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US4518349A Expired / Lapsed US ⏱️ 0.0 years remaining

Cantilevered boat-free semiconductor wafer handling system

Assignee: BETTER SEMICONDUCTOR PROCESSES (BSP) A CORP OF
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Filing: 1983-12-01
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Granted: 1985-05-21
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Expires: 2003-12-01
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Abstract

Abstract An improved semiconductor wafer handling system completely eliminates the need for boats, sleds, paddles, wheeled carriers, etc., customarily employed in transporting wafers during heat processing through the use of a plurality of rigid, polished cantilevered rods having a multiplicity of spaced slots for cooperatively holding wafers in an upright position. The system provides a means for achieving higher production yields of such semiconductor elements by generating fewer contaminating particles and through less exposure to ambient environment.

Inventors

  • 👤 Richard E. Tressler
  • 👤 Joseph Stach
  • 👤 Roger L. Baeten

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 19:28
CPC Classifications
C; C30; C30B; C30B31/00; C30B31/06; C30B31/14; Y; Y10; Y10S; Y10S414/00; Y10S414/135; Y10S414/141

Claims Analysis

Total Claims: 28
Claim 1
Independent Claim 84 words
In a process of heat treating semiconductor wafers in a high temperature furnace equipped with an internal heat treating chamber and carrier means adapted to support said wafers and traverse the heat treating chamber, the improvement comprising reducing the level of undesired contaminating particles generated during the process by mounting the wafers onto a boat-free wafer carrier, said carrier comprising a plurality of semi-circular spaced cantilevered rods or tubes having a multiplicity of spaced slots for cooperatively holding individual wafers in a vertical position.
Claim 2
Dependent Claim 84 words
In a process of heat treating semiconductor wafers in a high temperature furnace equipped with an internal heat treating chamber and carrier means adapted to support said wafers and traverse the heat treating chamber, the improvement comprising reducing the level of undesired contaminating particles generated during the process by mounting the wafers onto a boat-free wafer carrier, said carrier comprising a plurality of semi-circular spaced cantilevered rods or tubes having a multiplicity of spaced slots for cooperatively holding individual wafers in a vertical position.
Claim 3
Dependent Claim 36 words
The process of claim 1 wherein the carrier includes a rearwardly mounted hot end-plate and frontal cold end-plate each of said plates being mounted perpendicular to said cantilevered rods which are substantially parallel to each other.
Claim 4
Dependent Claim 32 words
The process of claim 2 wherein the cantilevered rods and hot end plate reduce the level of undesired contaminating particles by avoiding contact with the interior sidewalls of the heat treating chamber.
Claim 5
Dependent Claim 18 words
The process of claim 3 wherein the cold end plate includes means for sealing the heat treating chamber.
Claim 6
Dependent Claim 32 words
The process of claim 1 wherein the cantilevered rods are fabricated from a material selected from the group consisting of siliconized silicon carbide, sintered silicon carbide, silicon nitride and siliconized silicon nitride.
Claim 7
Dependent Claim 15 words
The process of claim 3 wherein the cantilevered rods are fabricated from siliconized silicon carbide.
Claim 8
Dependent Claim 17 words
The process of claim 5 wherein the cantilevered rods include spaced slots for cooperatively holding source wafers.
Claim 9
Dependent Claim 88 words
In a process of depositing active dopants on semiconductor wafers by means of high temperature diffusion employing a furnace equipped with an internal heat treating chamber and carrier means adapted to support said wafers and traverse the heat treating chamber, the improvement comprising reducing the level of undesired contaminating particles generated during the process by mounting the wafers onto a boat-free wafer carrier, said carrier comprising a plurality of semi-circular spaced cantilevered rods having a multiplicity of spaced slots for cooperatively holding individual wafers in a vertical position.
Claim 10
Dependent Claim 88 words
In a process of depositing active dopants on semiconductor wafers by means of high temperature diffusion employing a furnace equipped with an internal heat treating chamber and carrier means adapted to support said wafers and traverse the heat treating chamber, the improvement comprising reducing the level of undesired contaminating particles generated during the process by mounting the wafers onto a boat-free wafer carrier, said carrier comprising a plurality of semi-circular spaced cantilevered rods having a multiplicity of spaced slots for cooperatively holding individual wafers in a vertical position.
Claim 11
Dependent Claim 27 words
The process of claim 8 wherein the carrier includes a rearwardly mounted hot-end plate mounted perpendicular to said cantilevered rods which are substantially parallel to each other.
Claim 12
Dependent Claim 21 words
