Patent US4534824A successfully refreshed from Google Patents.
US4534824A
Expired / Lapsed
US
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Process for forming isolation slots having immunity to surface inversion
Assignee: Advanced Micro Devices Inc
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Filing: 1984-04-16
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Granted: 1985-08-13
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Expires: 2004-04-16
Abstract
Abstract A process for forming isolation slots having immunity to surface inversion comprises the steps of defining a slot region in a semiconductor substrate, implanting dopants in the substrate adjacent the mouth of the slot which have conductivity types appropriate to counteract inversion across the filled slot, applying a spacer layer over the exposed surface of the layers defining the slot and over the substrate, etching the spacer layer to leave spacers only along the edges of the materials defining the slots and etching the substrate to form the slots.
Inventors
- 👤 Pau-Ling Chen
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 17:15
CPC Classifications
H; H10; H10W; H10W10/00; H10W10/10; H10W10/17; H10P; H10P30/00; H10P30/20; H10P30/222; H10P76/00; H10P76/40; H10W10/01; H10W10/011; H10W10/014; H10W10/0148; H10D; H10D84/00; H10D84/80; H10D84/82; H10D84/83; H10D84/85
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
168 words
A process for fabricating slots in semiconductor substrates which slots have inversion stoppers adjacent the mouths of the slots, comprising the steps of: applying at least one overlying layer to said substrate to define a region in which a slot is to be formed; patterning said at least one layer to define a slot region to be formed; forming a spacer on the surface of said substrate adjacent the edge of said at least one layer that defines whenever said inversion stopper regions are to be formed; forming an inversion stopper of one conductivity type in said substrate adjacent said mouth of said slot around at least a portion of the periphery of said slot, said one conductivity type being the opposite conductivity type to the conductivity type of said substrate adjacent said stopper; and forming said slot by a directed beam process whereby said spacer serves to impede the undercutting of said at least one layer and thereby retains the original extent of said inversion stopper region.
Claim 2
Dependent Claim
168 words
A process for fabricating slots in semiconductor substrates which slots have inversion stoppers adjacent the mouths of the slots, comprising the steps of: applying at least one overlying layer to said substrate to define a region in which a slot is to be formed; patterning said at least one layer to define a slot region to be formed; forming a spacer on the surface of said substrate adjacent the edge of said at least one layer that defines whenever said inversion stopper regions are to be formed; forming an inversion stopper of one conductivity type in said substrate adjacent said mouth of said slot around at least a portion of the periphery of said slot, said one conductivity type being the opposite conductivity type to the conductivity type of said substrate adjacent said stopper; and forming said slot by a directed beam process whereby said spacer serves to impede the undercutting of said at least one layer and thereby retains the original extent of said inversion stopper region.
Claim 3
Dependent Claim
47 words
A process for fabricating slots in accordance with claim 1 wherein said step of forming a spacer on the surface of said substrate is accomplished by the step of forming a spacer on the surface of said substrate before the formation of a slot in said substrate.
Claim 4
Dependent Claim
44 words
A process for fabricating slots in accordance with claim 1 wherein said step of forming a spacer on the surface of said substrate is accomplished by the step of forming a spacer on the surface of said substrate after the formation of a slot.
Claim 5
Dependent Claim
74 words
A process for fabricating slots in accordance with claims 1, 2 or 3, wherein said step of forming a spacer is accomplished by the steps of: applying a layer of a spacer material essentially uniformly over the surface of said semiconductor substrate and said at least one overlying layer, said layer of spacer material covering the edges of said at least one overlying layer; and etching all horizontally disposed regions of said spacer layer.
Claim 6
Dependent Claim
35 words
A process for fabricating slots in accordance with claim 4 wherein said step of etching all horizontally disposed regions is accomplished by the step of applying a directed reactive ion beam downwardly onto said substrate.
Claim 7
Dependent Claim
39 words
A process for fabricating slots in accordance with claim 5 wherein said step of forming an inversion stopper layer is accomplished by the step of: implanting ions into said substrate to produce a region of an appropriate conductivity type.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1988-08-12 | 1989-02-11 | 1989-08-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1992-08-12 | 1993-02-11 | 1993-08-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1996-08-12 | 1997-02-11 | 1997-08-13 | $7700.00 | Window Closed / Lapsed |