claimed in claim 11 wherein: depositing said semiconductor material includes plasma depositing an amorphous silicon alloy.
Claim 14
Dependent Claim
70 words
The method as claimed in claim 9 including: depositing a drain contact pad, a source contact pad and a gate contact pad on said substrate spaced from one another, said gate electrode and said gate contact pad deposited together integral with one another; depositing said drain electrode to connect said semiconductor material to said drain pad; and depositing said source electrode to connect said semiconductor material to said source pad.
Claim 15
Dependent Claim
27 words
The method as claimed in claim 13 including: depositing said drain electrode to cover said drain pad; and depositing said source electrode to cover said source pad.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1988-10-07 | 1989-04-08 | 1989-10-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1992-10-07 | 1993-04-08 | 1993-10-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1996-10-07 | 1997-04-08 | 1997-10-08 | $7700.00 | Window Closed / Lapsed |