The process of claim 9 wherein the carrier includes a frontal cold end-plate with means for sealing the heat treating chamber.
Claim 13
Dependent Claim 17 words
The process of claim 9 wherein the cantilevered rods include spaced slots for cooperatively holding source wafers.
Claim 14
Dependent Claim 23 words
The process of claim 9 wherein the cantilevered rods are fabricated from a material selected from siliconized silicon carbide or sintered silicon carbide.
Claim 15
Dependent Claim 59 words
A boat-free semiconductor wafer handling apparatus comprising a plurality of semicircular spaced rods, means for holding the rods in cantilevered suspension, and a hot-end plate mounted proximal to the opposing ends of said rods maintaining the rods substantially parallel to each other, said rods having a multiplicity of spaced slots for cooperatively holding individual wafers in a vertical position.
Claim 16
Dependent Claim 59 words
A boat-free semiconductor wafer handling apparatus comprising a plurality of semicircular spaced rods, means for holding the rods in cantilevered suspension, and a hot-end plate mounted proximal to the opposing ends of said rods maintaining the rods substantially parallel to each other, said rods having a multiplicity of spaced slots for cooperatively holding individual wafers in a vertical position.
Claim 17
Dependent Claim 31 words
The boat-free wafer handling apparatus of claim 13 including a frontal cold end-plate positioned between the holding means and hot end-plate, each of said plates being mounted perpendicular to said rods.
Claim 18
Dependent Claim 23 words
The boat-free wafer handling apparatus of claim 14 including a condensation plate mounted to the rods between the hot and cold end plates.
Claim 19
Dependent Claim 27 words
The boat-free wafer handling apparatus of claim 14 wherein the frontal cold end-plate and hot end-plate have openings on their peripheral edges for receiving the cantilevered rods.
Claim 20
Dependent Claim 22 words
The boat-free wafer handling apparatus of claim 16 wherein the rods include slots for cooperatively holding doping elements in a vertical position.
Claim 21
Dependent Claim 17 words
The boat-free wafer handling apparatus of claim 14 including means for longitudinally extending and retracting the same.
Claim 22
Dependent Claim 34 words
The boat-free wafer handling apparatus of claim 13 wherein the rods are fabricated from a material selected from the group consisting of siliconized silicon carbide, sintered silicon carbide, silicon nitride and siliconized silicon nitride.
Claim 23
Dependent Claim 104 words
An improved system for heat treating semiconductor wafers while reducing the level of undesired contaminating particles, which comprises a furnace equipped with at least one high temperature internal heat treating chamber, a boat-free wafer carrier adapted to hold the wafers without making contact with the interior sidewalls of said chamber during heating and while traversing the heat treating chamber, and means for inserting and retracting the carrier into and out of the heat treating chamber of the furnace, said wafer carrier comprising a plurality of semi-circular spaced cantilevered rods having a multiplicity of spaced slots for cooperatively holding individual wafers in a vertical position.
Claim 24
Dependent Claim 104 words
An improved system for heat treating semiconductor wafers while reducing the level of undesired contaminating particles, which comprises a furnace equipped with at least one high temperature internal heat treating chamber, a boat-free wafer carrier adapted to hold the wafers without making contact with the interior sidewalls of said chamber during heating and while traversing the heat treating chamber, and means for inserting and retracting the carrier into and out of the heat treating chamber of the furnace, said wafer carrier comprising a plurality of semi-circular spaced cantilevered rods having a multiplicity of spaced slots for cooperatively holding individual wafers in a vertical position.
Claim 25
Dependent Claim 25 words
The system of claim 20 wherein the boat-free wafer carrier includes separate hot and cold end plates mounted on the cantilevered rods in spaced relationship.
Claim 26
Dependent Claim 32 words
The system of claim 21 wherein the cantilevered rods are fabricated from a material selected from the group consisting of siliconized silicon carbide, sintered silicon carbide, silicon nitride and siliconized silicon nitride.
Claim 27
Dependent Claim 17 words
The system of claim 21 wherein the diffusion furnace is retro-fitted with said boat-free wafer carrier means.
Claim 28
Dependent Claim 25 words
The system of claim 21 wherein the boat-free wafer carrier includes a condensation plate mounted on the rods between the hot and cold end plates.

References Cited (Backward Citations)

US3183130A Cited
US3604694A Cited
US3735965A Cited
US3819067A Cited
US3923342A Cited
US3951587A Cited
US4075972A Cited
US4153164A Cited
US4218214A Cited
US4439146A Cited
US4459104A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-05-20 1988-11-19 1989-05-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-05-20 1992-11-19 1993-05-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-05-20 1996-11-19 1997-05-21 $7700.00 Window Closed / Lapsed

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